Support sampling more than 2 channels using the ADC API test. This
requires updates to the repeated samplings test, which samples using 2
channels even when more channels are defined by the ADC test overlay.
Signed-off-by: Daniel DeGrasse <daniel.degrasse@nxp.com>
To allow the ADC API unit test to skip tests for non-implemented
features, return -ENOTSUP.
Signed-off-by: Eric Holmberg <eric.holmberg@northriversystems.co.nz>
If the driver does not implement an optional feature, then skip the test
if -ENOTSUP is returned.
Signed-off-by: Eric Holmberg <eric.holmberg@northriversystems.co.nz>
This updates the configurations for these two boars to match the expected
best practices for new boards, as discussed in #61140.
Signed-off-by: Diego Elio Pettenò <flameeyes@meta.com>
Add `yd_esp32` board:
- Model name: YD-ESP32
- Manufacturer: VCC-GND® Studio
- Espressif module: ESP32-WROOM-32E
Signed-off-by: Julio Cesar <hi@jcsx.dev>
This board is a relatively inexpensive development kit for USB-PD
controllers, using an UPD301C controller.
This Zephyr config includes support for:
* UART (present on he debug header of the board), tested with the
hello_world sample application;
* the one standalone LED (CAP_MIS), tested with the blinky sample
application;
* the rotary encoder (PDO_SEL), via ADC, tested with the adc sample
application;
* the current sense amplifier (I_SENSE), currently untested;
* the SPI bus, connected internally in the UPD301C to the UPD350;
* the I2C bus, exposed on the debug header, currently untested.
Note that the drivers.uart.async_api.rtt has to be disabled, as it is
for other m0 boards with no dma or it fails to build.
Signed-off-by: Diego Elio Pettenò <flameeyes@meta.com>
Adds support for the NXP VMU RT1170 board. This Vehicle
Management Unit based on the i.MX RT1176 brings a fantastic
combination of sensors and IO all on one board for development
of various systems. It is also the featured board for
CogniPilot's Cerebri - VMU autopilot software based on Zephyr.
Co-authored-by: Peter van der Perk <peter.vanderperk@nxp.com>
Signed-off-by: Benjamin Perseghetti <bperseghetti@rudislabs.com>
Enable adc0 with 2 channels 22, 23 on standard group with
normal end of conversion callback. Channels correspond to
VREFL(0V), VREFH(3.3V).
Signed-off-by: Cong Nguyen Huu <cong.nguyenhuu@nxp.com>
Remove virtual esp32 board and replace it with the
real word boards:
- esp32_devkitc_wroom
- esp32_devkitc_wrover (with PSRAM option)
Signed-off-by: Marek Matej <marek.matej@espressif.com>
Increase hardware sampling interval to 30ms for MCUX ADC16. The ADC
callback in the repeated_samplings test takes roughly 27ms to execute,
so a sampling frequency of this interval still allows the ADC test to
verify the ADC is being sampled at a given interval, while avoiding the
pitfalls that result from a kernel timer shorter than the duration the
ADC callback takes to run.
Fixes#58467
Signed-off-by: Daniel DeGrasse <daniel.degrasse@nxp.com>
- The boards\arm\cy8cproto_063_ble board now has ADC enabled
- This includes overlay files for the test app and sample app
Signed-off-by: Bill Waters <bill.waters@infineon.com>
Effort has been made to abstract the features that are common
to both the Pico and Pico W into a shared file when possible.
This commit does not include the addition of bluetooth or wifi
drivers for the W's Infineon module.
Signed-off-by: Dave Rensberger <davidr@beechwoods.com>
Enable ADC support for RT1040 EVK. Tested using samples/drivers/adc,
using channels 3 and 4 of ADC0.
Signed-off-by: Daniel DeGrasse <daniel.degrasse@nxp.com>
add platform_allow nucleo_h743zi.
the twister test is now enable for tests/drivers/adc/adc_dma on board
nucleo_h743zi.
used on driver st_stm32_adc with CONFIG_ADC_STM32_DMA =y.
Signed-off-by: Marc Desvaux <marc.desvaux-ext@st.com>
Twister now supports using YAML lists for all fields that were written
as space-separated lists. Used twister_to_list.py script. Some artifacts
on string length are due to how ruamel dumps content.
Signed-off-by: Gerard Marull-Paretas <gerard.marull@nordicsemi.no>
- This includes the driver, test app, and sample app
- Only the boards\arm\cy8cproto_062_4343w board is supported for now
Signed-off-by: Bill Waters <bill.waters@infineon.com>
This file adds the board overlay file for the `efr32xg24_dk2601b` board
to enable the `drivers.adc` test on this board.
Signed-off-by: Filip Kokosinski <fkokosinski@antmicro.com>
This commit adds support for the `drivers.adc` test by adding an overlay
for the `efr32bg22_brd4184a` board.
Signed-off-by: Filip Kokosinski <fkokosinski@antmicro.com>
Remove redefinition of adc0 node in native_posix overlay
since it's now present in the board dts.
Signed-off-by: Benjamin Björnsson <benjamin.bjornsson@gmail.com>
Remove includes of adc dt-bindings header since these are
now already included in the root .dtsi file that adds an
adc node.
Signed-off-by: Benjamin Björnsson <benjamin.bjornsson@gmail.com>
The below is the unit test result for the driver and kernel of
it82xx2_evb board.
GPIO/gpio_basic_api: PASS
I2C/i2c_api: PASS
Flash: PASS
UART/uart_basic_api: PASS
PWM/pwm_api: PASS
WDT/wdt_basic_api: PASS
KSCAN/kscan_api: PASS
kernel/sched/schedule_api: PASS
kernel/sched/preempt: PASS
kernel/timer/timer_api: PASS
kernel/sleep: PASS
ADC/adc_api: PASS.
ADC note: conversion time~=61.6us
sample time delay~=60us
wait voltage stable time~=202.8us
Set sampling time to 500us will pass for ADC test.
Signed-off-by: Tim Lin <tim2.lin@ite.corp-partner.google.com>
Remove shield, using this shild will require an overlay for
the particular board being used.
Signed-off-by: Benjamin Björnsson <benjamin.bjornsson@gmail.com>
Move channel description to devicetree for atmel,sam-afec
compatible to make the test more readable.
Signed-off-by: Benjamin Björnsson <benjamin.bjornsson@gmail.com>
Move channel description to devicetree for atmel,sam0-adc
compatible to make the test more readable.
Signed-off-by: Benjamin Björnsson <benjamin.bjornsson@gmail.com>
Move channel description to devicetree for atmel,sam-adc
compatible to make the test more readable.
Signed-off-by: Benjamin Björnsson <benjamin.bjornsson@gmail.com>
Move channel description to devicetree for gd,gd32-adc
compatible to make the test more readable.
Signed-off-by: Benjamin Björnsson <benjamin.bjornsson@gmail.com>
Move channel description to devicetree for telink,b91-adc
compatible to make the test more readable.
Signed-off-by: Benjamin Björnsson <benjamin.bjornsson@gmail.com>
Move channel description to devicetree for nxp,kinetis-adc16
compatible to make the test more readable.
Signed-off-by: Benjamin Björnsson <benjamin.bjornsson@gmail.com>
Move channel description to devicetree for nordic,nrf-saadc
compatible to make the test more readable.
Signed-off-by: Benjamin Björnsson <benjamin.bjornsson@gmail.com>
Move channel description to devicetree for nordic,nrf-adc
compatible to make the test more readable.
Signed-off-by: Benjamin Björnsson <benjamin.bjornsson@gmail.com>
Move channel description to devicetree for st,stm32-adc
compatible to make the test more readable.
Signed-off-by: Benjamin Björnsson <benjamin.bjornsson@gmail.com>
