zephyr/tests
Anas Nashif b4598c19e3 tests: disable building of FXOS8700 sensor for all boards
This sensor was made dependent on certain boards, so building it with
all boards fails now. Disable until proper fix exists.

Signed-off-by: Anas Nashif <anas.nashif@intel.com>
2017-07-28 09:40:38 -05:00
..
benchmarks timing_info: fix how stacks are referenced 2017-07-26 05:53:14 -04:00
bluetooth build: workaround build bug in tests 2017-07-27 14:09:40 -04:00
booting/stub license: Replace Apache boilerplate with SPDX tag 2017-01-19 03:50:58 +00:00
compliance tests/compiance/checkpatch: force the format to 'email' 2016-11-10 19:30:32 +00:00
crypto build: workaround build bug in tests 2017-07-27 14:09:40 -04:00
drivers tests: disable building of FXOS8700 sensor for all boards 2017-07-28 09:40:38 -05:00
include tests: convert to using newly introduced integer sized types 2017-04-21 09:53:49 -05:00
kernel drivers, net: Clean up semaphore initialization 2017-07-27 15:23:07 -04:00
lib/json tests: remove testcase.ini files 2017-06-21 20:56:53 -04:00
net tests: mqtt: Add a mqtt tls test case 2017-07-28 11:25:43 +03:00
power tests: remove testcase.ini files 2017-06-21 20:56:53 -04:00
shell tests: shell: Filter on UART_CONSOLE support to enable more boards 2017-06-29 07:07:31 -04:00
subsys tests: Remove camel case and fix coding style 2017-06-29 07:00:50 -04:00
unit tests: remove testcase.ini files 2017-06-21 20:56:53 -04:00
ztest tests/ztest: Add ztest_test_pass() 2017-06-21 21:52:50 -04:00
Kconfig tests: Introduced new config option to add extra stack size for tests. 2017-02-13 11:39:03 -08:00
Makefile tests: Add a generic testing framework 2016-09-30 21:17:39 +00:00
Makefile.test tests: Add a generic testing framework 2016-09-30 21:17:39 +00:00