170531eb2d
Reworked and combined the multi-level interrupt bit masks tests to work on any configuration of bits in every level. Updated the bits configuration in the testcase to use non-symetric numbers so that shifting a level with the wrong number of bits will certainly cause the test to fail. Signed-off-by: Yong Cong Sin <ycsin@meta.com> |
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| .. | ||
| boards | ||
| src | ||
| CMakeLists.txt | ||
| prj.conf | ||
| testcase.yaml | ||