Mahesh Mahadevan a02704bacf tests: i2s_speed: Increase the RX buffer count ... The NXP I2S driver queues 2 receive buffers to avoid receive overflows. Allocate an extra block so we do not see test failures due to allocate failures Signed-off-by: Mahesh Mahadevan <mahesh.mahadevan@nxp.com>		2021-06-03 14:14:24 -05:00
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adc	boards: arm: Modify BMD-345-EVAL support	2021-05-18 11:26:31 -05:00
build_all	drivers: sensor: STM32 die temperature driver	2021-05-08 10:18:09 -05:00
can	tests: driver: can: canfd: Add CAN-FD tests	2021-05-07 12:36:10 -05:00
clock_control
console
counter
dac
dma	test: dma: assign correct LPC dma engine channel for test	2021-05-25 09:57:21 -05:00
eeprom
entropy/api
flash	tests: flash: Enable flash driver and file system tests on mimxrt1060_evk	2021-05-18 11:19:15 -05:00
flash_simulator
gpio
hwinfo/api
i2c
i2s	tests: i2s_speed: Increase the RX buffer count	2021-06-03 14:14:24 -05:00
ipm
kscan/kscan_api
led/led_api
memc/stm32_sdram
pwm	tests: drivers: Assign prescaler value to 10000	2021-05-19 07:47:45 -05:00
regulator/fixed
sensor
spi/spi_loopback	boards: arm: lpcxpresso55s16: rename board definition	2021-05-19 08:02:54 -05:00
timer/nrf_rtc_timer
uart	tests: drivers: uart: Add test for uart power management	2021-05-21 04:53:19 -05:00
watchdog/wdt_basic_api