6ecfe3eba1
Make the expected data buffers immutable to ensure that the test isn't modifying them. Improve clarity by using defines for the two devicetree nodes rather than repeating the DT_INST() retrieval. Clean up the naming and diagnostics to more clearly associate the device label, I2C bus, and I2C address with either EEPROM instance 0 or 1. Replace the base 1 numbering in some diagnostics. Document why a device nominally on one bus is being accessed from another bus. Return error values from helper functions rather than invoking ztest failure code so the calling context can provide a better description of what went wrong. Signed-off-by: Peter Bigot <peter.bigot@nordicsemi.no> |
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| .. | ||
| application_development | ||
| arch | ||
| benchmarks | ||
| bluetooth | ||
| boards | ||
| crypto | ||
| deprecated | ||
| drivers | ||
| kernel | ||
| lib | ||
| misc/test_build | ||
| net | ||
| portability | ||
| posix | ||
| shell | ||
| subsys | ||
| unit | ||
| ztest | ||