zephyr/tests/drivers
jing wang 2c311431fc tests: add a dma transfer test with different channel and burstlen
This TC cover dma transfer with different channel and burst length
It support 2 ways to execute
*) full-auto: by default, it run all sub test cases defined in array
   once flashing done and reset.
*) interactive: when CONFIG_CONFIG_CONSOLE_HANDLER_SHELL=y, it go into
   shell first, user can input test command one by one for debugging.

move original test under drivers/dma to test_loop_transfer/

Change-Id: I7e78b730592c80bf2c23b20c8b0eb65a9b353acd
Signed-off-by: jing wang <jing.j.wang@intel.com>
2016-11-09 02:38:57 +00:00
..
adc samples: tests: remove obsolete KERNEL_TYPE and kernel variables 2016-11-04 15:47:25 -04:00
aon_counter samples: tests: remove obsolete KERNEL_TYPE and kernel variables 2016-11-04 15:47:25 -04:00
build_all samples: tests: remove obsolete KERNEL_TYPE and kernel variables 2016-11-04 15:47:25 -04:00
dma tests: add a dma transfer test with different channel and burstlen 2016-11-09 02:38:57 +00:00
enc28j60 samples: tests: remove obsolete KERNEL_TYPE and kernel variables 2016-11-04 15:47:25 -04:00
nsim_uart samples: tests: remove obsolete KERNEL_TYPE and kernel variables 2016-11-04 15:47:25 -04:00
pci_enum samples: tests: remove obsolete KERNEL_TYPE and kernel variables 2016-11-04 15:47:25 -04:00
pinmux samples: tests: remove obsolete KERNEL_TYPE and kernel variables 2016-11-04 15:47:25 -04:00
quark_clock samples: tests: remove obsolete KERNEL_TYPE and kernel variables 2016-11-04 15:47:25 -04:00
spi_test samples: tests: remove obsolete KERNEL_TYPE and kernel variables 2016-11-04 15:47:25 -04:00
uart samples: tests: remove obsolete KERNEL_TYPE and kernel variables 2016-11-04 15:47:25 -04:00