At some point, package copy function was extended and renamed
to cbprintf_package_convert. However, flags used by this
function were not renamed and used contained COPY idiom.
Deprecating flags with COPY and replacing them with flags
with CONVERT idiom to match function which is utilizing them.
Signed-off-by: Krzysztof Chruscinski <krzysztof.chruscinski@nordicsemi.no>
There are some platforms like the lpcxpresso54114 that utilize gpio@0
so rename gpio@0 to gpio@ffff as this is a highly unlikely to conflict
with any real device.
Fixes#49439
Signed-off-by: Kumar Gala <galak@kernel.org>
Improve stress tests to be more robust and demanding. Previous
implementation did not reveal race condition.
Signed-off-by: Krzysztof Chruscinski <krzysztof.chruscinski@nordicsemi.no>
Wrong value was used for free space calculation. Updating test which
previously was hiding this bug.
Signed-off-by: Krzysztof Chruscinski <krzysztof.chruscinski@nordicsemi.no>
This commit adds string token versions of the values also
in items inside string-array.
Signed-off-by: Radosław Koppel <r.koppel@k-el.com>
Co-authored-by: Marti Bolivar <marti.bolivar@nordicsemi.no>
Co-authored-by: Kumar Gala <galak@kernel.org>
Deprecate DT_LABEL and DT_INST_LABEL as we have phased out
general 'label' usage and there isn't a need to keep a specific
set of macros for 'label'. DT_PROP(node, label) works fine for
the small handful of cases that need it now.
Signed-off-by: Kumar Gala <galak@kernel.org>
The bbc_microbit boards end up enabling CONFIG_SENSOR because of
CLOCK_CONTROL_NRF_USES_TEMP_SENSOR. This ends up enabling the I2C
bus which causes CONFIG_I2C_TEST=y. We end up with a build conflict
betwee the i2c_test.c driver and the test case code. So the easiest
solution is to just exclude the platforms from this test.
Signed-off-by: Kumar Gala <galak@kernel.org>
Names of some testcases are duplicated in another files.
This change rename duplicated testcases.
Signed-off-by: Katarzyna Giadla <katarzyna.giadla@nordicsemi.no>
This commit adds an initialisation for the `bias_dims` variable, which
is given as an input to the `arm_depthwise_conv_s8` function.
Note that the `bias_dims` parameter is currently unused by the function
implementation.
This fixes the following warning reported by the GCC 12:
error: 'bias_dims' may be used uninitialized
Werror=maybe-uninitialized]
Signed-off-by: Stephanos Ioannidis <root@stephanos.io>
Add two new utility macros for iterating over the entire tree, along
with tests.
I have a use case for DT_FOREACH_STATUS_OKAY_NODE() right now, but I
think it makes sense to define both of them right away for
completeness.
Signed-off-by: Martí Bolívar <marti.bolivar@nordicsemi.no>
Add a bunch of missing "zephyr/" prefixes to #include statements in
various test and test framework files.
Signed-off-by: Fabio Baltieri <fabiobaltieri@google.com>
Refactoring test by adding macro for total packet length
calculation and header length.
Tuning test to trigger a scenario where free space was miscalculated.
Bug was fixed in the previous commit.
Signed-off-by: Krzysztof Chruscinski <krzysztof.chruscinski@nordicsemi.no>
If a device manually specifies that it depends on a second DT device,
add the first device to the second devices list of supported devices.
Signed-off-by: Jordan Yates <jordan.yates@data61.csiro.au>
This commit sets an initial value of 0 for the `res` variable, whose
pointer is passed to other functions and is not directly assigned
within the calling function.
Note that, when the test completes successfully, the value of the `res`
variable should be set to `423` (the value of `set_res`).
This fixes the "‘res’ may be used uninitialized" warning generated by
the GCC 12.
Signed-off-by: Stephanos Ioannidis <root@stephanos.io>
the testcase source file f16.c and f32.c might be
compiled into the final binary at the same time,
so need to set unique testcase name for each test.
Signed-off-by: Chen Peng1 <peng1.chen@intel.com>
the testcase source file f16.c and f32.c might be
compiled into the final binary at the same time,
so need to set unique test names for each test,
otherwise, it will report build failures "multiple
definitions".
Signed-off-by: Chen Peng1 <peng1.chen@intel.com>
A lot of places that DT_LABEL is used we can replace with DT_SAME_NODE
as we are just checking that the node we got from the macro is the
same as what we expect.
Signed-off-by: Kumar Gala <galak@kernel.org>
All in tree device drivers use some form of DEVICE_DT_GET
so we no longer need to require label properties.
Signed-off-by: Kumar Gala <galak@kernel.org>
Deprecate DT_BUS_LABEL and DT_INST_BUS_LABEL as we phase out
'label' property usage in favor of DT_BUS and variants.
Signed-off-by: Kumar Gala <galak@kernel.org>
Deprecate DT_GPIO_LABEL, DT_INST_GPIO_LABEL, DT_GPIO_LABEL_BY_IDX,
and DT_INST_GPIO_LABEL_BY_IDX as we phase out 'label' property usage
in favor of DT_GPIO_CTLR and variants.
Signed-off-by: Kumar Gala <galak@kernel.org>
Deprecate DT_SPI_DEV_CS_GPIOS_LABEL and DT_INST_SPI_DEV_CS_GPIOS_LABEL
as we phase out 'label' property usage in favor of
DT_SPI_DEV_CS_GPIOS_CTLR and variants.
Signed-off-by: Kumar Gala <galak@kernel.org>
