Make sure not to accidentally enable WP by uninitialized variable during
FLASH_STM32_EX_OP_SECTOR_WP call.
Signed-off-by: Dawid Niedzwiecki <dawidn@google.com>
Use uint64_t instead of uint32_t for the FLASH_STM32_EX_OP_SECTOR_WP
extended operation.
Some chips have two banks, more than 16 sectors each e.g. stm32h7a3xx
chips, so more than 32 bits are required.
Signed-off-by: Dawid Niedzwiecki <dawidn@google.com>
Convert qspi and hyperflash to variants instead of revisions by popular
demand.
And convert evkb into a revision instead of a different board.
Signed-off-by: Declan Snyder <declan.snyder@nxp.com>
Now expected vs read size will be logged in case of error
to make it easier to understand problem or correct test
settings.
Signed-off-by: Dominik Ermel <dominik.ermel@nordicsemi.no>
This is a follow-up to 21475774fc,
extending the number of tests and samples that use the new L05 and L10.
Signed-off-by: Carles Cufi <carles.cufi@nordicsemi.no>
flash_copy() is performed on a page.size span but following flash_read()
verification step is performed on EXPECTED_SIZE length (512).
This doesn't work on devices where page.size is lower than EXPECTED_SIZE,
such as STM32L1 where page size is 256.
To fix this, perform verification on the smalest value between page.size
and EXPECTED_SIZE.
Signed-off-by: Erwan Gouriou <erwan.gouriou@st.com>
These two new ICs are variants of the nRF54L15 with different memory
sizes:
- nRF54L05: 500KB RRAM, 96KB RAM
- nRF54L10: 1022KB RRAM, 192KB RAM
- nRF54L15: 1524KB RRAM, 256KB RAM
Signed-off-by: Carles Cufi <carles.cufi@nordicsemi.no>
Enable flash driver test for MAX32690 boards.
Signed-off-by: Mert Vatansever <mert.vatansever@analog.com>
Signed-off-by: Sadik Ozer <sadik.ozer@analog.com>
Use EXTRA_CONF_FILE in sample yaml files,
that replaced deprecated OVERLAY_CONFIG
since the Zephyr v3.4 release.
Signed-off-by: Andrej Butok <andrey.butok@nxp.com>
test_flash_erase() requires that the expected[] array contains
pseudo-random data. However, the expected[] array would only
be initialized once before all tests are run using the setup
callback.
Instead, use the before() callback to randomize data before
each test in the suite, since there is otherwise no guarantee
that test_flash_erase() will be run directly after the
expected[] array has been randomized.
Signed-off-by: Chris Friedt <cfriedt@tenstorrent.com>
Align all existing samples/tests/applications which
contains nrf54l15pdk/nrf54l15/* by adding
nrf54l15dk/nrf54l15/* to enable twister builds.
Signed-off-by: Katarzyna Giądła <katarzyna.giadla@nordicsemi.no>
Signed-off-by: Grzegorz Chwierut <grzegorz.chwierut@nordicsemi.no>
Fix flexspi xip configuration issue regarding code relocation
due to the order of kconfig defaults being sourced
The flexspi setup was not being relocated to an on chip location
Also remove rt1060 conf file in flash common test which changes the
code relocation location to RAM, just keep as ITCM for all M7 which
as of now all have ITCM from NXP with flexspi.
Signed-off-by: Declan Snyder <declan.snyder@nxp.com>
Move negative tests for flash driver to a separate test suite.
Run negative tests only on platforms that are aligned.
Signed-off-by: Sebastian Głąb <sebastian.glab@nordicsemi.no>
Currently this code related to how to configure the
flash size and address when using flexspi to XIP is copy
pasted in all sort of places and ways all over the tree,
let's clean this up and have single point of control over
this configuration.
Signed-off-by: Declan Snyder <declan.snyder@nxp.com>
Add functional test for flash_erase().
Add negative tests for flash_read(), flas_write(), flash_erase(),
flash_fill() and flash_flatten().
Add functional test for flash page layout.
Signed-off-by: Sebastian Głąb <sebastian.glab@nordicsemi.no>
Move samples config files from 'boards' to 'socs' in order to
remove multiple files with the same configuration and render
available samples for new boards. Only changed sample files
which are not board or hardware specific.
Signed-off-by: Raffael Rostagno <raffael.rostagno@espressif.com>
Fix failed test for platforms with flash program size > 128 bytes.
Update supported program size to 512 bytes, the highest supported
program size by Zephyr platforms.
Signed-off-by: Andrej Butok <andrey.butok@nxp.com>
`checkpatch.pl` requires that dts sources are indented with tabs,
fix all the spaces that slipped in while checkpatch wasn't watching.
Signed-off-by: Jordan Yates <jordan@embeint.com>
The commit adds two new API calls:
- flash_fill - that allows to fill selected part of device with
specified value;
- flash_flatten - that allows to erase or fill device with
erase_value, depending on whether driver for the device provides
erase callback.
Signed-off-by: Dominik Ermel <dominik.ermel@nordicsemi.no>
Test now check whether device has requirement for explicit erase
before call or not, before performing various actions.
Signed-off-by: Dominik Ermel <dominik.ermel@nordicsemi.no>
Add a test of FLASH_STM32_EX_OP_BLOCK_OPTION_REG and
FLASH_STM32_EX_OP_BLOCK_CONTROL_REG extended operations for stm32f4.
It verifies that the Option Byte and Control registers are blocked
correctly. The registers can be unlock after reboot, so it is needed
to separate this test from other tests.
Signed-off-by: Dawid Niedzwiecki <dawidn@google.com>
The commit sets CONFIG_SOC_NRF_FLASH=n for SPI/QSPI Flash tests
as building internal Flash driver is not needed in these
scenarios.
Signed-off-by: Dominik Ermel <dominik.ermel@nordicsemi.no>
