flash_write_protection_set() was deprecated.
This patch removes usage of it and the test case which was
testing deprecated API behaviors.
Signed-off-by: Andrzej Puzdrowski <andrzej.puzdrowski@nordicsemi.no>
Flash write protection services were integrated into erase and write
procedures. This is step required for fixing following issue:
Multi-threading flash access is not supported by
flash_write_protection_set().
flash_write_protection_set() will be deprecated
As CONFIG_FLASH_SIMULATOR_ERASE_PROTECT become a dead option.
this commit removes it as well.
Signed-off-by: Andrzej Puzdrowski <andrzej.puzdrowski@nordicsemi.no>
Add support for u-blox BMD-300-EVAL. Also includes BMD-301-EVAL
and BMD-350-EVAL. All share the nRF52832, and are functionally
equivalent to the nRF52dk_nrf52832 with the exception of not
having debug-in and the shield SWD header.
Note that header pin numbers noted in index.rst are shown with
respect to the pin 1 markings on the BMD-3xx-EVAL boards, and are
flipped from the nRF52dk_nrf52832.
Tested with blinky, button, and Bluetooth peripheral_hr
Corrected type in index.rst (should be nRF52dk_nrf52832, not ..810)
Signed-off-by: Bob Recny <bob.recny@u-blox.com>
Add test to check if uart_irq_is_pending() correctly returns 0 (meaning
there are no more RX and TX pending interrupts) when all RX and TX data
is processed.
Signed-off-by: Gustavo Romero <gustavo.romero@linaro.org>
This commit enables test_spi_loopback sample application for
Nucleo_F207zg. test_spi_loopback was executed under the following case
sceanarios on SPI-1:
a. With DMA
b. No DMA - No Interrrupts
c. No DMA - Interrupts Enabled
Signed-off-by: Krishna Mohan Dani <krishnamohan.d@hcl.com>
Changed chan type to int in the test_timeout function which follows
change in the api to always use int for channel parameter.
Added assert to check that channel was successfully allocated in
test_resetting_cc().
Signed-off-by: Krzysztof Chruscinski <krzysztof.chruscinski@nordicsemi.no>
Adds support for the Texas Instruments FDC2X1X Capacitance-to-Digital
Converter for Proximity and Level Sensing Applications.
Signed-off-by: Igor Knippenberg <igor.knippenberg@gmail.com>
The spi loopback tests enables SPI ASYNC which for the SAM0 SPI driver
requires DMA support is configured. None of the current SAM0 based
boards configure DMA for SPI and thus we exclude these boards as the
test will not compile for these boards.
Signed-off-by: Kumar Gala <kumar.gala@linaro.org>
The SAM0 uart driver requires dma configured for async support and
the uart async support assumes all UARTs support async. None of the
atmel SAM0 boards are configured this way and thus the tests will
not currently build for these boards.
Signed-off-by: Kumar Gala <kumar.gala@linaro.org>
This commit provides the necessary overlay to make the test pass
on the QuickFeather hardware.
Signed-off-by: Jan Kowalewski <jkowalewski@antmicro.com>
Originally added in 7733b94224.
This filter is not well-formed. It's meant to match nodes like
/leds/led_0 in this DTS:
/ {
aliases {
led0 = &led0;
};
leds {
compatible = "gpio-leds";
led0: led_0 {
gpios = <...>;
label = "LED 0";
};
};
};
Uses look like this:
filter: dt_compat_enabled_with_alias("gpio-leds", "led0")
But notice how the led_0 node doesn't have compatible "gpio-leds";
it's actually the *parent* node that has that compatible.
Replace this with a new filter, dt_enabled_alias_with_parent_compat(),
which is used like this:
filter: dt_enabled_alias_with_parent_compat("led0", "gpio-leds")
This has a name and argument order that makes the meaning of the
filter clearer.
Replace in-tree users with the new filter.
Deprecate the old filter and warn about its use using the standard
logging module.
Signed-off-by: Martí Bolívar <marti.bolivar@nordicsemi.no>
Fix the error of the [Coverity CID :219489] "Structurally
dead code in tests/drivers/dma/loop_transfer/src/test_dma_loop.c"
Signed-off-by: Francois Ramu <francois.ramu@st.com>
Added low power configuration to testcase.yaml. In this mode
UARTE is disabled when RX and TX is not used.
Signed-off-by: Krzysztof Chruscinski <krzysztof.chruscinski@nordicsemi.no>
Fix#32918 [Coverity CID :219528] "Arguments in wrong order
in tests/drivers/pwm/pwm_loopback/src/main.c"
Signed-off-by: Guðni Már Gilbert <gudni.m.g@gmail.com>
This sets the dts of dma for using the uart asynch api.
The stm32l475 has a dmamux with request 2 for Tx/Rx usart4
The Tx&Rx pins (PA0, PA1) of the usart4 are connected
on the disco_l475_iot1 board to pass the test.
Signed-off-by: Francois Ramu <francois.ramu@st.com>
Set integration_platforms on these tests to just mps2_an385. This
should be sufficient to make sure these tests build and run.
Signed-off-by: Kumar Gala <kumar.gala@linaro.org>
Such instance is needed for building drivers that use DEVICE_DT_GET()
to get the pointer to the GPIO controller device structure.
Signed-off-by: Andrzej Głąbek <andrzej.glabek@nordicsemi.no>
Convert driver and users of pinmux on mcux lpc platforms to getting
basic port info from devicetree (register address, label)
Signed-off-by: Kumar Gala <kumar.gala@linaro.org>
In NPCX7 series, it contains two tachometer (TACH) modules that contains
two Independent timers (counter 1 and 2). They are used to capture a
counter value when an event is detected via the external pads (TA or
TB).
The CL also includes:
— Add npcx tachometer device tree declarations.
— Zephyr sensor api implementation for tachometer.
— Enable "tach1" device in npcx7m6fb.dts for testing.
Signed-off-by: Mulin Chao <mlchao@nuvoton.com>
This driver emulates a EEPROM device in flash.
Reworked implementation with modified flash layout.
The emulation represents the EEPROM in flash as a region that is a
direct map of the eeprom data followed by a region where changes to
the eeprom data is stored. Changes are written as address-data
combinations. The size of such a combination is determined by the
flash write block size and the size of the eeprom (required address
space), with a minimum of 4 byte.
The eeprom page needs to be a multiple of the flash page. Multiple
eeprom pages is also so supported and increases the number of writes
that can be performed.
The eeprom size, pagesize and the flash partition used for the eeprom
are defined in the dts. The flash partition should allow at least two
eeprom pages. For fast read access a rambuffer can be enabled for the
eeprom (by setting the option rambuf in the dts).
Signed-off-by: Laczen JMS <laczenjms@gmail.com>
If the prescaler is zero in the test, a div by zero would happen.
Add an assert to check for zero prescaler.
Fix CID 216790
Signed-off-by: Alexander Wachter <alexander@wachter.cloud>
There are several different issues when trying to build the icm42605
sensor driver:
* Missing entry in drivers/sensor/CMakeLists.txt
* Issues with #ifndef in header files
* Issues with const usage
* Missing function prototypes in headers
* Fix use of LOG_MODULE_REGISTER v LOG_MODULE_DECLARE
* Add missing dts node to tests/drivers/build_all/spi.dtsi
Signed-off-by: Kumar Gala <kumar.gala@linaro.org>
