..
bindesc
tests/samples: use integration platforms where possible
2025-03-11 11:35:15 +01:00
canbus
console
dap
drivers: dp: fix build on M0 MCUs
2025-05-19 11:24:49 +02:00
debug
samples/subsys/debug/fuzz: Remove support for native_posix
2025-03-07 19:16:14 +01:00
demand_paging
display
samples: lvgl: Enable PM for frdm_rw612 boards
2025-05-19 21:54:55 +02:00
edac
fs
samples: fs: typo in project name
2025-06-06 08:46:04 +02:00
input
tests, samples: update esp32_devkitc board records
2025-04-29 16:48:55 +02:00
ipc
samples: ipc: openamp_rsc_table: conditional virtio ID sent on IPM device
2025-05-27 10:29:20 +02:00
llext
samples: subsys: llext: shell_loader: Exclude Renesas RZ/A2M
2025-04-25 14:05:01 +02:00
logging
arch: nios2: remove arch
2025-05-15 20:01:05 -04:00
lorawan
samples: subsys: lorawan: callback registration for handle descriptor
2025-03-07 19:42:56 +01:00
mgmt
samples: mgmt: hawkbit: remove shell testcase
2025-06-06 16:01:51 +02:00
modbus
nvs
samples: subsys: nvs: add testcase for MCXN947 internal flash
2025-05-31 05:57:40 -04:00
pm
samples/subsys/pm/latency: Remove native_posix overlays
2025-03-07 19:16:14 +01:00
portability
profiling
rtio
sensing
settings
samples: subsys: setting does not apply when sector size is 128K
2025-06-06 08:42:22 +02:00
shell
tests: robot: renode: Use precise pause for UART keywords
2025-04-16 17:07:05 +02:00
sip_svc
smf
task_wdt
samples: task_wdt: Use wdt device if it is ready
2025-03-19 01:24:56 +01:00
testsuite
drivers uart_native_posix: rename to native_pty and support N instances
2025-03-11 18:54:02 +01:00
tracing
usb
usb: device_next: use system workqueue in CDC ACM by default
2025-06-03 14:48:29 +01:00
usb_c
uuid
samples: uuid: fix README issues
2025-04-22 04:34:51 +02:00
zbus
soc/sifive: differentiate between FE310-G000 and FE310-G002
2025-06-02 17:37:32 +02:00
subsys.rst
d7b08aa2f3