QSPI NOR driver non-Quad mode was not tested before.
Add configuration that uses driver in the non-Quad mode.
Signed-off-by: Bartosz Miller <bartosz.miller@nordicsemi.no>
Add some overlay files for the silabs xg29_rb4412a board to enable tests
on the board. Also add the platform to some testcase.yaml files.
Signed-off-by: Martin Hoff <martin.hoff@silabs.com>
Add low-power-write property to MSC device tree node, set
MSC_WRITECTRL_LPWRITE if enabled.
Signed-off-by: Aksel Skauge Mellbye <aksel.mellbye@silabs.com>
Extend several flash samples and tests so that they can also be used
with "jedec,mspi-nor" devices.
Add configurations needed for the nrf54h20dk/nrf54h20/cpuapp target.
Signed-off-by: Andrzej Głąbek <andrzej.glabek@nordicsemi.no>
delete already defined storage_partition node in board DTS, in order to
be able to build test with included overlay
Signed-off-by: Abderrahmane JARMOUNI <git@jarmouni.me>
Create common source code to use for supporting HyperFlash.
Rename 'FLASH_NXP_S32_QSPI_NOR_SFDP_RUNTIME' to
'FLASH_NXP_S32_QSPI_SFDP_RUNTIME' as a common kconfig.
Add the 'max-program-buffer-size' property to use for
setting memory pageSize, instead of using
'CONFIG_FLASH_NXP_S32_QSPI_LAYOUT_PAGE_SIZE' for setting.
Add the 'write-block-size' propertyto use for setting
the number of bytes used in write operations, it also
uses to instead of the 'memory-alignment' property.
Signed-off-by: Cong Nguyen Huu <cong.nguyenhuu@nxp.com>
Make sure not to accidentally enable WP by uninitialized variable during
FLASH_STM32_EX_OP_SECTOR_WP call.
Signed-off-by: Dawid Niedzwiecki <dawidn@google.com>
Use uint64_t instead of uint32_t for the FLASH_STM32_EX_OP_SECTOR_WP
extended operation.
Some chips have two banks, more than 16 sectors each e.g. stm32h7a3xx
chips, so more than 32 bits are required.
Signed-off-by: Dawid Niedzwiecki <dawidn@google.com>
Convert qspi and hyperflash to variants instead of revisions by popular
demand.
And convert evkb into a revision instead of a different board.
Signed-off-by: Declan Snyder <declan.snyder@nxp.com>
Now expected vs read size will be logged in case of error
to make it easier to understand problem or correct test
settings.
Signed-off-by: Dominik Ermel <dominik.ermel@nordicsemi.no>
This is a follow-up to 21475774fc,
extending the number of tests and samples that use the new L05 and L10.
Signed-off-by: Carles Cufi <carles.cufi@nordicsemi.no>
flash_copy() is performed on a page.size span but following flash_read()
verification step is performed on EXPECTED_SIZE length (512).
This doesn't work on devices where page.size is lower than EXPECTED_SIZE,
such as STM32L1 where page size is 256.
To fix this, perform verification on the smalest value between page.size
and EXPECTED_SIZE.
Signed-off-by: Erwan Gouriou <erwan.gouriou@st.com>
These two new ICs are variants of the nRF54L15 with different memory
sizes:
- nRF54L05: 500KB RRAM, 96KB RAM
- nRF54L10: 1022KB RRAM, 192KB RAM
- nRF54L15: 1524KB RRAM, 256KB RAM
Signed-off-by: Carles Cufi <carles.cufi@nordicsemi.no>
Enable flash driver test for MAX32690 boards.
Signed-off-by: Mert Vatansever <mert.vatansever@analog.com>
Signed-off-by: Sadik Ozer <sadik.ozer@analog.com>
Use EXTRA_CONF_FILE in sample yaml files,
that replaced deprecated OVERLAY_CONFIG
since the Zephyr v3.4 release.
Signed-off-by: Andrej Butok <andrey.butok@nxp.com>
test_flash_erase() requires that the expected[] array contains
pseudo-random data. However, the expected[] array would only
be initialized once before all tests are run using the setup
callback.
Instead, use the before() callback to randomize data before
each test in the suite, since there is otherwise no guarantee
that test_flash_erase() will be run directly after the
expected[] array has been randomized.
Signed-off-by: Chris Friedt <cfriedt@tenstorrent.com>
Align all existing samples/tests/applications which
contains nrf54l15pdk/nrf54l15/* by adding
nrf54l15dk/nrf54l15/* to enable twister builds.
Signed-off-by: Katarzyna Giądła <katarzyna.giadla@nordicsemi.no>
Signed-off-by: Grzegorz Chwierut <grzegorz.chwierut@nordicsemi.no>
Fix flexspi xip configuration issue regarding code relocation
due to the order of kconfig defaults being sourced
The flexspi setup was not being relocated to an on chip location
Also remove rt1060 conf file in flash common test which changes the
code relocation location to RAM, just keep as ITCM for all M7 which
as of now all have ITCM from NXP with flexspi.
Signed-off-by: Declan Snyder <declan.snyder@nxp.com>
Move negative tests for flash driver to a separate test suite.
Run negative tests only on platforms that are aligned.
Signed-off-by: Sebastian Głąb <sebastian.glab@nordicsemi.no>