zephyr/subsys/testsuite/include/test_utils.h
Anas Nashif ccad9d0d09 tests: move testsuite and configs into subsys/
Move test related code and the testsuite away from tests/ and make it a
proper subsystem.
The way tests were integrate in the tree was not obvious and actual
tests were intermixed with the testsuite code.

This will allow us to have trees with the testcode and without the
samples by just remove the folders tests/ and samples, needed for
isolating actual code from test/sample code.

Signed-off-by: Anas Nashif <anas.nashif@intel.com>
2019-02-22 08:58:40 -05:00

86 lines
2.8 KiB
C

/* test_utils.h - TinyCrypt interface to common functions for tests */
/*
* Copyright (C) 2015 by Intel Corporation, All Rights Reserved.
*
* Redistribution and use in source and binary forms, with or without
* modification, are permitted provided that the following conditions are met:
*
* - Redistributions of source code must retain the above copyright notice,
* this list of conditions and the following disclaimer.
*
* - Redistributions in binary form must reproduce the above copyright
* notice, this list of conditions and the following disclaimer in the
* documentation and/or other materials provided with the distribution.
*
* - Neither the name of Intel Corporation nor the names of its contributors
* may be used to endorse or promote products derived from this software
* without specific prior written permission.
*
* THIS SOFTWARE IS PROVIDED BY THE COPYRIGHT HOLDERS AND CONTRIBUTORS "AS IS"
* AND ANY EXPRESS OR IMPLIED WARRANTIES, INCLUDING, BUT NOT LIMITED TO, THE
* IMPLIED WARRANTIES OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE ARE
* DISCLAIMED. IN NO EVENT SHALL THE COPYRIGHT OWNER OR CONTRIBUTORS BE LIABLE
* FOR ANY DIRECT, INDIRECT, INCIDENTAL, SPECIAL, EXEMPLARY, OR CONSEQUENTIAL
* DAMAGES (INCLUDING, BUT NOT LIMITED TO, PROCUREMENT OF SUBSTITUTE GOODS OR
* SERVICES; LOSS OF USE, DATA, OR PROFITS; OR BUSINESS INTERRUPTION) HOWEVER
* CAUSED AND ON ANY THEORY OF LIABILITY, WHETHER IN CONTRACT, STRICT LIABILITY,
* OR TORT (INCLUDING NEGLIGENCE OR OTHERWISE) ARISING IN ANY WAY OUT OF THE USE
* OF THIS SOFTWARE, EVEN IF ADVISED OF THE POSSIBILITY OF SUCH DAMAGE.
*/
#ifndef __TEST_UTILS_H__
#define __TEST_UTILS_H__
#include <tc_util.h>
#include <tinycrypt/constants.h>
static inline void show_str(const char *label, const u8_t *s, size_t len)
{
u32_t i;
TC_PRINT("%s = ", label);
for (i = 0; i < (u32_t)len; ++i) {
TC_PRINT("%02x", s[i]);
}
TC_PRINT("\n");
}
static inline
void fatal(u32_t testnum, const void *expected, size_t expectedlen,
const void *computed, size_t computedlen)
{
TC_ERROR("\tTest #%d Failed!\n", testnum);
show_str("\t\tExpected", expected, expectedlen);
show_str("\t\tComputed ", computed, computedlen);
TC_PRINT("\n");
}
static inline
u32_t check_result(u32_t testnum, const void *expected,
size_t expectedlen, const void *computed,
size_t computedlen, u32_t verbose)
{
u32_t result = TC_PASS;
ARG_UNUSED(verbose);
if (expectedlen != computedlen) {
TC_ERROR("The length of the computed buffer (%zu)",
computedlen);
TC_ERROR("does not match the expected length (%zu).",
expectedlen);
result = TC_FAIL;
} else {
if (memcmp(computed, expected, computedlen) != 0) {
fatal(testnum, expected, expectedlen,
computed, computedlen);
result = TC_FAIL;
}
}
return result;
}
#endif