Commit Graph

4456 Commits

Author SHA1 Message Date
Swift Tian
cc5c142535 drivers: mspi: add mspi is25xx0xx device driver
This device driver supports ISSI is25w/lx032/64 series flash.
Only extended SPI mode(1s-1s-1s, 1s-8s-8s, 1s-1s-8s) is implemented.

Signed-off-by: Swift Tian <swift.tian@ambiq.com>
2025-06-18 07:36:26 +02:00
Patryk Koscik
e8ff141f6d tests: drivers: sensor: spi: include gpio.h header
This patch adds a missing include directive to `spi.dtsi` in the
`build_all` configuration.The include is required because commit
2ac316465f introduced the use of `GPIO_ACTIVE_HIGH` and `GPIO_ACTIVE_LOW`
macros.

Signed-off-by: Patryk Koscik <pkoscik@antmicro.com>
2025-06-17 17:45:36 +02:00
Francois Ramu
17ad5938fa test: drivers: memc: ram testing on adi eval board
When running the tests/drivers/memc/ram on the
adi_eval_adin1110ebz target, do not involve sram1, sram2
That will avoid warning about orphan section for
`DT_N_S_memory_10000000_P_zephyr_memory_region_STRING_TOKEN
and DT_N_S_memory_20040000_P_zephyr_memory_region_STRING_TOKEN

Signed-off-by: Francois Ramu <francois.ramu@st.com>
2025-06-17 16:11:24 +02:00
Sai Santhosh Malae
d29fd6fcba tests: spi: siwx91x: board config file update
Update CONFIG_SPI_IDEAL_TRANSFER_DURATION_SCALING
value for testcase to pass for higher transfer speeds.

Signed-off-by: Sai Santhosh Malae <Santhosh.Malae@silabs.com>
2025-06-17 16:11:11 +02:00
Benjamin Cabé
5c422a9d27 tests: drivers: comparator: increase test coverage for await_trigger
Test user-provided timeout value

Signed-off-by: Benjamin Cabé <benjamin@zephyrproject.org>
2025-06-17 16:10:46 +02:00
Benjamin Cabé
e564bab82e tests: drivers: comparator: fix typos
Fixed a few dummy asserts

Signed-off-by: Benjamin Cabé <benjamin@zephyrproject.org>
2025-06-17 16:10:46 +02:00
Benjamin Cabé
2dd0b4fee0 tests: drivers: gnss: add test for get_fix_rate()
Add a test for this previously untested function

Signed-off-by: Benjamin Cabé <benjamin@zephyrproject.org>
2025-06-17 16:10:04 +02:00
Pete Johanson
7b0e431fc8 tests: drivers: memc: Set up APARD32690 properly.
Enable/disable devices as necessary to ensure memc test will test the
attached HyperRAM and no other memory nodes.

Signed-off-by: Pete Johanson <pete.johanson@analog.com>
2025-06-17 07:20:22 +02:00
TOKITA Hiroshi
831987d19a tests: drivers: display: controlling test execution with fixture
Currently, the `display_read_write` test execution can be suppressed
by `harness: display`, but since the display harness does not exist,
there is no way to run tests.
Using a fixture, it will be possible only to build if not specified,
and run tests if specified.

Signed-off-by: TOKITA Hiroshi <tokita.hiroshi@gmail.com>
2025-06-16 11:11:33 -07:00
Fabrice DJIATSA
746d60b0f8 tests: drivers: spi: remove useless files and testcases
- with the updates made to the spi_ll_stm32 driver,
we no longer need to configure the 16-bit frame/word size
in the DTS overlay file. The test_spi_word_size_16 testsuite
helps us verify the 16-bit frame mode supported on
the ST platform.

- remove testcases that use thoses files in testcase.yaml

Signed-off-by: Fabrice DJIATSA <fabrice.djiatsa-ext@st.com>
2025-06-16 14:03:05 -04:00
Fabrice DJIATSA
cc4e2f526a tests: drivers: spi: spi_loopback: handle rx/tx buffers nocache memory
Place transfer buffers in non-cacheable memory when
CONFIG_NOCACHE_MEMORY=y. This change ensures that DMA transfer
buffers are allocated in non-cacheable memory on platforms where
CONFIG_NOCACHE_MEMORY is enabled. This avoids potential cache
coherence issues that are not handled by the SPI driver.

Signed-off-by: Fabrice DJIATSA <fabrice.djiatsa-ext@st.com>
2025-06-16 14:03:05 -04:00
Fabrice DJIATSA
5daad8f7c1 tests: drivers: spi_loopback: add latency tolerance for some boards
Set a convenient latency for each platform, since each platform
reacts differently to the driver.

Signed-off-by: Fabrice DJIATSA <fabrice.djiatsa-ext@st.com>
2025-06-16 14:03:05 -04:00
Fabrice DJIATSA
c5f5fc1fa8 tests: drivers: spi: spi_loopback: enable nucleo_c071rb to run test again
Due to RAM overflow by 3200 bytes, decrease size of SPI_LARGE_BUFFER.

signed-off-by: Fabrice DJIATSA <fabrice.djiatsa-ext@st.com>
2025-06-16 14:03:05 -04:00
Tien Nguyen
8507859371 tests: drivers: gpio: Add support for RZ/V2N-EVK
Add support for RZ/V2N-EVK

Signed-off-by: Tien Nguyen <tien.nguyen.zg@renesas.com>
Signed-off-by: Hieu Nguyen <hieu.nguyen.ym@bp.renesas.com>
2025-06-16 14:00:22 -04:00
Piotr Krzyzanowski
c67db3fd36 tests: drivers: spi: spi_loopback: Add NULL spi_buf_set test
Add the test_spi_null_tx_rx_buf_set

Signed-off-by: Piotr Krzyzanowski <piotr.krzyzanowski@nordicsemi.no>
2025-06-16 08:29:56 +02:00
Chris Friedt
bced298f8b tests: drivers: optee: workaround for ENOMEM
The optee suite was failing in test_suspend() after a call to
k_aligned_alloc() which returns -ENOMEM. The alignment requirement is
4096 bytes, which seems reasonable, but what is odd about that is
that the alignment fails in spite of

CONFIG_SRAM_SIZE=145131134582784
and
CONFIG_HEAP_MEM_POOL_SIZE=270044

So there is plenty of memory available for this test and alignment
considerations should not be an issue.

Removing `CONFIG_DEBUG=y` solved the problem for me.

Signed-off-by: Chris Friedt <cfriedt@tenstorrent.com>
2025-06-14 12:37:26 -04:00
Fabrice DJIATSA
8912f070bb tests: drivers: i2c: i2c_api: add a scenario for ci building
add scenario in build-only operation to check for CI failures
when interrupt is disabled for the STM32 i2c driver.

Signed-off-by: Fabrice DJIATSA <fabrice.djiatsa-ext@st.com>
2025-06-13 14:29:39 +02:00
Fabrice DJIATSA
ad1c215bc2 tests: drivers: i2c: i2c_api: add board overlays
add arduino_i2c node in overlay files to be enable building the i2c_api
test on multiple stm32 boards,compatible for both i2c V1 and V2
driver.

Signed-off-by: Fabrice DJIATSA <fabrice.djiatsa-ext@st.com>
2025-06-13 14:29:39 +02:00
Bjarki Arge Andreasen
b41feb9abc drivers: serial: nrfx_uarte: assert clock control enabled
clock control is required for "fast instances" so assert clock
is enabled alongside PM DEVICE RUNTIME. Update UART tests to
reflect this requirenment.

Signed-off-by: Bjarki Arge Andreasen <bjarki.andreasen@nordicsemi.no>
2025-06-13 11:12:43 +02:00
Marcin Wierzbicki
67edf2292a boards: nxp: add support for S32K148 evaluation board
Support for NXP S32K148 evaluation board (s32k148_evb).

Adapt samples: adc_dt, adc_sequence.
Adapt tests: adc_api, gpio_basic_api, gpio_hogs.

Signed-off-by: Marcin Wierzbicki <marcin.wierzbicki@accenture.com>
2025-06-12 15:04:32 -07:00
Benjamin Cabé
ec960096ec drivers: tests: rtc: relax y2k test seconds check
When testing y2k rollover, the seconds value can easily be off by one
since there is no guarantee that the RTC will be exactly on the second
boundary.
Relax the check to allow for a one second difference.

Signed-off-by: Benjamin Cabé <benjamin@zephyrproject.org>
2025-06-12 13:40:59 +02:00
Benjamin Cabé
850a3b3131 drivers: tests: rtc: harden alarm tests
Ensure the alarm tests exercise rollover scenarios by setting RTC time
to a few seconds before midnight on a December 31st and alarm time to a
few seconds after midnight on the following day.

Signed-off-by: Benjamin Cabé <benjamin@zephyrproject.org>
2025-06-12 13:40:59 +02:00
Benjamin Cabé
6acb085160 drivers: tests: rtc: add overlay for adafruit_macropad_rp2040
Allow to run the RTC test suite on Adafruit Macropad RP2040

Signed-off-by: Benjamin Cabé <benjamin@zephyrproject.org>
2025-06-12 13:40:59 +02:00
Fabrice DJIATSA
2e5f703c28 tests: drivers: adc: adc_api: enable nocache memory
The nucleo_f746zg board doesn't handle RX/TX buffers in
non-cacheable memory when required. This leads to an error
in the test_adc_api with the log:
Supplied buffer is not in a non-cacheable region.

Signed-off-by: Fabrice DJIATSA <fabrice.djiatsa-ext@st.com>
2025-06-12 10:24:30 +02:00
Jiafei Pan
834576e8e4 tests: gpio_basic_api: add imx943_evk_mimx94398_a55 overly
Add board overlay for i.MX943 EVK Cortex-A Core.

Signed-off-by: Jiafei Pan <Jiafei.Pan@nxp.com>
2025-06-11 18:31:10 -07:00
Jiafei Pan
f4b3865a33 tests: gpio: gpio_basic_api: config to input if disconnected not supported
If GPIO_DISCONNECTED is not supported by GPIO driver, then try to configure
the pin to be input, otherwise there will be some unstable signal between
two test pins.

Signed-off-by: Jiafei Pan <Jiafei.Pan@nxp.com>
2025-06-11 18:31:10 -07:00
Silicon Signals
655d5fd0d3 tests: drivers: build_all: audio: Add MAX98091 to tests
Add the MAX98091 codec to the I2C overlays for testing.

Signed-off-by: Silicon Signals <siliconsignalsforgit@gmail.com>
2025-06-11 16:17:08 -07:00
Bjarki Arge Andreasen
39233656b2 tests: spi: loopback: get spi controller before timed transfer
The test which measures and validates transfer times is using the
helper spi_loopback_transceive() to perform the transfer. This
helper internally gets the spi controller, which is useful for
most tests, but for this one, it means the time to get and put
the spi controller is included in the transfer time measurement.

This commit gets the spi controller before calling
spi_loopback_transceive() which results in only the actual
transfer time being measured.

Before this commit, on the nrf54h20:

  START - test_spi_complete_multiple_timed
  Transfer took 745 us vs theoretical minimum 108 us
  Latency measurement: 637 us
   PASS - test_spi_complete_multiple_timed in 0.008 seconds

  START - test_spi_complete_multiple_timed
  Transfer took 700 us vs theoretical minimum 54 us
  Latency measurement: 646 us

      Assertion failed at ...
  Very high latency
   FAIL - test_spi_complete_multiple_timed in 0.027 seconds

After this commit:

  START - test_spi_complete_multiple_timed
  Transfer took 250 us vs theoretical minimum 108 us
  Latency measurement: 142 us
   PASS - test_spi_complete_multiple_timed in 0.008 seconds

  START - test_spi_complete_multiple_timed
  Transfer took 204 us vs theoretical minimum 54 us
  Latency measurement: 150 us
   PASS - test_spi_complete_multiple_timed in 0.008 seconds

Signed-off-by: Bjarki Arge Andreasen <bjarki.andreasen@nordicsemi.no>
2025-06-10 10:23:20 -04:00
Bjarki Arge Andreasen
5163b8c96a tests: spi: loopback: use CONFIG_ZTEST_STACK_SIZE for thread stacks
The spi_loopback test suite creates three internal threads. The
stack sizes for these threads is hardcoded to 512, which is to little
for some socs, namely the nrf54h20 cpuapp if pm device runtime is
enabled. Instead, determine the stack sizes the same way ztest
stack sizes are determined.

Signed-off-by: Bjarki Arge Andreasen <bjarki.andreasen@nordicsemi.no>
2025-06-10 10:23:20 -04:00
Jérôme Pouiller
69202a7908 tests: drivers: memc: Simplify filters
Currently, every boards that implement a memory controller add an entry
in tests/drivers/memc/ram/testcase.yaml. However, the configuration is
exactly the same for all the boards. So, we can just consider that any
board that declare "memc" capability has to be tested.

For the record here are the boards that has the memc capability:

    adi/apard32690/apard32690_max32690_m4.yaml
    adi/eval_adin1110ebz/adi_eval_adin1110ebz.yaml
    adi/max32690evkit/max32690evkit_max32690_m4.yaml
    arduino/giga_r1/arduino_giga_r1_stm32h747xx_m7.yaml
    arduino/portenta_h7/arduino_portenta_h7_stm32h747xx_m7_1_0_0.yaml
    arduino/portenta_h7/arduino_portenta_h7_stm32h747xx_m7_4_10_0.yaml
    atmel/sam/sam4s_xplained/sam4s_xplained.yaml
    renesas/da1469x_dk_pro/da1469x_dk_pro.yaml
    sifive/hifive_unmatched/hifive_unmatched_s7.yaml
    sifive/hifive_unmatched/hifive_unmatched_u74.yaml
    silabs/radio_boards/siwx917_rb4342a/siwx917_rb4342a.yaml
    st/stm32f746g_disco/stm32f746g_disco.yaml
    st/stm32f7508_dk/stm32f7508_dk.yaml
    st/stm32f769i_disco/stm32f769i_disco.yaml
    st/stm32h735g_disco/stm32h735g_disco.yaml
    st/stm32h745i_disco/stm32h745i_disco_stm32h745xx_m7.yaml
    st/stm32h747i_disco/stm32h747i_disco_stm32h747xx_m7.yaml
    st/stm32h750b_dk/stm32h750b_dk.yaml
    st/stm32h757i_eval/stm32h757i_eval_stm32h757xx_m7.yaml
    st/stm32h7b3i_dk/stm32h7b3i_dk.yaml
    st/stm32h7s78_dk/stm32h7s78_dk.yaml
    st/stm32n6570_dk/twister.yaml

Signed-off-by: Jérôme Pouiller <jerome.pouiller@silabs.com>
2025-06-10 13:28:48 +02:00
Sai Santhosh Malae
6dcf2fdf34 drivers: adc: siwx91x: adc_api test app support
Add siwx917_rb4338a board overlay and congig files

Signed-off-by: Sai Santhosh Malae <Santhosh.Malae@silabs.com>
2025-06-10 12:07:33 +02:00
Tahsin Mutlugun
836b6c2ca4 tests: drivers: dma: Add MAX32657 ns board overlay files
Enable 'chan_blen_transfer' and 'loop_transfer' tests for MAX32657EVKIT
nonsecure variant.

Signed-off-by: Tahsin Mutlugun <Tahsin.Mutlugun@analog.com>
2025-06-10 08:47:42 +02:00
Furkan Akkiz
5ddbb22478 tests: drivers: dma: Add MAX32657 boards overlay files
Enable 'chan_blen_transfer' and 'loop_transfer' tests for MAX32657EVKIT.

Signed-off-by: Furkan Akkiz <hasanfurkan.akkiz@analog.com>
2025-06-10 08:47:42 +02:00
Raffael Rostagno
8ed4d044d1 tests: dma: esp32c2: esp8684: Add test config
Add test config for chan_blen_transfer suite.

Signed-off-by: Raffael Rostagno <raffael.rostagno@espressif.com>
2025-06-09 14:35:51 -07:00
Phuc Pham
8b438d2288 tests: drivers: gpio: Add support for RZ/G2UL-SMARC
Enable GPIO driver tests for RZ/G2UL-SMARC

Signed-off-by: Phuc Pham <phuc.pham.xr@bp.renesas.com>
Signed-off-by: Nhut Nguyen <nhut.nguyen.kc@renesas.com>
2025-06-09 10:26:45 +01:00
Phuc Pham
6c15907b7a tests: drivers: serial: Add support for Renesas RZ/G2UL-SMARC
Enable serial driver tests for RZ/G2UL-SMARC

Signed-off-by: Phuc Pham <phuc.pham.xr@bp.renesas.com>
Signed-off-by: Nhut Nguyen <nhut.nguyen.kc@renesas.com>
2025-06-09 10:26:45 +01:00
Fabrice DJIATSA
054efe6f7a tests: drivers: adc: adc_api: boards: turn of time slicing
set CONFIG_TIMESLICE_SIZE to 0 to disable time slicing.

Certain boards like nucleo_g071rb, nucleo_f091rc,
nucleo_l073rz will not start consecutive samplings as fast
as possible.

Signed-off-by: Fabrice DJIATSA <fabrice.djiatsa-ext@st.com>
2025-06-09 10:26:03 +01:00
Jordan Yates
5f5a534445 tests: adc: adc_rescale: test adc_raw_to_microvolts_dt
Test that the output of `adc_raw_to_microvolts_dt` matches the output of
`adc_raw_to_millivolts_dt` to the resolution of the latter.

Signed-off-by: Jordan Yates <jordan@embeint.com>
2025-06-09 10:25:52 +01:00
Duy Nguyen
9e5aa827bb tests: drivers: spi: Add configuration for SPI test on RX130
Add device tree overlay for spi test on RSKRX130 board

Signed-off-by: Duy Nguyen <duy.nguyen.xa@renesas.com>
2025-06-09 08:55:05 +02:00
TOKITA Hiroshi
77d1276446 tests: drivers: entropy: api: add qemu_cortex_a53 configuration
Add `qemu_cortex_a53` target which has the `virtio,entropy` device.

Signed-off-by: TOKITA Hiroshi <tokita.hiroshi@gmail.com>
2025-06-07 15:39:06 +01:00
TOKITA Hiroshi
dd9b85f749 tests: drivers: build_all: virtio: add VIRTIO MMIO build test
Add the `qemu_cortex_a53` configuration to run the build test
for the VIRTIO MMIO driver.
To add this test, we have split the virtio-pci and virtio-mmio test cases.

Signed-off-by: TOKITA Hiroshi <tokita.hiroshi@gmail.com>
2025-06-07 15:39:06 +01:00
Piotr Kosycarz
d7006195ac tests: drivers: spi: spi_loopback: configure spi latency expectation
Allow to customize scaling factor used to compare ideal spi transfer
and measured one.

Signed-off-by: Piotr Kosycarz <piotr.kosycarz@nordicsemi.no>
2025-06-06 20:11:32 +01:00
Jilay Pandya
6cc35eea81 tests: adltc2990: introduce mock_i2c_error function
Introduce mock_i2c_error function in emulator in order to emulate i2c
errors for various registers

Signed-off-by: Jilay Pandya <jilay.pandya@outlook.com>
2025-06-06 09:08:22 -07:00
Jilay Pandya
529029e4e3 tests: adltc2990: increase coverage
increase test coverage for adltc2990 and fix a bug found during testing

Signed-off-by: Jilay Pandya <jilay.pandya@outlook.com>
2025-06-06 09:08:22 -07:00
Alain Volmat
cd8dccf211 drivers: video: introduction of the stm32 DCMIPP driver
The STM32 Digital Camera Memory Interface Pixel Processor (DCMIPP)
is a multi-pipeline camera interface allowing to capture
and process frames from parallel or CSI interfaces depending on its
version.

Signed-off-by: Alain Volmat <alain.volmat@foss.st.com>
2025-06-06 10:10:58 +02:00
Khoa Nguyen
a545e19c5c tests: drivers: flash: Add support "common" for Renesas OSPI_B
Add support test app "flash/common" for testing Renesas RA
OSPI_B on ek_ra8m1, ek_ra8d1

Signed-off-by: Khoa Nguyen <khoa.nguyen.xh@renesas.com>
2025-06-06 08:41:46 +02:00
Ruibin Chang
47d1e38043 drivers/counter: implement it51xxx counter driver
Implement counter driver for ITE it51xxx series chip.

Signed-off-by: Ruibin Chang <Ruibin.Chang@ite.com.tw>
2025-06-05 12:33:29 +02:00
TOKITA Hiroshi
7daa75f634 tests: entropy: api: add overlay for VirtIO Entropy device
Add `boards/qemu_x86_64.overlay` and some config modification
for testing `virtio,entropy` device.

Signed-off-by: TOKITA Hiroshi <tokita.hiroshi@gmail.com>
2025-06-05 09:33:59 +02:00
TOKITA Hiroshi
1422897a85 tests: drivers: build_all: virtio add VirtIO Entropy build test
Add a build test for the VirtIO Entropy driver.

Signed-off-by: TOKITA Hiroshi <tokita.hiroshi@gmail.com>
2025-06-05 09:33:59 +02:00
Alain Volmat
3db7b40238 video: introduction of driver for Omnivision OV9655
This commit add support for the Omnivision OV9655 sensor,
a 1.3MPix Color SXGA (1280x1024 sensor).
Current driver only allow output of 320x240 and 160x120
resolution either in RGB565 or YUYV.

Signed-off-by: Alain Volmat <alain.volmat@foss.st.com>
2025-06-04 15:50:24 -04:00