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zephyr/tests
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Ulf Magnusson 5bb149e414 drivers: i2c: kconfig: Remove unused I2C_EEPROM_SLAVE_0/1 symbols 
Unused since commit f3f8f96842 ("tests: i2c_slave_spi: update to
proposed DT compatible naming").

Found with a script.

Signed-off-by: Ulf Magnusson <Ulf.Magnusson@nordicsemi.no>
2019-10-29 06:15:55 +01:00
..
application_development x86: consolidate x86_64 architecture, SoC and boards 2019-10-25 17:57:55 -04:00
arch x86: consolidate x86_64 architecture, SoC and boards 2019-10-25 17:57:55 -04:00
benchmarks x86: consolidate x86_64 architecture, SoC and boards 2019-10-25 17:57:55 -04:00
bluetooth tests: remove duplicate names for the bluetooth tests 2019-10-24 06:29:17 -04:00
boards tests: remove duplicate names for the boards tests 2019-10-24 06:31:06 -04:00
crypto x86: consolidate x86_64 architecture, SoC and boards 2019-10-25 17:57:55 -04:00
drivers drivers: i2c: kconfig: Remove unused I2C_EEPROM_SLAVE_0/1 symbols 2019-10-29 06:15:55 +01:00
kernel x86: consolidate x86_64 architecture, SoC and boards 2019-10-25 17:57:55 -04:00
lib tests: remove duplicate names for the libraries tests 2019-10-24 06:27:30 -04:00
misc/test_build tests: convert util test to a unit test 2019-09-30 07:09:42 -04:00
net x86: consolidate x86_64 architecture, SoC and boards 2019-10-25 17:57:55 -04:00
portability x86: consolidate x86_64 architecture, SoC and boards 2019-10-25 17:57:55 -04:00
posix tests: updated names for the tests 2019-10-23 23:15:41 -04:00
shell tests: Never disable SMP 2019-09-26 16:54:06 -04:00
subsys tests: add test for invalid zcan_frame 2019-10-28 12:57:10 +02:00
unit tests: updated names for the tests 2019-10-23 23:15:41 -04:00
ztest subsys/testsuite: make tc_util overridable 2019-09-17 07:11:33 +08:00