zephyr/samples/drivers
Anas Nashif 3c50f7aa12 tests: samples: remove duplicate filtering
We have many testcases doing filtering both on the architecture level
and the platform level, which is redundant. Also many testcases are
running the same test twice on the same SoC for no good reason, cleanup
the tests and cleanup the filtering.

Signed-off-by: Anas Nashif <anas.nashif@intel.com>
2017-06-27 17:44:23 -04:00
..
aio_comparator tests: samples: remove duplicate filtering 2017-06-27 17:44:23 -04:00
crypto tests: samples: remove duplicate filtering 2017-06-27 17:44:23 -04:00
current_sensing tests: samples: remove duplicate filtering 2017-06-27 17:44:23 -04:00
gpio tests: remove testcase.ini files 2017-06-21 20:56:53 -04:00
i2c_fujitsu_fram tests: samples: remove duplicate filtering 2017-06-27 17:44:23 -04:00
lcd_hd44780 tests: remove testcase.ini files 2017-06-21 20:56:53 -04:00
led_apa102c tests: samples: remove duplicate filtering 2017-06-27 17:44:23 -04:00
random tests: remove testcase.ini files 2017-06-21 20:56:53 -04:00
rtc tests: remove testcase.ini files 2017-06-21 20:56:53 -04:00
soc_flash_nrf5 tests: remove testcase.ini files 2017-06-21 20:56:53 -04:00
spi api/spi: Change transceive functions signature 2017-06-01 10:49:30 -04:00
spi_flash tests: remove testcase.ini files 2017-06-21 20:56:53 -04:00
spi_fujitsu_fram tests: samples: remove duplicate filtering 2017-06-27 17:44:23 -04:00
watchdog tests: remove testcase.ini files 2017-06-21 20:56:53 -04:00