Add the following improvements to the spi_loopback async test:
- Verify that a set of multiple spi_buf structures can be sent
successfully
- Check that the contents of the RX and TX buffers match after transfer
completion
Signed-off-by: Daniel DeGrasse <daniel.degrasse@nxp.com>
Add synchronization using semaphores for the UART ISR tx/rx
tests, instead of relying on a single k_yield() call to
ensure all UART ISR work can be completed before validating
the result.
Signed-off-by: Bjarki Arge Andreasen <bjarkix123@gmail.com>
Most tests define a buffer for UART data on the stack,
including the tests testing UART IRQ. Move buffers to
static memory, within the test fixture, which can then
be passed as the user_data to the UART IRQ callback.
Signed-off-by: Bjarki Arge Andreasen <bjarkix123@gmail.com>
This test assumes it can use all configured
NRF_RTC_TIMER_USER_CHAN_COUNT,
But the sync RTC code uses one while it synchronizes.
Let's just disable it the sync rtc.
This fixes an issue where the test fails for a simulated
nrf5340.
Signed-off-by: Alberto Escolar Piedras <alberto.escolar.piedras@nordicsemi.no>
Unify spelling of CAN Flexible Data-rate abbreviation to "CAN FD" instead
of "CAN-FD". The former aligns with the CAN in Automation (CiA)
recommendation.
Signed-off-by: Henrik Brix Andersen <hebad@vestas.com>
Define the storage_partition in the internal flash
instead of the external NOR qspi flash,
so the testcase can PASS on the disco_l4754_iot1 board.
Signed-off-by: Francois Ramu <francois.ramu@st.com>
Fix the labels used in io-channels to be consistent in whole
tests/drivers/build_all/sensor/adc.dtsi file.
Signed-off-by: Franciszek Zdobylak <fzdobylak@antmicro.com>
This commit adds utilites to parse the RMC and GGA
NMEA0183 messages, which contain all data which shall be
published using the struct gnss_data.
It also adds a test suite for the added utilities.
Signed-off-by: Bjarki Arge Andreasen <bjarkix123@gmail.com>
This commit adds parsing utilites for common string
representations of values contained in GNSS messages.
These utilites both parse and validate the integrity of
the data.
Unit tests are also added to validate the parsing
utilities.
Signed-off-by: Bjarki Arge Andreasen <bjarkix123@gmail.com>
Some RTCs don't support the tm_yday and/or tm_wday fields
of the struct rtc_time structure. These RTCs must set the
values of the fields to -1 if they are not supported, and
the test must be able to handle this correctly. This commit
adds an exception to the tm_yday and tm_wday fields allowing
them to be set to -1.
Signed-off-by: Bjarki Arge Andreasen <bjarkix123@gmail.com>
Commit 345735d0a8 removed all uses of the
now obsolete CONFIG_ZTEST_NEW_API Kconfig option. A couple of stray ones
are still remaining in the tree, remove them.
Signed-off-by: Carles Cufi <carles.cufi@nordicsemi.no>
Add a few tests that expect at most one interrupt being triggered when
configuring a GPIO output in two scenarios:
1. From just after booting
2. After another configuration of the same values
Due 1., this patch adds the tests to run before any other tests in the
gpio_basic_api test suite.
Signed-off-by: Ederson de Souza <ederson.desouza@intel.com>
This test cannot be run in this architecture as it does not
support userspace.
Today it is filtered by kconfig, which works but spends
time running cmake.
As native_posix is a default test platform it is better
to filter it alltogether by arch, which saves quite a lot
of time.
Signed-off-by: Alberto Escolar Piedras <alberto.escolar.piedras@nordicsemi.no>
Disable power management for this particular test case as it expects a
particular pattern of pm get/puts that isn't matched by the driver and
usage in SoF.
Signed-off-by: Tom Burdick <thomas.burdick@intel.com>
Remove erroneous comments that don't describe what the test is actually
doing. These comments were probably from copy/pasting test code.
Signed-off-by: Aaron Massey <aaronmassey@google.com>
Add a simple test to validate that the CAN statistics accessor functions
can be called from user mode threads.
Signed-off-by: Henrik Brix Andersen <hebad@vestas.com>
Add the following XPRO boards to flash driver test:
SAMD20, SAMDE54 and SAMR21
Signed-off-by: Daniel Evans <photonthunder@gmail.com>
Co-authored-by: Gerson Fernando Budke nandojve@gmail.com
Added overlay inside the spi loopback test for the
mimxrt1170_evk_cm7, enabled DMA and Async by default.
Added testcase for async and dma.
Signed-off-by: Emilio Benavente <emilio.benavente@nxp.com>
Use the same pins as when testing with SIUL2 EIRQ interrupt
controller, but instead test routing the external interrupts
to WKPU controller.
Signed-off-by: Manuel Argüelles <manuel.arguelles@nxp.com>
When configuring in/out pins for callback tests, pass the GPIO flags
coming from the in/out-gpios respective nodes.
Signed-off-by: Manuel Argüelles <manuel.arguelles@nxp.com>
in case CONFIG_VL53L1X_INTERRUPT_MODE=n or
CONFIG_VL53L1X_XSHUT=n, the driver won't compile
Signed-off-by: Cyril Fougeray <cyril.fougeray@worldcoin.org>
rand32.h does not make much sense, since the random subsystem
provides more APIs than just getting a random 32 bits value.
Rename it to random.h and get consistently with other
subsystems.
Signed-off-by: Flavio Ceolin <flavio.ceolin@intel.com>
The desired current/voltage properties make use of milliamps/volts while
the present current/voltage properties make use of microamps/volts.
Fix the desired current/voltage properties to be consistent with the
present current/voltage properties where they're most likely to be used
with.
Signed-off-by: Aaron Massey <aaronmassey@google.com>
