Anas Nashif 4dabea6f67 tests: settings: fix test meta data and components ... Fix meta data and standarize components in test identifiers. Signed-off-by: Anas Nashif <anas.nashif@intel.com>		2023-10-11 14:19:40 +03:00
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src	settings fcb: Increase buffer for mcu with large write block size	2023-01-26 22:50:40 +09:00
CMakeLists.txt
native_posix_64.overlay
native_posix.overlay
nrf52dk_nrf52832.overlay	boards: arm: nordic nrf91* nrf53* nrf52* nrf51*: Remove scratch areas	2022-12-20 11:57:38 +01:00
nrf52840dk_nrf52840.overlay	tests: subsys: settings: Remove nrf52 scratch	2022-12-20 11:57:38 +01:00
prj.conf	tests: settings: fcb: increase ztest stack size to 2kB	2022-12-16 14:38:51 +01:00
testcase.yaml	tests: settings: fix test meta data and components	2023-10-11 14:19:40 +03:00