zephyr/tests/subsys
Johann Fischer 1ac67d1559 tests: usb: adapt descriptor test to new Serial Number placeholder
Adapt descriptor test to new Serial Number placeholder.

Signed-off-by: Johann Fischer <j.fischer@phytec.de>
2019-12-18 11:12:28 +01:00
..
can/frame tests: add test for invalid zcan_frame 2019-10-28 12:57:10 +02:00
debug/tracing tests: fix test identifiers 2019-12-09 15:53:44 -05:00
dfu tests/subsys/dfu/img_util: progressively erase testcase 2019-12-15 10:26:36 -05:00
fs global: Remove leading/trailing blank lines in files 2019-12-11 19:17:27 +01:00
jwt global: Remove leading/trailing blank lines in files 2019-12-11 19:17:27 +01:00
logging tests: logging: Remove unneeded excludes 2019-12-11 06:39:09 -06:00
settings global: Remove leading/trailing blank lines in files 2019-12-11 19:17:27 +01:00
shell/shell_history tests: remove duplicate names for the shell tests 2019-10-24 06:24:49 -04:00
storage/flash_map tests: fix test identifiers 2019-12-09 15:53:44 -05:00
usb tests: usb: adapt descriptor test to new Serial Number placeholder 2019-12-18 11:12:28 +01:00