zephyr/tests/subsys
Cinly Ooi 9bfc1eb8a6 sample: nffs_fs_api: basic: Increase time for testing
Increase test timeout to 500s because it was noticed
that the default of 60s has truncated the test
suite run for nrf52840_pca10056

Signed-off-by: Cinly Ooi <cinly.ooi@intel.com>
2019-03-29 18:24:48 -04:00
..
can/frame all: Add 'U' suffix when using unsigned variables 2019-03-28 17:15:58 -05:00
dfu boards: arm: nrf52840-based: Free up flash room for sample apps 2019-03-15 08:52:06 -05:00
fs sample: nffs_fs_api: basic: Increase time for testing 2019-03-29 18:24:48 -04:00
jwt all: Add 'U' suffix when using unsigned variables 2019-03-28 17:15:58 -05:00
logging all: Add 'U' suffix when using unsigned variables 2019-03-28 17:15:58 -05:00
settings all: Add 'U' suffix when using unsigned variables 2019-03-28 17:15:58 -05:00
storage/flash_map tests/subsys/storage/flash_map: use auto-generated fa ID 2019-02-07 10:31:27 -06:00
usb tests: usb: Use UTIL_LISTIFY macros 2019-02-12 07:49:04 -05:00