Various obsolote and misnamed platfomrs in test filters theat went
undetected for a while.
Fixes#41222
Signed-off-by: Anas Nashif <anas.nashif@intel.com>
drivers.flash.nrf_qspi_nor and drivers.flash.soc_flash_nrf:
keep nrf52840dk_nrf52840 as integration_platform
drivers.flash.default:
Use mimxrt1060_evk instead as integration_platform,
this is the only platform allowed.
drivers.flash.stm32:
Add a bunch of boards as integration_platforms for
this test configuration.
Signed-off-by: Thomas Stranger <thomas.stranger@outlook.com>
Function used for filtering "dt_compat_enabled_with_label" was not
working as expected as it was not taking into account that we're
looking for a children/parent combination:
Provided "compat" with enabled status should be the one of the parent
of the node matching given label.
Function is then reworked to take this into account.
And to make it's usage clear:
- function name is changed to be clearer on the intention
- args order is reversed to be more logical wrt the intention
Users of the function are also updated to take the change into
account.
Fixes#36093
Signed-off-by: Erwan Gouriou <erwan.gouriou@linaro.org>
This commit makes the flash test generic. The flast test will
look for storage partition in the soc-flash for testing.
Signed-off-by: Krishna Mohan Dani <krishnamohan.d@hcl.com>
Test include non-aligned read in nrf_qspi_nor flash and
SoC flash memory to buffer with variable size.
It checks all possible variants of alignment and size.
Signed-off-by: Mateusz Syc <Mateusz.Syc@nordicsemi.no>
