70758c4374
The seasonal overhaul of test identifiers aligning the terms being used and creating a structure. This is hopefully the last time we do this, plan is to document the identifiers and enforce syntax. The end-goal is to be able to generate a testsuite description from the existing tests and sync it frequently with the testsuite in Testrail. Signed-off-by: Anas Nashif <anas.nashif@intel.com>
26 lines
698 B
YAML
26 lines
698 B
YAML
sample:
|
|
name: SPI Flash Sample
|
|
tests:
|
|
sample.drivers.spi.flash:
|
|
tags: spi flash
|
|
filter: dt_compat_enabled("jedec,spi-nor")
|
|
harness: console
|
|
harness_config:
|
|
type: multi_line
|
|
ordered: true
|
|
regex:
|
|
- "Test 1: Flash erase"
|
|
- "Flash erase succeeded!"
|
|
- "Test 2: Flash write"
|
|
- "Attempted to write 55 aa"
|
|
- "Data read 55 aa"
|
|
- "Data read matches with data written. Good!!"
|
|
depends_on: spi
|
|
sample.drivers.spi.flash_dpd:
|
|
tags: spi flash
|
|
filter: dt_compat_enabled("jedec,spi-nor")
|
|
build_only: true
|
|
extra_configs:
|
|
- CONFIG_SPI_NOR_IDLE_IN_DPD=y
|
|
depends_on: spi
|