zephyr/samples/drivers/spi_flash_at45/sample.yaml
Andrzej Głąbek a10edd538e samples/drivers/spi_flash_at45: Improve test case descriptions
Instead of whitelist, use a filter that checks if a required
"atmel,at45" compatible node is present.
Add a build-only test case to be used by CI and provide a harness
configuration so that execution of the sample can be also verified.

Signed-off-by: Andrzej Głąbek <andrzej.glabek@nordicsemi.no>
2020-06-25 19:33:41 +02:00

27 lines
894 B
YAML

sample:
name: SPI Flash AT45 Sample
tests:
sample.drivers.spi.flash.at45.build:
tags: spi flash
depends_on: spi
filter: dt_compat_enabled("atmel,at45")
build_only: true
sample.drivers.spi.flash.at45:
tags: spi flash
depends_on: spi
filter: dt_compat_enabled("atmel,at45")
harness: console
harness_config:
type: multi_line
ordered: true
regex:
- "Using \\w+, chip size: \\d+ bytes \\(page: \\d+\\)"
- "Reading the first byte of the test region ... OK"
- "Preparing test content starting with 0x[0-9a-f]{2}."
- "Writing the first half of the test region... OK"
- "Writing the second half of the test region... OK"
- "Reading the whole test region... OK"
- "Checking the read content... OK"
- "Putting the flash device into low power state... OK"
fixture: atmel_at45