STM32N6 needs to have a buffer of 32-bit data instead of 16-bit.
Adds a Kconfig to select whether the test shall use a 32-bit buffer.
Signed-off-by: Guillaume Gautier <guillaume.gautier-ext@st.com>
This commit changes the adc_api test to use the proper printf
format specifier when printing the ADC samplings. This ensures
that all values are printed on 16-bit. Without this specifier,
negative values are sign-extended and printed on full integer
size (e.g., 0x8000 -> "0xFFFF8000").
Signed-off-by: Mathieu Choplain <mathieu.choplain@st.com>
Move ADC DMA tests directly into adc_api test for Kinetis and STM32 boards.
Needs to disable CONFIG_TEST_USERSPACE for this subtest because of caching
issue for STM32H7 (as it was done dor adc_dma test).
Signed-off-by: Guillaume Gautier <guillaume.gautier-ext@st.com>
Support sampling more than 2 channels using the ADC API test. This
requires updates to the repeated samplings test, which samples using 2
channels even when more channels are defined by the ADC test overlay.
Signed-off-by: Daniel DeGrasse <daniel.degrasse@nxp.com>
If the driver does not implement an optional feature, then skip the test
if -ENOTSUP is returned.
Signed-off-by: Eric Holmberg <eric.holmberg@northriversystems.co.nz>
Remove shield, using this shild will require an overlay for
the particular board being used.
Signed-off-by: Benjamin Björnsson <benjamin.bjornsson@gmail.com>
Move channel description to devicetree for atmel,sam-afec
compatible to make the test more readable.
Signed-off-by: Benjamin Björnsson <benjamin.bjornsson@gmail.com>
Move channel description to devicetree for atmel,sam0-adc
compatible to make the test more readable.
Signed-off-by: Benjamin Björnsson <benjamin.bjornsson@gmail.com>
Move channel description to devicetree for atmel,sam-adc
compatible to make the test more readable.
Signed-off-by: Benjamin Björnsson <benjamin.bjornsson@gmail.com>
Move channel description to devicetree for gd,gd32-adc
compatible to make the test more readable.
Signed-off-by: Benjamin Björnsson <benjamin.bjornsson@gmail.com>
Move channel description to devicetree for telink,b91-adc
compatible to make the test more readable.
Signed-off-by: Benjamin Björnsson <benjamin.bjornsson@gmail.com>
Move channel description to devicetree for nxp,kinetis-adc16
compatible to make the test more readable.
Signed-off-by: Benjamin Björnsson <benjamin.bjornsson@gmail.com>
Move channel description to devicetree for nordic,nrf-saadc
compatible to make the test more readable.
Signed-off-by: Benjamin Björnsson <benjamin.bjornsson@gmail.com>
Move channel description to devicetree for nordic,nrf-adc
compatible to make the test more readable.
Signed-off-by: Benjamin Björnsson <benjamin.bjornsson@gmail.com>
Move channel description to devicetree for st,stm32-adc
compatible to make the test more readable.
Signed-off-by: Benjamin Björnsson <benjamin.bjornsson@gmail.com>
Move channel description to devicetree for nxp,kinetis-adc12
compatible to make the test more readable.
Signed-off-by: Benjamin Björnsson <benjamin.bjornsson@gmail.com>
Move channel description to devicetree for microchip,xec-adc
compatible to make the test more readable.
Signed-off-by: Benjamin Björnsson <benjamin.bjornsson@gmail.com>
Move channel description to devicetree for nxp,lpc-lpadc
compatible to make the test more readable.
Signed-off-by: Benjamin Björnsson <benjamin.bjornsson@gmail.com>
Move channel description to devicetree for nuvoton,npcx-adc
compatible to make the test more readable.
Signed-off-by: Benjamin Björnsson <benjamin.bjornsson@gmail.com>
Move channel description to devicetree for ti,cc32xx-adc
compatible to make the test more readable.
Signed-off-by: Benjamin Björnsson <benjamin.bjornsson@gmail.com>
Move channel description to devicetree for ti,cc13xx-cc26xx-adc
compatible to make the test more readable.
Signed-off-by: Benjamin Björnsson <benjamin.bjornsson@gmail.com>
Move channel description to devicetree for ite,it8xxx2-adc
compatible to make the test more readable.
Signed-off-by: Benjamin Björnsson <benjamin.bjornsson@gmail.com>
Move channel description to devicetree for nxp_mcux,12b1msps-sar
compatible to make the test more readable.
Signed-off-by: Benjamin Björnsson <benjamin.bjornsson@gmail.com>
Move channel description to devicetree for raspberrypi,pico-adc
compatible to make the test more readable.
Signed-off-by: Benjamin Björnsson <benjamin.bjornsson@gmail.com>
Move channel description to devicetree for espressif,esp32-adc
compatible to make the test more readable.
Signed-off-by: Benjamin Björnsson <benjamin.bjornsson@gmail.com>
Move channel description to devicetree for infineon,xmc4xxx-adc
compatible to make the test more readable.
Signed-off-by: Benjamin Björnsson <benjamin.bjornsson@gmail.com>
Adds the necessary definitions for the nucleo_h563zi to be able to run
the adc_api test on the ADC1 channel 15 (on pa3).
Signed-off-by: Thomas Stranger <thomas.stranger@outlook.com>
Conifgures the new h573i disco kit board for testing the adc_api driver
on the ADC1 channel0 (on pa0).
Signed-off-by: Francois Ramu <francois.ramu@st.com>
Microchip XEC ADC and ADC V2 driver were merged into one
That PR did not change the ADC API test and ADC shell resulting
in twister build failures. Fixed both ADC API test and ADC shell.
Signed-off-by: scott worley <scott.worley@microchip.com>
Update test/drivers/adc/adc_api to support the new channel configuration
method used by the LPADC driver.
Signed-off-by: Daniel DeGrasse <daniel.degrasse@nxp.com>
Adds support for the Adafruit ItsyBitsy nRF52840 Express.
This board ships with the UF2 bootloader, so the device has
been set up so that Zephyr applications are flashed the
same way that other (Adafruit) firmware is flashed with the
UF2 bootloader.
This has been tested locally, and the button, blinky and
led_apa102 samples run without problems.
Signed-off-by: Embla Flatlandsmo <embla.flatlandsmo@gmail.com>
Add ADC API tests for the TI CC1352R1 LaunchXL, CC2652R1 LaunchXL and
TI CC1352R SensorTag boards.
Signed-off-by: Stancu Florin <niflostancu@gmail.com>
