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zephyr/tests/subsys
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Anas Nashif b1ee8b248a tests: logging: group logging testing and cleanup identifiers 
Better group for logging tests removing verbosity and redundancy in
identifiers and making the sub-component a bit more uniform and clear.

Signed-off-by: Anas Nashif <anas.nashif@intel.com>
2023-10-11 14:19:40 +03:00
..
bindesc/definition tests: bindesc: Added definition tests 2023-09-28 07:39:09 -04:00
canbus/isotp tests: canbus: isotp: conformance: fix global variable usage 2023-09-14 08:34:09 +02:00
debug tests: drivers: debug: add esp32s3_luatos_core 2023-09-22 15:58:11 +02:00
dfu samples, tests: convert string-based twister lists to YAML lists 2023-05-10 09:52:37 +02:00
dsp zdsp: Add Q value print formatting helpers for 2023-09-25 09:47:26 +02:00
edac tests: ibecc: Update IBECC test README 2023-09-13 17:32:52 -04:00
emul emul: change stub driver priority to kernel device default 2023-08-25 10:31:02 +02:00
fs tests: fcb: fix test meta data and components 2023-10-11 14:19:40 +03:00
input input: rename callback define macro to INPUT_CALLBACK_DEFINE 2023-08-10 08:15:10 +00:00
ipc/ipc_service device: remove redundant init functions 2023-04-19 10:00:25 +02:00
jwt
llext llext: Simple hello world test case 2023-09-29 20:50:38 -04:00
logging tests: logging: group logging testing and cleanup identifiers 2023-10-11 14:19:40 +03:00
mem_mgmt/mem_attr dt: Make zephyr,memory-attr a capabilities bitmask 2023-09-15 12:46:54 +02:00
mgmt tests: mcumgr: fix test meta data and components 2023-10-11 14:19:40 +03:00
modbus tests: samples: cleanup test tags, add integration_platforms 2023-06-02 04:47:06 -04:00
modem modem: modem_cmux: Set C/R bit in UIH frames 2023-10-06 09:18:32 +02:00
openthread net: pkt: time: introduce ns timestamp helper 2023-09-29 16:27:15 +02:00
pm tests: pm: power_domains: rename testcase, demo is ambigous 2023-09-27 15:11:18 -04:00
portability COVERAGE: Fix COVERAGE_GCOV dependencies 2023-08-24 15:36:31 +02:00
rtio/rtio_api tests: subsys: rtio: Set to 1cpu as it is not SMP-safe 2023-08-21 13:27:07 +02:00
sd samples, tests: convert string-based twister lists to YAML lists 2023-05-10 09:52:37 +02:00
settings tests: settings: fix test meta data and components 2023-10-11 14:19:40 +03:00
shell samples, tests: convert string-based twister lists to YAML lists 2023-05-10 09:52:37 +02:00
sip_svc tests: sip_svc: Add a stress test for sip_svc subsystem 2023-09-15 09:26:49 +02:00
storage tests: storage: rename shadow variables 2023-08-22 11:39:58 +02:00
testsuite/fff_fake_contexts samples, tests: convert string-based twister lists to YAML lists 2023-05-10 09:52:37 +02:00
tracing/tracing_api
usb tests: usb: add test for new USB device support 2023-10-01 09:26:07 +03:00
zbus tests: subsys: zbus: do not use verbose logging 2023-10-02 23:30:10 +03:00