70758c4374
The seasonal overhaul of test identifiers aligning the terms being used and creating a structure. This is hopefully the last time we do this, plan is to document the identifiers and enforce syntax. The end-goal is to be able to generate a testsuite description from the existing tests and sync it frequently with the testsuite in Testrail. Signed-off-by: Anas Nashif <anas.nashif@intel.com>
14 lines
329 B
YAML
14 lines
329 B
YAML
sample:
|
|
name: Demo for Fujitsu MB85RC256V FRAM (I2C)
|
|
tests:
|
|
sample.drivers.i2c.fujitsu_fram:
|
|
tags: drivers
|
|
depends_on: i2c
|
|
filter: dt_alias_exists("i2c-0")
|
|
harness: console
|
|
harness_config:
|
|
type: one_line
|
|
regex:
|
|
- "Data comparison successful."
|
|
fixture: fixture_i2c_FRAM
|