Kumar Gala a4b78f5755 tests: pwm_loopback: Convert to use DEVICE_DT_GET ... Replace device_get_binding with DEVICE_DT_GET for getting access to the pwm controller device. Signed-off-by: Kumar Gala <kumar.gala@linaro.org>		2021-02-24 13:45:46 -06:00
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application_development	tests: add filter for some tests using newlib	2020-12-16 08:57:40 -05:00
arch	tests: arm_thread_swap: fix testsuite setup	2021-02-22 14:36:06 -05:00
benchmarks	x86: rename CONFIG_SSE* to CONFIG_X86_SSE*	2021-02-15 08:21:15 -05:00
bluetooth	tests: Bluetooth: Add minimal compilation coverage for openisa	2021-02-16 12:02:00 -05:00
boards	i2c_test: add a testcase to test i2c api for microchip board	2021-01-23 01:34:10 -05:00
crypto	tests: tinycrypt: disable for ARC QEMU platforms	2021-02-15 08:11:19 -05:00
deprecated/inttype	dts: remove legacy macro support	2020-10-09 08:45:38 -05:00
drivers	tests: pwm_loopback: Convert to use DEVICE_DT_GET	2021-02-24 13:45:46 -06:00
kernel	test: fix gen_isr_table for npcx soc	2021-02-24 11:02:32 -05:00
lib	devicetree: spi: add CS GPIO controller accessors	2021-02-23 10:34:19 -05:00
misc/test_build	sanitycheck: inclusive language	2020-08-27 07:04:07 -04:00
net	tests: net: select: Increase the timeout to 20ms	2021-02-24 08:01:43 -05:00
portability	samples: cmsis_rtos_v2: increase stack	2021-01-20 16:45:31 -05:00
posix	m2gl025_miv: Double the test timeouts	2021-02-09 19:41:27 -05:00
subsys	test: logging: improve test coverage for logging subsystem	2021-02-23 10:33:13 -05:00
unit	lib/os/cbprintf_nano.c: several improvements	2021-02-23 19:39:59 +01:00
ztest	tests: ztest: fix error_hook test case fail in some board	2021-02-04 13:09:55 -05:00