Commit Graph

1346 Commits

Author SHA1 Message Date
Henrik Brix Andersen
26e95fac28 tests: drivers: can: timing: convert to the new ztest framework
Convert the CAN timing test to the new ztest framework. Restructure the
tests a bit to improve code readability and add doxygen documentation.

Signed-off-by: Henrik Brix Andersen <hebad@vestas.com>
2022-03-14 11:29:30 +01:00
Gerard Marull-Paretas
1766ac5cfa tests: drivers: entropy: api: use DEVICE_DT_GET
Obtain a reference to the chosen entropy device at compile time.

Signed-off-by: Gerard Marull-Paretas <gerard.marull@nordicsemi.no>
2022-03-11 15:27:05 -08:00
Gerard Marull-Paretas
9a02676d9e tests: drivers: clock_control: nrf_onoff_and_bt: use DEVICE_DT_GET
Use DEVICE_DT_GET to obtain a reference to the chosen entropy device.
The device is now global, and readiness is checked at the test setup
fixture.

Signed-off-by: Gerard Marull-Paretas <gerard.marull@nordicsemi.no>
2022-03-11 15:27:05 -08:00
Henrik Brix Andersen
d4023b3c1b drivers: gpio: move non-standard dts flags to be soc specific
Reserve the upper 8 bits of gpio_dt_flags_t for SoC specific flags and
move the non-standard, hardware-specific GPIO devicetree flags (IO
voltage level, drive strength, debounce filter) from the generic
dt-bindings/gpio/gpio.h header to SoC specific dt-bindings headers.

Some of the SoC specific dt-bindings flags take up more bits than
necessary in order to retain backwards compatibility with the deprecated
GPIO flags. The width of these fields can be reduced/optimized once the
deprecated flags are removed.

Remove hardcoded use of GPIO_INT_DEBOUNCE in GPIO client drivers. This
flag can now be set in the devicetree for boards/SoCs with debounce
filter support. The SoC specific debounce flags have had the _INT part
of their name removed since these flag must be passed to
gpio_pin_configure(), not gpio_pin_interrupt_configure().

Signed-off-by: Henrik Brix Andersen <hebad@vestas.com>
2022-03-10 13:46:34 -05:00
Francois Ramu
ee07c8eef7 tests: drivers: DAC testcase running on more stm32 nucleo boards
It includes the testcase for existing nucleo target boards.

Signed-off-by: Francois Ramu <francois.ramu@st.com>
2022-03-10 13:30:06 -05:00
Francois Ramu
71f20d8b3e tests: drivers: pwm for stm32l073 and stm32f091 nucleo boards
The overlay are defined to run the tests/drivers pwm_api
on the nucleo_l073rz,nucleo_f091rc.
Note than pwm pb10 is for DTS definition purpose

Signed-off-by: Francois Ramu <francois.ramu@st.com>
2022-03-10 13:25:54 -05:00
Gerard Marull-Paretas
95fb0ded6b kconfig: remove Enable from boolean prompts
According to Kconfig guidelines, boolean prompts must not start with
"Enable...". The following command has been used to automate the changes
in this patch:

sed -i "s/bool \"[Ee]nables\? \(\w\)/bool \"\U\1/g" **/Kconfig*

Signed-off-by: Gerard Marull-Paretas <gerard.marull@nordicsemi.no>
2022-03-09 15:35:54 +01:00
Krzysztof Chruscinski
47ae656cc1 all: Deprecate UTIL_LISTIFY and replace with LISTIFY
UTIL_LISTIFY is deprecated. Replacing it with LISTIFY.

Signed-off-by: Krzysztof Chruscinski <krzysztof.chruscinski@nordicsemi.no>
2022-03-08 11:03:30 +01:00
Hake Huang
f5864b50ff test: flash: add rt685 support for flash driver test
enable flash test for rt685

Signed-off-by: Hake Huang <hake.huang@oss.nxp.com>
2022-03-07 09:46:26 -06:00
Krzysztof Chruscinski
53ef1eb137 tests: drivers: uart: uart_async_api: Move rx abort to timeout
Intention of the test is to abort rx few bytes after start of
transmission (before it is completed). Previously, thread was busy
waiting after start of TX and aborted RX from that context. However,
it may happen that CPU is busy handling UART transfer and
k_busy_wait prolongs beyond full transfer which results in test
failure.

Move rx_abort to k_timer timeout which is run in interrupt
context.

Signed-off-by: Krzysztof Chruscinski <krzysztof.chruscinski@nordicsemi.no>
2022-03-07 10:46:48 +01:00
Francois Ramu
d91bdc0f51 tests: drivers: dma test running on the nucleo_wl55 board
enable the dma and dmamux to the nucleo_wl55jc
so that dma testcases can run on that target

Signed-off-by: Francois Ramu <francois.ramu@st.com>
2022-03-04 09:11:38 -06:00
Daniel DeGrasse
954dcbd754 boards: twr_ke18f: Add pinctrl groups for twr_ke18f
Add pinctrl groups for twr_ke18f

Signed-off-by: Daniel DeGrasse <daniel.degrasse@nxp.com>
2022-03-03 13:00:20 -06:00
Fu Haolei
7c690b943f twister: yaml: run flash test on it8xxx2_evb board
Add it8xxx2_evb board to flash test platform_allow, so twister
won't skip it.

Signed-off-by: Fu Haolei <haolei.fu@intel.com>
2022-03-02 08:53:30 -05:00
Henrik Brix Andersen
da2a0befbb drivers: can: unify CAN controller configuration in devicetree
Unify the CAN controller configuration done in Zephyr devicetrees:

- Specify a resynchronization jump width (sjw) of 1 time quanta in SoC
  devicetrees as this is the most common. Boards can override this if
  needed.
- Specify a sample point of 87.5% as recommended by CAN in Automation
  (CiA) in SoC devicetrees. Boards can override this if needed.
- Specify a bus speed of 125 kbits/second (arbitration phase) and 1
  Mbits/second (CAN-FD data phase) in board devicetrees as this is what
  is used by all Zephyr CAN samples.

Signed-off-by: Henrik Brix Andersen <hebad@vestas.com>
2022-02-24 13:48:55 -08:00
Pete Dietl
5dddf9f0f8 drivers: sensors: Implement MAX31875 sensor
This commit implements the temperature sensor interface for
the Maxim MAX31875Low-Power I2C Temperature Sensor.

Signed-off-by: Pete Dietl <petedietl@gmail.com>
2022-02-24 08:49:40 -06:00
Henrik Brix Andersen
323a98cd34 tests: drivers: can: filter out tests if zephyr,canbus not enabled
- Filter out the CAN controller driver tests if no zephyr,canbus chosen
  node is enabled in the devicetree.
- Rename the tests to follow the general test naming scheme.
- Remove the dedicated test selection for native_posix boards

Signed-off-by: Henrik Brix Andersen <hebad@vestas.com>
2022-02-24 07:12:54 -06:00
Carles Cufi
4b8f1c04ab kconfig: Rename the ZTEST stack size option to align with the rest
All stack sizes should end with STACK_SIZE.

Signed-off-by: Carles Cufi <carles.cufi@nordicsemi.no>
2022-02-22 08:23:05 -05:00
Ryan McClelland
2eaede53af drivers: adc: add ads1x1x driver
This adds support for the ads101x (ads1013, ads1014, ads1015) and
ads111x (ads1113, ads1114, ads1115) family of i2c adc devices.

Signed-off-by: Ryan McClelland <ryanmcclelland@fb.com>
2022-02-22 10:49:39 +01:00
Daniel Leung
587cd95de1 tests: counter_seconds: filter for PC compatible boards for x86
This adds a filter to only enable the CMOS test on PC compatible
x86 boards, as CMOS RTC is usually not present on embedded
applications.

Signed-off-by: Daniel Leung <daniel.leung@intel.com>
2022-02-21 21:56:32 -05:00
Tim Lin
058e217401 ITE: test: drivers/adc: fix the ADC resolution
The ADC resolution of it8xxx2 should be 10.

Signed-off-by: Tim Lin <tim2.lin@ite.corp-partner.google.com>
2022-02-21 21:01:43 -05:00
Katsuhiro Suzuki
feaf0070fc boards: riscv: hifive_unleashed: add GPIO support
This patch adds GPIO and 96board LS (Low Speed)iexpansion  connector
support for SiFive HiFive Unleashed and also enables GPIO basic test.

Signed-off-by: Katsuhiro Suzuki <katsuhiro@katsuster.net>
2022-02-21 20:46:47 -05:00
Andrei-Edward Popa
34d921b00b tests: drivers: i2c: slave: added Raspberry Pi Pico board
added Raspberry Pi Pico for testing it as I2C slave

Signed-off-by: Andrei-Edward Popa <andrei_edward.popa@upb.ro>
2022-02-21 19:42:07 -05:00
Maureen Helm
124747d146 tests: build_all: Add net tag to the modem driver test
The modem driver test enables the networking stack, and some boards like
intel_adsp.* use this tag exclude networking tests.

Signed-off-by: Maureen Helm <maureen.helm@intel.com>
2022-02-08 07:26:45 -05:00
Francois Ramu
2b8df6b160 tests: drivers: flash running on disco stm32 board with qspi
Restore the testcase to run on the qspi nor-flash controller
of the disco_l475_iot1 board
of the disco stm32f746 board

Signed-off-by: Francois Ramu <francois.ramu@st.com>
2022-02-08 07:03:12 -05:00
Andrzej Głąbek
18fc88da50 tests: uart_async_api: Add multiple_rx_enable test case
Add a test case that ensures that uart_rx_enable() can be successfully
called after RX is disabled with uart_rx_disable() and also when it is
disabled automatically after the provided RX buffer is filled up.

Signed-off-by: Andrzej Głąbek <andrzej.glabek@nordicsemi.no>
2022-02-05 06:25:46 -05:00
Flavio Ceolin
0c1950f7b0 tests: Fix drivers tests tag
By convention most tests are using "drivers" and not "driver".

Signed-off-by: Flavio Ceolin <flavio.ceolin@intel.com>
2022-02-02 09:21:07 -05:00
Flavio Ceolin
5d96fcf68e tests: sensor: generic: Make test name consistent
By convention tests are using the name "drivers" and not "driver".

Signed-off-by: Flavio Ceolin <flavio.ceolin@intel.com>
2022-02-02 09:21:07 -05:00
Flavio Ceolin
64d00865b2 tests: accel: Make test name consistent
By convention tests are using the name "drivers" and not "driver".

Signed-off-by: Flavio Ceolin <flavio.ceolin@intel.com>
2022-02-02 09:21:07 -05:00
Flavio Ceolin
6b56fcd07e tests: spi_loopback: Make test name consistent
By convention tests are using the name "drivers" and not "driver".

Signed-off-by: Flavio Ceolin <flavio.ceolin@intel.com>
2022-02-02 09:21:07 -05:00
Flavio Ceolin
fad97b7fff tests: pinctrl: Fix typo on test name
s/derivers/drivers/g

Signed-off-by: Flavio Ceolin <flavio.ceolin@intel.com>
2022-02-02 09:21:07 -05:00
Krzysztof Chruscinski
875ec0a0cb tests: drivers: uart: mix_poll: Test const buffers
Modifications to use RO buffer in the test. Added configuration
which is using RO buffer for uart_tx.

Signed-off-by: Krzysztof Chruscinski <krzysztof.chruscinski@nordicsemi.no>
2022-02-02 12:47:46 +01:00
Krzysztof Chruscinski
bdabf1eee9 tests: drivers: uart: async_api: Test const buffers
Small modifications to use RO buffer in the test.

Signed-off-by: Krzysztof Chruscinski <krzysztof.chruscinski@nordicsemi.no>
2022-02-02 12:47:46 +01:00
Krzysztof Chruscinski
9b22393b7e tests: drivers: uart: Add test for Nordic UARTE version of the driver
Add configuration of the uart_async_api test to use uarte peripheral.

Signed-off-by: Krzysztof Chruscinski <krzysztof.chruscinski@nordicsemi.no>
2022-02-02 12:47:46 +01:00
Krzysztof Chruscinski
5cf70e4860 tests: drivers: clock_control: nrf_calibration: Skip test for nrf52832
On nrf52832 disabling low frequency clock results in RTC COUNTER
reset. It is unexpected and system clock can be disrupted and
test may hang. Disable test which restarts LF clock for nrf52832.

Signed-off-by: Krzysztof Chruscinski <krzysztof.chruscinski@nordicsemi.no>
2022-02-01 14:16:18 -06:00
Krzysztof Chruscinski
18c0c7a2e5 tests: drivers: clock_control: api: nrf: Disable tests for nrf52832
On nrf52832 LF clock cannot be stopped during runtime because
it resets RTC COUNTER. Testsuite run on nrf clock control driver
assumes that it will not happen. Disabling testing of LF clock
for nrf52832.

Signed-off-by: Krzysztof Chruscinski <krzysztof.chruscinski@nordicsemi.no>
2022-02-01 14:16:18 -06:00
Erwan Gouriou
6a6c47b619 tests/drivers: gpio_basic_api: Add overlay to test nucleo_wl55jc
Add and overlay to enable gpio api test on this board.

Signed-off-by: Erwan Gouriou <erwan.gouriou@linaro.org>
2022-01-31 14:37:11 -06:00
Hake Huang
946414cdf9 tests: driver: build-test: add min_ram restriction
below two build test can not fit in SRAM size

drivers.modem.build
drivers.modem.quectel_bg9x.build

build error report:

region `SRAM' overflowed by 20688 bytes
collect2: error: ld returned 1 exit status

Signed-off-by: Hake Huang <hake.huang@oss.nxp.com>
2022-01-21 12:29:49 -05:00
Gerard Marull-Paretas
bbcd112335 tests: drivers: i2c: drop DEV_DATA/DEV_CFG usage
Stop using redundant DEV_DATA/DEV_CFG macros and use dev->data and
dev->config instead.

Signed-off-by: Gerard Marull-Paretas <gerard.marull@nordicsemi.no>
2022-01-19 18:16:02 +01:00
Tomasz Bursztyka
d02ef74d86 tests/ivshmem: Make sure it enters usermode before testing the driver
So it will also test the ivhmem usermode handlers.

Signed-off-by: Tomasz Bursztyka <tomasz.bursztyka@linux.intel.com>
2022-01-18 13:22:25 -05:00
Gerson Fernando Budke
58936e7639 soc: arm: atmel_sam: samv71: Fix SPI build dependency
The SAM spi driver depends on GPIO driver to work. It seems that this
dependency chain it is not handled. This select GPIO driver when SPI
driver is enabled. It rework GPIO and SPI Kconfig to select driver by
devicetree and drop entries at Kconfig.defconfig.series file.

Fixes #41525

Signed-off-by: Gerson Fernando Budke <nandojve@gmail.com>
2022-01-18 12:12:52 -05:00
Alexander Mihajlovic
1cd1f41d3a tests: drivers: adc: Add support for nucleo_wl55jc
Add support for nucleo_wl55jc board to adc_api test.

Signed-off-by: Alexander Mihajlovic <a@abxy.se>
2022-01-17 11:48:30 -05:00
Henrik Brix Andersen
dc7903c0dc tests: drivers: can: stm32: filter out boards without st,stm32-can
Filter out boards without st,stm32-can compatibles enabled in their
devicetree in the stm32-specific CAN driver test.

Signed-off-by: Henrik Brix Andersen <hebad@vestas.com>
2022-01-17 11:47:28 -05:00
Manojkumar Subramaniam
0757678514 tests: drivers: STM32: Enabling ADC tests for nucleo_h7a3zi_q
This commit enables test_adc to build and run for this new board

Signed-off-by: Manojkumar Subramaniam <manoj@electrolance.com>
2022-01-17 11:45:21 -05:00
Jordan Yates
bb00120e8b tests: drivers: adc: test dummy ADC driver
Add a testcase for compiling the dummy `vnd,adc` driver.

Signed-off-by: Jordan Yates <jordan.yates@data61.csiro.au>
2022-01-17 08:13:41 -05:00
Francois Ramu
f6c0362664 tests: drivers: spi loopback remove conf for most of the stm32 boards
The testcase is including a generic configuration conf
for the stm32 target boards when running the SPI loopback in
interrupt and DMA mode. Thus, the board specific conf file is useless.

Signed-off-by: Francois Ramu <francois.ramu@st.com>
2022-01-14 10:09:00 -06:00
Francois Ramu
a7d2b2a9f9 tests: drivers: spi loopback testcase on spi2 for stm32 boards
Overwrites the overlay for testing the SPI2 when running on
nucleo_f302r8 and 96b_carbon targets.

Signed-off-by: Francois Ramu <francois.ramu@st.com>
2022-01-14 10:09:00 -06:00
Francois Ramu
a3680c1b00 tests: drivers: spi loopback testcase yaml for stm32 dma
This commit adds two stm32 config to execute the testcase
when the SPI is using interrupt mode for transfer.
when the SPI is using DMA for transfer (not Interrupt nor ASYNC mode).
to run the on some specific (listed) stm32 boards on SPI instance.
Note the hw fixture (physical connection on the board)

Signed-off-by: Francois Ramu <francois.ramu@st.com>
2022-01-14 10:09:00 -06:00
Dominik Chat
3e6ab47455 sensors: Implement MPU9250 driver
MPU9250 driver for 9-axis
gyroscope, accelerometer, magnetometer

Signed-off-by: Dominik Chat <dominik.chat@nordicsemi.no>
2022-01-14 12:33:04 +01:00
Tom Burdick
0e96f59e83 dma: Add suspend resume implementation for edma
Implement the suspend and resume transfer api calls for NXP's eDMA.

Signed-off-by: Tom Burdick <thomas.burdick@intel.com>
2022-01-12 17:33:48 -05:00
Gerard Marull-Paretas
97cc216957 tests: drivers: gpio: gpio_basic_api: add support for gd32vf103v_eval
Add DT overlay to run gpio_basic_api test on GD32VF103V-EVAL board. In
order to make testing easy a couple of accessible pins have been
selected: PD0 and PD1 pins exposed via JP13 and JP4 respectively.

Signed-off-by: Gerard Marull-Paretas <gerard@teslabs.com>
2022-01-11 11:50:35 +01:00