Anas Nashif 93109f2d8e tests: enhance test meta-data/improve test naming ... Enhance the test meta-data and test names. This will is needed for better and consistent reporting. Signed-off-by: Anas Nashif <anas.nashif@intel.com>		2018-05-07 12:27:07 -04:00
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adc	tests: enhance test meta-data/improve test naming	2018-05-07 12:27:07 -04:00
aio	tests: fixed doxygen comments	2018-04-30 17:15:29 -04:00
aon_counter/aon_api	tests: classify periphera tests	2018-04-09 22:55:20 -04:00
build_all	tests/samples: add hw dependencies	2018-05-01 19:10:27 -04:00
dma	tests: classify periphera tests	2018-04-09 22:55:20 -04:00
entropy/api	tests: classify periphera tests	2018-04-09 22:55:20 -04:00
gpio/gpio_basic_api	tests: classify periphera tests	2018-04-09 22:55:20 -04:00
i2c/i2c_api	tests: classify periphera tests	2018-04-09 22:55:20 -04:00
i2s	tests: classify periphera tests	2018-04-09 22:55:20 -04:00
ipm	tests: classify periphera tests	2018-04-09 22:55:20 -04:00
pci_enum	tests: classify periphera tests	2018-04-09 22:55:20 -04:00
pinmux/pinmux_basic_api	tests: classify periphera tests	2018-04-09 22:55:20 -04:00
pwm/pwm_api	tests: classify periphera tests	2018-04-09 22:55:20 -04:00
rtc/rtc_basic_api	tests: enhance test meta-data/improve test naming	2018-05-07 12:27:07 -04:00
spi/spi_loopback	drivers: spi: Add shim for nrfx SPIM driver	2018-04-12 14:19:53 -04:00
uart/uart_basic_api	tests: fix meta data of peripheral tests	2018-04-25 14:18:15 +05:30
watchdog/wdt_basic_api	tests: fix meta data of peripheral tests	2018-04-25 14:18:15 +05:30