Johann Fischer 1ac67d1559 tests: usb: adapt descriptor test to new Serial Number placeholder ... Adapt descriptor test to new Serial Number placeholder. Signed-off-by: Johann Fischer <j.fischer@phytec.de>		2019-12-18 11:12:28 +01:00
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can/frame	tests: add test for invalid zcan_frame	2019-10-28 12:57:10 +02:00
debug/tracing	tests: fix test identifiers	2019-12-09 15:53:44 -05:00
dfu	tests/subsys/dfu/img_util: progressively erase testcase	2019-12-15 10:26:36 -05:00
fs	global: Remove leading/trailing blank lines in files	2019-12-11 19:17:27 +01:00
jwt	global: Remove leading/trailing blank lines in files	2019-12-11 19:17:27 +01:00
logging	tests: logging: Remove unneeded excludes	2019-12-11 06:39:09 -06:00
settings	global: Remove leading/trailing blank lines in files	2019-12-11 19:17:27 +01:00
shell/shell_history	tests: remove duplicate names for the shell tests	2019-10-24 06:24:49 -04:00
storage/flash_map	tests: fix test identifiers	2019-12-09 15:53:44 -05:00
usb	tests: usb: adapt descriptor test to new Serial Number placeholder	2019-12-18 11:12:28 +01:00