i2s_speed Test
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Board-specific details:
MIMXRT1170_EVK:
This board uses CONFIG_I2S_TEST_SEPARATE_DEVICES=n and connects TX and RX blocks in one
SAI peripheral by shorting signals externally on the EVK.
These are the HW changes required to run this test:
- Short BCLK J9-pin1 (SAI1_RX_BCLK) to J9-pin11 (SAI1_TX_BCLK)
- Short SYNC J9-pin5 (SAI1_RX_SYNC) to J9-pin13 (SAI1_TX_SYNC)
- Short Data J9-pin7 (SAI1_RX_DATA) to J9-pin9 (SAI1_TX_DATA)
MIMXRT1170_EVKB (SCH-55139 Rev C/C1/C2):
This board uses CONFIG_I2S_TEST_SEPARATE_DEVICES=n and connects TX and RX blocks in one
SAI peripheral by shorting signals externally on the EVK.
These are the HW changes required to run this test:
- Populate R2124, R2125
- Remove J99, J100
- Short Data J99-pin1 (SAI1_RX_DATA0) to J100-pin1 (SAI1_TX_DATA0)
FRDM-MCXN947:
This board uses CONFIG_I2S_TEST_SEPARATE_DEVICES=y and connects two SAI peripherals by shorting
signals externally on the EVK. These are the HW changes required to run this test:
- Short BCLK J1-pin9 (SAI1_RX_BCLK/P3_18) to J3-pin15 (SAI0_TX_BCLK/P2_6)
- Short SYNC J1-pin13 (SAI1_RX_FS/P3_19) to J3-pin13 (SAI0_TX_FS/P2_7)
- Short Data J1-pin15 (SAI1_RXD0/P3_21) to J3-pin7 (SAI0_TXD0/P2_2)
MIMXRT1060-EVK[B/C]:
This board uses a single SAI and connects the TX and RX signals by shorting externally on the EVK.
These are the HW changes required to run this test on MIMXRT1060-EVK[B/C]:
- Remove jumper J99
- Short BCLK J23-pin5 (SAI1_RX_BCLK / GPIO_AD_B1_11) to J23-pin23 (SAI1_TX_BCLK / GPIO_AD_B1_14)
- Short SYNC J23-pin9 (SAI1_RX_SYNC / GPIO_AD_B1_10) to J23-pin16 (SAI1_TX_SYNC / GPIO_AD_B1_15)
- Short Data J23-pin11 (SAI1_RX_DATA0 / GPIO_AD_B1_12) to J23-pin17 (SAI1_TX_DATA0 / GPIO_AD_B1_13)
- NOTE: these connections cause contention with the following signals/features:
- camera CSI_D[2-7]
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