Luiz Augusto von Dentz dd94be3ffc tests: buf: Add byte order tests ... This adds tests for reading and writing 16, 24, 32, 48 and 64 bits in different byte orders. Signed-off-by: Luiz Augusto von Dentz <luiz.von.dentz@intel.com>		2019-12-10 09:55:30 +02:00
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application_development	tests: fix test identifiers	2019-12-09 15:53:44 -05:00
arch	tests: fix test identifiers	2019-12-09 15:53:44 -05:00
benchmarks	tests: fix test identifiers	2019-12-09 15:53:44 -05:00
bluetooth	tests: fix test identifiers	2019-12-09 15:53:44 -05:00
boards	tests: fix test identifiers	2019-12-09 15:53:44 -05:00
crypto	kernel: thread: Fix randomness problem with stack pointer random	2019-11-15 13:43:32 -08:00
drivers	tests: spi: fix test function name	2019-12-09 15:53:44 -05:00
kernel	tests: kernel: split pending testing	2019-12-09 15:53:44 -05:00
lib	tests: gui: Enable new LVGL features in tests	2019-12-09 15:07:28 -06:00
misc/test_build	tests: fix test identifiers	2019-12-09 15:53:44 -05:00
net	tests: buf: Add byte order tests	2019-12-10 09:55:30 +02:00
portability	tests: samples: portability: fix test tags and identifiers	2019-12-09 15:53:44 -05:00
posix	tests: updated names for the tests	2019-10-23 23:15:41 -04:00
shell	tests: fix test identifiers	2019-12-09 15:53:44 -05:00
subsys	tests: fix test identifiers	2019-12-09 15:53:44 -05:00
unit	tests: fix test identifiers	2019-12-09 15:53:44 -05:00
ztest	subsys/testsuite: make tc_util overridable	2019-09-17 07:11:33 +08:00