Previous fix https://github.com/zephyrproject-rtos/zephyr/pull/58891
introduced failure in driver tests suite. This patch corrects the error
and reverts max_mapped_page field definition.
Adds max_mapped_pages stats reset after unmaping of unused memory.
Signed-off-by: Jaroslaw Stelter <Jaroslaw.Stelter@intel.com>
Add an input build_all test with a bunch of input driver, move the
ft5336 one out of sensors as well.
Signed-off-by: Fabio Baltieri <fabiobaltieri@google.com>
The word cpu was added to the names of functions, structs, types
and definitions to disambiguate the names and make room in the namespace
for soc clock control functions.
Signed-off-by: Adrian Warecki <adrian.warecki@intel.com>
The initial implementation was broken during improvements.
There was incorrect assumption that all pages are unmapped at
initials state. In reality at the beginning whole memory is
powered on, so we should mark all pages as mapped. Later in
initialization code unused pages are unmapped and if after this
some banks become empty (all pages unmapped), the power is
switched off.
Signed-off-by: Jaroslaw Stelter <Jaroslaw.Stelter@intel.com>
Add TCN75A temperature sensor to sensor build all test, along with
configuration setting to enable driver to use a separate thread for
triggering
Signed-off-by: Daniel DeGrasse <daniel@degrasse.com>
This PR adds a custom driver for the ADS1112 ADCs. Unlike ADS1113/4/5
family served by the ADS1x1x driver, the ADS1112 does not use an address
pointer to address config registers. Instead, there is only one writable
register and all i2c writes will set it. The registers resemble the
ADS1119 device, but config bitmap is different, include a distinct data
rate table, gain table, and input multiplexing table. There is also not a
status register to be monitored with the ADS1112, as it uses config bit 7
for the same purpose instead of a separate register.
The driver was tested on hardware using the ADC shell interface. Manual
probing validated the voltages for the MUX_SINGLE configs at datarate 15
in CM_SINGLE. Higher gains were not tested and CM_CONTINUOUS is not
supported in this initial implementation.
The new driver has also been added to the existing ADC test using adc_emul
for completeness.
Origin: original
License: Apache 2.0
Purpose: Adding support for ADS1112 ADCs
Signed-off-by: Jordan Montgomery <jordan.montgomery@getcruise.com>
- Add integration_platforms to avoid excessive filtering
- Make sure integration platforms are actually part of the filter
- Fix some tags and test meta data
Signed-off-by: Anas Nashif <anas.nashif@intel.com>
Change the pinout for ADC/DAC loopback testing on the stm32 boards
nucleo_l073rz: adc_in0_pa0/dac_out1_pa4 --> A0 to A2 on arduino CN8
nucleo_g071rb: adc1_in0_pa0/dac1_out1_pa4 --> A0 to A2 on arduino CN8
stm32l562e_dk: adc1_in13_pc4/dac1_out1_pa4 --> A2 to A4 on arduino CN19
Adjust the ACQuisition time to the MAX value because the default (=0)
is too low for several boards.
Signed-off-by: Francois Ramu <francois.ramu@st.com>
Add the '.buffered' field to the dac_channel_cfg structure
when testing the DAC.
This boolean parameter is initialised to 'true' to PASS the test.
It follows the https://github.com/zephyrproject-rtos/zephyr/pull/57730
Also changed for the samples/drivers/dac
Signed-off-by: Francois Ramu <francois.ramu@st.com>
Change the test_set_timing_data_while_started test to actually attempt to
set the data phase timing parameters instead of attempting to set the
nominal/arbitration timing parameters.
Update test descriptions to explicitly mention data phase timing.
Fixes: #59046
Signed-off-by: Henrik Brix Andersen <hebad@vestas.com>
Increase hardware sampling interval to 30ms for MCUX ADC16. The ADC
callback in the repeated_samplings test takes roughly 27ms to execute,
so a sampling frequency of this interval still allows the ADC test to
verify the ADC is being sampled at a given interval, while avoiding the
pitfalls that result from a kernel timer shorter than the duration the
ADC callback takes to run.
Fixes#58467
Signed-off-by: Daniel DeGrasse <daniel.degrasse@nxp.com>
Each SoC may have different limitation regarding DMA buffer size.
This commit places the test transfer size in Kconfig so it can
be modified accordingly.
Signed-off-by: Lucas Tamborrino <lucas.tamborrino@espressif.com>
Modify the test to not rely on assumption that RX buffer is released
when it is fully released. RX buffer maybe released after any RX_RDY
event within the buffer, e.g. after each timeout driver may be
switching to the new buffer.
Signed-off-by: Krzysztof Chruściński <krzysztof.chruscinski@nordicsemi.no>
The nucleo c031c6 was filtered due to small ram size. However, the
application did fit when builed and run with west. We add a low footprint
variant of the test to also test on platforms with smaller size but where
the application fits.
Signed-off-by: Benjamin Björnsson <benjamin.bjornsson@gmail.com>
The scatter gather test now does a transfer list of 4 and the LLI pool
config needs to be updated to match the new test requirement.
Signed-off-by: Tom Burdick <thomas.burdick@intel.com>
