The test case no longer permits inferring input and output pins based
only on the presence of GPIO aliases. Stop allowing presence of GPIO
aliases to enable the test.
Signed-off-by: Peter Bigot <peter.bigot@nordicsemi.no>
Test that the new port API functions all behave as expected, including
physical vs logical level for input and output as well as masked and
set-based output operations. Also tests the new pin API functions.
For running on real hardware this test now uses a local test-specific
devicetree binding. For build-only tests any platform with a GPIO
alias should be tested.
The new code increases flash requirements so add a filter to exclude
platforms that won't link.
Signed-off-by: Peter Bigot <peter.bigot@nordicsemi.no>
The seasonal overhaul of test identifiers aligning the terms being used
and creating a structure. This is hopefully the last time we do this,
plan is to document the identifiers and enforce syntax.
The end-goal is to be able to generate a testsuite description from the
existing tests and sync it frequently with the testsuite in Testrail.
Signed-off-by: Anas Nashif <anas.nashif@intel.com>
convert sample and test yaml filters that utilize a DT_ define to
instead use a dt_ function. The intent is to remove the Kconfig
generated DT defines and just make directy queries into the device tree.
Signed-off-by: Kumar Gala <kumar.gala@linaro.org>
We have many testcases doing filtering both on the architecture level
and the platform level, which is redundant. Also many testcases are
running the same test twice on the same SoC for no good reason, cleanup
the tests and cleanup the filtering.
Signed-off-by: Anas Nashif <anas.nashif@intel.com>
This will prepare test cases and samples with metadata and information
that will be consumed by the sanitycheck script which will be changed to
parse YAML files instead of ini.
Signed-off-by: Anas Nashif <anas.nashif@intel.com>
