- This includes the driver, test app, and sample app
- Only the boards\arm\cy8cproto_062_4343w board is supported for now
Signed-off-by: Bill Waters <bill.waters@infineon.com>
This file adds the board overlay file for the `efr32xg24_dk2601b` board
to enable the `drivers.adc` test on this board.
Signed-off-by: Filip Kokosinski <fkokosinski@antmicro.com>
This commit adds support for the `drivers.adc` test by adding an overlay
for the `efr32bg22_brd4184a` board.
Signed-off-by: Filip Kokosinski <fkokosinski@antmicro.com>
Remove redefinition of adc0 node in native_posix overlay
since it's now present in the board dts.
Signed-off-by: Benjamin Björnsson <benjamin.bjornsson@gmail.com>
Remove includes of adc dt-bindings header since these are
now already included in the root .dtsi file that adds an
adc node.
Signed-off-by: Benjamin Björnsson <benjamin.bjornsson@gmail.com>
The below is the unit test result for the driver and kernel of
it82xx2_evb board.
GPIO/gpio_basic_api: PASS
I2C/i2c_api: PASS
Flash: PASS
UART/uart_basic_api: PASS
PWM/pwm_api: PASS
WDT/wdt_basic_api: PASS
KSCAN/kscan_api: PASS
kernel/sched/schedule_api: PASS
kernel/sched/preempt: PASS
kernel/timer/timer_api: PASS
kernel/sleep: PASS
ADC/adc_api: PASS.
ADC note: conversion time~=61.6us
sample time delay~=60us
wait voltage stable time~=202.8us
Set sampling time to 500us will pass for ADC test.
Signed-off-by: Tim Lin <tim2.lin@ite.corp-partner.google.com>
Remove shield, using this shild will require an overlay for
the particular board being used.
Signed-off-by: Benjamin Björnsson <benjamin.bjornsson@gmail.com>
Move channel description to devicetree for atmel,sam-afec
compatible to make the test more readable.
Signed-off-by: Benjamin Björnsson <benjamin.bjornsson@gmail.com>
Move channel description to devicetree for atmel,sam0-adc
compatible to make the test more readable.
Signed-off-by: Benjamin Björnsson <benjamin.bjornsson@gmail.com>
Move channel description to devicetree for atmel,sam-adc
compatible to make the test more readable.
Signed-off-by: Benjamin Björnsson <benjamin.bjornsson@gmail.com>
Move channel description to devicetree for gd,gd32-adc
compatible to make the test more readable.
Signed-off-by: Benjamin Björnsson <benjamin.bjornsson@gmail.com>
Move channel description to devicetree for telink,b91-adc
compatible to make the test more readable.
Signed-off-by: Benjamin Björnsson <benjamin.bjornsson@gmail.com>
Move channel description to devicetree for nxp,kinetis-adc16
compatible to make the test more readable.
Signed-off-by: Benjamin Björnsson <benjamin.bjornsson@gmail.com>
Move channel description to devicetree for nordic,nrf-saadc
compatible to make the test more readable.
Signed-off-by: Benjamin Björnsson <benjamin.bjornsson@gmail.com>
Move channel description to devicetree for nordic,nrf-adc
compatible to make the test more readable.
Signed-off-by: Benjamin Björnsson <benjamin.bjornsson@gmail.com>
Move channel description to devicetree for st,stm32-adc
compatible to make the test more readable.
Signed-off-by: Benjamin Björnsson <benjamin.bjornsson@gmail.com>
Move channel description to devicetree for nxp,kinetis-adc12
compatible to make the test more readable.
Signed-off-by: Benjamin Björnsson <benjamin.bjornsson@gmail.com>
Move channel description to devicetree for microchip,xec-adc
compatible to make the test more readable.
Signed-off-by: Benjamin Björnsson <benjamin.bjornsson@gmail.com>
Move channel description to devicetree for nxp,lpc-lpadc
compatible to make the test more readable.
Signed-off-by: Benjamin Björnsson <benjamin.bjornsson@gmail.com>
Move channel description to devicetree for nuvoton,npcx-adc
compatible to make the test more readable.
Signed-off-by: Benjamin Björnsson <benjamin.bjornsson@gmail.com>
Move channel description to devicetree for ti,cc32xx-adc
compatible to make the test more readable.
Signed-off-by: Benjamin Björnsson <benjamin.bjornsson@gmail.com>
Move channel description to devicetree for ti,cc13xx-cc26xx-adc
compatible to make the test more readable.
Signed-off-by: Benjamin Björnsson <benjamin.bjornsson@gmail.com>
Move channel description to devicetree for ite,it8xxx2-adc
compatible to make the test more readable.
Signed-off-by: Benjamin Björnsson <benjamin.bjornsson@gmail.com>
Move channel description to devicetree for nxp_mcux,12b1msps-sar
compatible to make the test more readable.
Signed-off-by: Benjamin Björnsson <benjamin.bjornsson@gmail.com>
Move channel description to devicetree for raspberrypi,pico-adc
compatible to make the test more readable.
Signed-off-by: Benjamin Björnsson <benjamin.bjornsson@gmail.com>
Move channel description to devicetree for espressif,esp32-adc
compatible to make the test more readable.
Signed-off-by: Benjamin Björnsson <benjamin.bjornsson@gmail.com>
Move channel description to devicetree for infineon,xmc4xxx-adc
compatible to make the test more readable.
Signed-off-by: Benjamin Björnsson <benjamin.bjornsson@gmail.com>
Adds the necessary definitions for the nucleo_h563zi to be able to run
the adc_api test on the ADC1 channel 15 (on pa3).
Signed-off-by: Thomas Stranger <thomas.stranger@outlook.com>
Conifgures the new h573i disco kit board for testing the adc_api driver
on the ADC1 channel0 (on pa0).
Signed-off-by: Francois Ramu <francois.ramu@st.com>
Change this test to use the automatically generated linker section
to place the buffer in SRAM4, instead of using the manually created
region added in 088d38f. This is in preperation of removing the
manually created section.
Signed-off-by: Hein Wessels <heinwessels93@gmail.com>
Microchip XEC ADC and ADC V2 driver were merged into one
That PR did not change the ADC API test and ADC shell resulting
in twister build failures. Fixed both ADC API test and ADC shell.
Signed-off-by: scott worley <scott.worley@microchip.com>
Update test/drivers/adc/adc_api to support the new channel configuration
method used by the LPADC driver.
Signed-off-by: Daniel DeGrasse <daniel.degrasse@nxp.com>
In 6e21ebf the sampling interval was changed, which caused the
issue #56070. This is fixed by allowing different boards to
specify a sampling period.
Also changed the test_task_with_interval to verify that
the supplied interval was used.
Signed-off-by: Hein Wessels <heinwessels93@gmail.com>
Previously the contents of buffers after an ADC DMA read was
simply printed, but not verified with an zassert that the
value was updated.
This commit updates it to be similar to the adc_api test that
fills the buffer initially with a known value, which is then
used to ensure the ADC DMA functioned successfully.
Signed-off-by: Hein Wessels <heinwessels93@gmail.com>
Adds nucleo_h732zi ADC DMA unit tests with multiple channels.
The STM32 ADC DMA driver requires the buffers to be placed
in a non-cacheable memory region as defined by the DMA.
Therefore this adds configurability to the test to change
the region the buffer is placed in.
Signed-off-by: Hein Wessels <heinwessels93@gmail.com>
These test uses DMA which sometimes require buffers to be placed
in custom specific section. This is not compatible with ztest
userspace, which requires variables to be placed in a specific
partition.
Signed-off-by: Hein Wessels <heinwessels93@gmail.com>
This test contained NXP specific functions, for example
the counter trigger, which is not required for all ADC DMA implementations.
Also moved NXP specific kconfigs to appropriate board files
Signed-off-by: Hein Wessels <heinwessels93@gmail.com>
Adds REQUIRED to samples and tests for finding the zephyr package
to align all samples and tests with the same call and parameters.
Signed-off-by: Jamie McCrae <jamie.mccrae@nordicsemi.no>
