zephyr/tests/drivers
Anas Nashif eb6f20318e tests: fix meta data of peripheral tests
Improve naming of tests.

Signed-off-by: Anas Nashif <anas.nashif@intel.com>
2018-04-25 14:18:15 +05:30
..
adc tests: classify periphera tests 2018-04-09 22:55:20 -04:00
aio tests: classify periphera tests 2018-04-09 22:55:20 -04:00
aon_counter/aon_api tests: classify periphera tests 2018-04-09 22:55:20 -04:00
build_all tests: build_all: Add LPS22HB and LSM6DSL sensors build test 2018-04-10 22:12:14 +02:00
dma tests: classify periphera tests 2018-04-09 22:55:20 -04:00
entropy/api tests: classify periphera tests 2018-04-09 22:55:20 -04:00
gpio/gpio_basic_api tests: classify periphera tests 2018-04-09 22:55:20 -04:00
i2c/i2c_api tests: classify periphera tests 2018-04-09 22:55:20 -04:00
i2s tests: classify periphera tests 2018-04-09 22:55:20 -04:00
ipm tests: classify periphera tests 2018-04-09 22:55:20 -04:00
pci_enum tests: classify periphera tests 2018-04-09 22:55:20 -04:00
pinmux/pinmux_basic_api tests: classify periphera tests 2018-04-09 22:55:20 -04:00
pwm/pwm_api tests: classify periphera tests 2018-04-09 22:55:20 -04:00
rtc/rtc_basic_api tests: classify periphera tests 2018-04-09 22:55:20 -04:00
spi/spi_loopback drivers: spi: Add shim for nrfx SPIM driver 2018-04-12 14:19:53 -04:00
uart/uart_basic_api tests: fix meta data of peripheral tests 2018-04-25 14:18:15 +05:30
watchdog/wdt_basic_api tests: fix meta data of peripheral tests 2018-04-25 14:18:15 +05:30