TOKITA Hiroshi 3c4e842c90 tests: spi: spi_loopback: add interrupt and DMA tests for rpi_pico ... Add interrupt and DMA tests for rpi_pico boards. Add tests for combination of cases of DMA, interrupt and DMA is not enabled by dts. Signed-off-by: TOKITA Hiroshi <tokita.hiroshi@fujitsu.com>		2023-04-07 13:20:16 +02:00
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application_development	tests: code_relocation: Add additional test cases for library and genex	2023-01-17 18:08:37 +01:00
arch	soc: arm: ti_simplelink: Add support for TI CC13X2X7 SoC series	2023-03-21 16:03:43 -04:00
benchmarks	tests: mark testcases with pm where CONFIG_PM=y is forced	2023-04-04 13:34:45 +02:00
bluetooth	bluetooth: tester: Add ASCS and BAP tests handling	2023-04-05 14:51:30 +02:00
boards	tests: intel_adsp: remove reference to old platforms	2023-04-06 18:51:56 +02:00
boot	tests: boot: test_mcuboot: Add mcuboot log level	2023-04-06 18:51:23 +02:00
bsim	tests: Bluetooth: Add MCC BSIM reconnection	2023-04-07 11:29:54 +02:00
cmake	tests: add snippet test suite	2023-03-26 16:12:41 +02:00
crypto	tests: remove intel adsp cavs platforms from filters	2023-04-06 18:51:56 +02:00
drivers	tests: spi: spi_loopback: add interrupt and DMA tests for rpi_pico	2023-04-07 13:20:16 +02:00
kernel	tests: remove intel adsp cavs platforms from filters	2023-04-06 18:51:56 +02:00
lib	libc: fix armclang compiler warnings with is*() functions	2023-04-04 13:47:34 +02:00
misc	samples/tests: Add empty prj.conf files	2023-03-17 11:49:27 +01:00
net	net: lwm2m: Default lifetime is also a minimum accepted lifetime	2023-04-06 14:15:04 -05:00
posix	tests: posix: common: Add testcase for arm-clang	2023-04-06 19:50:23 -04:00
subsys	ec_host_cmd: add UART backend	2023-04-07 13:05:59 +02:00
unit	tests/cbprintf: Add explicit casts when testing short/char printf	2023-04-05 10:38:34 +02:00
ztest	tests: ztest: use more verbose testname	2023-04-05 10:27:28 +02:00
test_config.yaml	twister: add support for levels and test configuration	2023-03-07 15:49:16 +01:00