Commit Graph

10 Commits

Author SHA1 Message Date
Sebastian Głąb
ffd065f93e tests: drivers: flash: Move negative tests to a separate project
Move negative tests for flash driver to a separate test suite.
Run negative tests only on platforms that are aligned.

Signed-off-by: Sebastian Głąb <sebastian.glab@nordicsemi.no>
2024-08-26 17:08:19 +02:00
Sebastian Głąb
1a48a0174f tests: drivers: flash: common: Increase test coverage
Add functional test for flash_erase().
Add negative tests for flash_read(), flas_write(), flash_erase(),
flash_fill() and flash_flatten().
Add functional test for flash page layout.

Signed-off-by: Sebastian Głąb <sebastian.glab@nordicsemi.no>
2024-08-20 10:31:11 +02:00
Jordan Yates
91f8c1aea9 everywhere: replace #if IS_ENABLED() as per docs
Replace `#if IS_ENABLED()` with `#if defined()` as recommended by the
documentation of `IS_ENABLED`.

Signed-off-by: Jordan Yates <jordan@embeint.com>
2024-06-28 07:20:32 -04:00
Dominik Ermel
b8d073c572 drivers/flash: Add flash_fill() and flash_flatten()
The commit adds two new API calls:
 - flash_fill - that allows to fill selected part of device with
   specified value;
 - flash_flatten - that allows to erase or fill device with
   erase_value, depending on whether driver for the device provides
   erase callback.

Signed-off-by: Dominik Ermel <dominik.ermel@nordicsemi.no>
2024-06-04 08:00:46 +02:00
Dominik Ermel
010b8d19e9 tests/drivers/flash: Make tests check for explicit erase capability
Test now check whether device has requirement for explicit erase
before call or not, before performing various actions.

Signed-off-by: Dominik Ermel <dominik.ermel@nordicsemi.no>
2024-06-04 08:00:46 +02:00
Dominik Ermel
6d40cb8038 tests/flash: Fix nrf52840dk configurations
The commit disables QSPI in SoC configurations, as QSPI got enabled
by default and test never really run on SoC.

In QSPI configuration erase page size is set to 4096
There is not TC_PRINT showing name of device that the test will
run on, in test setup.

The nrf52840dk configuration files have been renamed to reflect
dk name and SoC.

Signed-off-by: Dominik Ermel <dominik.ermel@nordicsemi.no>
2024-03-12 17:57:39 +00:00
Dominik Ermel
8ecda0418d tests/flash: Fix test assuming erase value to be 0xff
Test assumed non-writen flash to contain 0xff while it is
supposed to check for erase_value.
The "random" buffer has also been updated to skip values that
are equal to erase value.

Signed-off-by: Dominik Ermel <dominik.ermel@nordicsemi.no>
2024-01-18 10:55:32 +01:00
Joakim Andersson
a8e340eb7e tests: flash: Use a flash partition that is known to be nonsecure
With TF-M enabled the storage_partition can be used as memory that is
known to be configured as non-secure flash region.
The slot1_ns_partition partition is only correct when TF-M is built
with BL2 enabled.

Signed-off-by: Joakim Andersson <joakim.andersson@nordicsemi.no>
2023-12-11 09:56:55 +01:00
Alberto Escolar Piedras
67e3c21260 tests/flash: Fix max test size check
The condition just needs to be <=, as it is ok
to write say 128KB in a 128KB storage partition.

Signed-off-by: Alberto Escolar Piedras <alberto.escolar.piedras@nordicsemi.no>
2023-05-08 10:08:35 +02:00
Patryk Duda
32fbe27054 test: drivers: Move existing flash tests to flash/common directory
After 'flash_ex_op' syscall was added we are able to expose vendor
specific features to the user.

This patch moves existing tests to 'tests/drivers/common'. New tests for
vendor specific operations should go to vendor directory under
'tests/drivers/flash'.

Signed-off-by: Patryk Duda <pdk@semihalf.com>
2023-03-28 15:43:16 +00:00