Add an Arduino 101-specific configuration that enables flash-based
storage support as well as the file system shell.
Change-Id: Ic10ea958dd2446df4942a8dfd3cce1e3368852b2
Signed-off-by: Johan Hedberg <johan.hedberg@intel.com>
This makes all Bluetooth samples and tests being build with unified
kernel. main() is now executed from init thread and specifying task
for it in mdef file is no longer needed. By default main stack is
1024 bytes and this should be enough for BT samples.
Change-Id: I6674eea2c028b78ada5190acef72937186738af2
Signed-off-by: Szymon Janc <ext.szymon.janc@tieto.com>
Some of tests/bluetooth test are failing link step only when debug
is enabled, these filters prevent those tests from being executed
under such configuration.
Jira: ZEP-1063
Change-Id: I87fa73710d78346b1b2ce587e9055b0732d9cb49
Signed-off-by: Genaro Saucedo Tejada <genaro.saucedo.tejada@intel.com>
BR/EDR support in chip is mandatory if BR/EDR is enabled so add
separate config for it. This is to avoid problems when using
single mode LE controller.
Change-Id: I9d9692b89883dd1980803d66818fb6e3a368afb0
Signed-off-by: Szymon Janc <ext.szymon.janc@tieto.com>
The old 'config_whitelist' directive in testcase.ini has been removed.
We use the new expr_parser module to parse a 'filter' directive which
is a boolean expression. This gives a great deal more flexibility
in how tests can be filtered.
To keep the tree bisectable, use of config_whitelist in testcase.ini
converted to the new expression language.
Change-Id: I0617319818c5559c0f0569d2fa73d09b681cac51
Signed-off-by: Andrew Boie <andrew.p.boie@intel.com>
For STM32F103RB targets, the SRAM is overflown by 2-3kB in microkernel
test. Platforms with this SoC can still be built for in the nanokernel test.
Change-Id: I012b93cf8dfec74292f7ab228f4b2fca1a4f3444
Signed-off-by: Maciej Borzecki <maciek.borzecki@gmail.com>
bluetooth/shell and bluetooth/tester need to be disabled on
galileo and minnowboard respectively. On these platforms,
the IRQ for the UART console and the H4 are the same IRQ line.
IRQ_CONNECT() is being called on the same IRQ line twice, and
it's only through linker luck that these tests work at all
since one driver will "win" when the mapping is set up at build
time by gen_idt.
gen_idt was supposed to break the build in this situation but
was bugged. The next patch in the series fixes gen_idt.
Change-Id: Ib4a42b57181731121dfad50606c8362a9fd0277d
Signed-off-by: Andrew Boie <andrew.p.boie@intel.com>
To exclude platform platform_exclude=foo should be used and not
platform_whitelist=!foo.
Change-Id: I4cddcd3b73e0bd8c42a0726776f8237ebd79a6ae
Signed-off-by: Szymon Janc <ext.szymon.janc@tieto.com>
Combine both nano and micro tests and cleanup whitelisting
for the testcases to include all buildable boards.
Change-Id: I28d41b82fb60d75d4b172d9dd3ac7e71480053b8
Signed-off-by: Anas Nashif <anas.nashif@intel.com>
The init, init_h5 and shell are not really samples but fit better in
the test category.
Change-Id: Id1a7ff31ad8767f858705bd952311cf64ff1f3f2
Signed-off-by: Johan Hedberg <johan.hedberg@intel.com>
