Hake Huang
437a5b6028
tests: flash: Enable flash driver and file system tests on mimxrt1060_evk
...
now the XIP feature can work in NXP RT series boards
so enable below cases on mimxrt1060_evk with XIP
tests/kernel/xip
tests/drivers/flash
tests/subsys/fs/littlefs
samples/shell/fs
samples/subsys/fs/littlefs
for tests/subsys/fs/littlefs:
need add --erase to erase the nor flash if you are using below partition
e.g. west flash --runner=pyocd --erase
&is25wp064 {
partitions {
compatible = "fixed-partitions";
#address-cells = <1>;
#size-cells = <1>;
partition@310000 {
label = "large";
reg = <0x00310000 DT_SIZE_M(3)>;
};
partition@610000 {
label = "image-scratch";
reg = <0x00610000 DT_SIZE_K(128)>;
};
partition@630000 {
label = "small";
reg = <0x00630000 DT_SIZE_K(64)>;
};
partition@640000 {
label = "medium";
reg = <0x00640000 DT_SIZE_K(960)>;
};
};
};
Signed-off-by: Hake Huang <hake.huang@oss.nxp.com>
2021-05-18 11:19:15 -05:00
Anas Nashif
994374ec51
samples: shell: fs: require keyboard harness
...
The test for this sample requires special setup and keyboard
interactivity.
Fixes #28153
Signed-off-by: Anas Nashif <anas.nashif@intel.com>
2020-09-10 15:55:02 -05:00
Anas Nashif
dca317c730
sanitycheck: inclusive language
...
change whitelist -> allow.
Signed-off-by: Anas Nashif <anas.nashif@intel.com>
2020-08-27 07:04:07 -04:00
Anas Nashif
70758c4374
tests: fix test identifiers
...
The seasonal overhaul of test identifiers aligning the terms being used
and creating a structure. This is hopefully the last time we do this,
plan is to document the identifiers and enforce syntax.
The end-goal is to be able to generate a testsuite description from the
existing tests and sync it frequently with the testsuite in Testrail.
Signed-off-by: Anas Nashif <anas.nashif@intel.com>
2019-12-09 15:53:44 -05:00
Jan Van Winkel
265b195369
samples: fs: Added FS shell sample
...
Added file system shell sample
Signed-off-by: Jan Van Winkel <jan.van_winkel@dxplore.eu>
2019-06-11 08:31:54 -04:00
