Commit Graph

2004 Commits

Author SHA1 Message Date
Andriy Gelman
2b6c970716 tests: spi_loopback: Add configuration for xmc45_relax_kit
Adds configuration for xmc45_relax_kit.

Signed-off-by: Andriy Gelman <andriy.gelman@gmail.com>
2023-03-03 17:20:17 +01:00
Mark Watson
1f178ca935 drivers: sensor: VL53L1X time-of-flight sensor.
The driver utilizes ST Microelectronics library (which
exists in modules\hal\st\sensor\vl53l1x. Platform specific
headers and source files used by the library are included
and adapted for Zephyr.

The driver can be configured in proj.conf to use a
interrupt/polling methods and the use of the XSHUT pin on
the VL53L1X. All uses were tested successfully.

Signed-off-by: Mark Watson <mwatson@prosaris.ca>
2023-03-03 10:01:55 -06:00
Matthias Hauser
d4e9e5f46c drivers: sensor: Added driver for the Würth Elektronik WSEN-TIDS sensor
Added sample for the WSEN-TIDS temperature sensor.

Signed-off-by: Matthias Hauser <Matthias.Hauser@we-online.de>
2023-03-03 11:01:10 +01:00
Aaron Massey
8156830ad5 test: sbs_gauge_new_api replace redundant overlays
The fuel gauge API sbs_gauge test uses conf/overlay pairs for each
board. This was getting unnecessary and redundant.

Combine the overlay/conf files into a single generic overlay/conf pair for
emulated boards and apply them via the testcase.yaml rules.

Signed-off-by: Aaron Massey <aaronmassey@google.com>
2023-03-02 21:14:44 +01:00
TOKITA Hiroshi
875b0c70b0 tests: drivers: regulator: voltage: add an overlay for rpi_pico
Add overlay for RaspberryPi Pico's core-supply regulator test.

Signed-off-by: TOKITA Hiroshi <tokita.hiroshi@fujitsu.com>
2023-03-02 21:14:34 +01:00
TOKITA Hiroshi
8cafcbac61 tests: drivers: regulator: voltage: add min/max voltage config
Add min-microvolt/max-microvolt to set the range for voltages for testing.
It filter out ranges that cannot test correctly in the configuration.

Signed-off-by: TOKITA Hiroshi <tokita.hiroshi@fujitsu.com>
2023-03-02 21:14:34 +01:00
Jay Vasanth
e56721b8f0 dts: gpio: Add Microchip XEC GPIO macros for use in device tree
Microchip XEC devices specify GPIO pin using octal numbering and
organize pins in banks of 32. Chip documentation does not use
bank naming rather naming each pin by its octal number. This has
led to the developer having to calculate the bit position of a pin
in its 32-bit bank when a specifying the pin for GPIO usage. We
created a set of defines for all possible GPIO pins that specify
the DT GPIO bank name used in the chip level DTSI files and the
bit position in that bank.

Signed-off-by: Jay Vasanth <jay.vasanth@microchip.com>
2023-03-02 13:52:03 +01:00
Jamie McCrae
af78cbdc99 samples and tests: Add REQUIRED to Zephyr find_package call
Adds REQUIRED to samples and tests for finding the zephyr package
to align all samples and tests with the same call and parameters.

Signed-off-by: Jamie McCrae <jamie.mccrae@nordicsemi.no>
2023-03-02 09:58:27 +01:00
Hein Wessels
6a5a2534a0 tests: drivers: dma: chen_blen_transfer: add bdma test to nucleo_h743zi
Add unit tests for BDMA driver.

Also requires adding additional kconfig options to allocate
the memory buffers in a specific SRAM section, because
the BDMA only has access to SRAM4.

Signed-off-by: Hein Wessels <heinwessels93@gmail.com>
2023-03-01 15:58:27 +01:00
Hein Wessels
aa3783ff24 tests: drivers: dma: chen_blen_transfer: support testing multiple dmas
Some devices contain multiple dmas

which requires multiple tests

Signed-off-by: Hein Wessels <heinwessels93@gmail.com>
2023-03-01 15:58:27 +01:00
Hein Wessels
775f602ce4 tests: drivers: dma: loop_transfer: add bdma test to nucleo_h743zi
Add DMA unit tests for BDMA driver.

Also requires adding additional kconfig options to allocate
the memory buffers in a specific SRAM section, because
the BDMA only has access to SRAM4.

Signed-off-by: Hein Wessels <heinwessels93@gmail.com>
2023-03-01 15:58:27 +01:00
Hein Wessels
96e7f94e99 tests: drivers: dma: loop_transfer: support testing multiple dmas
Some devices contain multiple dmas

which requires multiple tests

Signed-off-by: Hein Wessels <heinwessels93@gmail.com>
2023-03-01 15:58:27 +01:00
Benedikt Schmidt
865ee855d1 tests: drivers: gpio: add PCAL64XXA
Add tests for the drivers of PCAL6408A and
PCAL6416A.

Signed-off-by: Benedikt Schmidt <benedikt.schmidt@embedded-solutions.at>
2023-02-28 20:09:19 -05:00
Stanley Huang
5cac2aa377 boards: arm: add raytac_mdbt50q_db_40_nrf52840
Adds new raytac_mdbt50q_db_40_nrf52840 board.

Signed-off-by: Stanley Huang <stanley@raytac.com>
2023-02-28 13:56:24 +01:00
Stanley Huang
ca552eaf20 boards: arm: add raytac_mdbt50q_db_33_nrf52833
Adds new raytac_mdbt50q_db_33_nrf52833 board.

Signed-off-by: Stanley Huang <stanley@raytac.com>
2023-02-28 13:56:24 +01:00
Anas Nashif
d45788f869 tests: i2s_api: convert to new ztest API
Move test to new ztest API.

Signed-off-by: Anas Nashif <anas.nashif@intel.com>
2023-02-28 11:43:37 +01:00
Ben Marsh
30e0fa82f8 boards: arm: stm32h735g_disco: Enable ADC support
Enable ADC support for the stm32h735g_disco board in devicetree

Signed-off-by: Ben Marsh <ben.marsh@helvar.com>
2023-02-28 10:26:26 +01:00
Benedikt Schmidt
c70f40274b tests: drivers: gpio: add BD8LB600FS
Add the BD8LB600FS to the build all tests,
as well as add another specific test for just
this chip which also demonstrates the
usage.

Signed-off-by: Benedikt Schmidt <benedikt.schmidt@embedded-solutions.at>
2023-02-27 06:44:23 -05:00
Yuval Peress
ebfd9aaba5 sensor: Implement driver and tests for akm09918c
Add the implementation for the akm09918c magnetometer driver.
Additionally, add the appropriate node to the TDK robokit1 device
tree. In order to prevent regressions, add the sensor to the sensor
build_all tests and specific tests using an emulator.

Signed-off-by: Yuval Peress <peress@google.com>
2023-02-24 17:00:14 -05:00
Yuval Peress
0e003cdbee test: verify accel/gyro data for icm42688
Verify the conversion of register values in both accel and gyro to
sensor_value for the icm42688.

Signed-off-by: Yuval Peress <peress@google.com>
2023-02-24 11:50:10 +01:00
Yuval Peress
e6514d4dc9 icm42688: Add test for data read and temperature regisers
Add tests that verify the behavior of the REG_INT_STATUS, REG_TEMP_DATA1,
and REG_TEMP_DATA0 registers

Signed-off-by: Yuval Peress <peress@google.com>
2023-02-24 11:50:10 +01:00
Yuval Peress
8ac822e69c emul: Cleanup emul directory
Avoid implementations in the subsys emul directory to keep the directory
focused on emulator subsystem instead of consumers. Consumers should be
implemented side-by-side to their drivers

Signed-off-by: Yuval Peress <peress@google.com>
2023-02-24 11:50:10 +01:00
Gerard Marull-Paretas
49123a97f0 tests: drivers: gpio: basic_api: remove unused pinmux.h include
The test was not using the pinmux.h API.

Signed-off-by: Gerard Marull-Paretas <gerard.marull@nordicsemi.no>
2023-02-23 16:56:04 -05:00
Siyuan Cheng
c6d6a60d50 test: spi_loopback: add emsdp board support
Add emsdp board in spi_loopback test

Signed-off-by: Siyuan Cheng <siyuanc@synopsys.com>
2023-02-23 10:51:06 -06:00
Daniel DeGrasse
a50791daf2 tests: drivers: regulator: add support for RT685 to voltage test
Add support for testing the onboard PCA9420 regulator on the RT685 EVK
to the regulator voltage test. Since the ADC can only record voltages up
to 1.8V, and some regulators cannot have all voltage ranges tested
without crashing the system, only LDO1 and LDO2 are tested in this
testsuite

Signed-off-by: Daniel DeGrasse <daniel.degrasse@nxp.com>
2023-02-23 10:50:11 +01:00
Daniel DeGrasse
4b69fa2279 tests: drivers: regulator: skip unsupported voltages
Skip unsupported voltages in regulator voltage test. This is useful for
test platforms where not all voltages can be measured or set on the
onboard regulator.

Signed-off-by: Daniel DeGrasse <daniel.degrasse@nxp.com>
2023-02-23 10:50:11 +01:00
Garrett Battaglia
65e3f5b23d drivers: sensor: add MAX31855
add MAX31855 cold-junction compensated thermocouple-to-digital
converter sensor driver and sample

Signed-off-by: Garrett Battaglia <garrett@garrettbattaglia.com>
2023-02-23 09:06:28 +01:00
Henrik Brix Andersen
79c8d0e6aa tests: drivers: can: api: add tests for can_frame_matches_filter()
Add CAN API tests for the can_frame_matches_filter() utility function.

Signed-off-by: Henrik Brix Andersen <hebad@vestas.com>
2023-02-23 09:00:12 +01:00
Henrik Brix Andersen
4e67546321 tests: drivers: can: api: adjust CAN IDs used for testing
Adjust the CAN IDs used for testing in order for them to match the various
can_*_filter_2 as documented in common.h.

Signed-off-by: Henrik Brix Andersen <hebad@vestas.com>
2023-02-23 09:00:12 +01:00
Henrik Brix Andersen
9b39c43714 tests: drivers: can: api: use correct CAN ID in test_ext_masked_filter_2
Use the correct CAN ID in struct can_filter test_ext_masked_filter_2.

Signed-off-by: Henrik Brix Andersen <hebad@vestas.com>
2023-02-23 09:00:12 +01:00
Henrik Brix Andersen
8875c3b2e9 tests: drivers: can: move CAN utility function tests to API tests
Move the CAN utility functions tests to a separate test suite under the CAN
API tests.

Signed-off-by: Henrik Brix Andersen <hebad@vestas.com>
2023-02-23 09:00:12 +01:00
Aaron Massey
6cdef0894f drivers: fuel_gauge: kernel drivers use syscalls
The fuel gauge API doesn't make use of syscalls with device drivers, which
is not congruent with Zephyr's security model.

Correct the fuel gauge API to only allow access to fuel gauge device
drivers functionality via syscalls to keep with Zephyr's security model.

Signed-off-by: Aaron Massey <aaronmassey@google.com>
2023-02-22 08:51:55 +01:00
Aaron Massey
7d83bf7d54 drivers: fuel_gauge: Rename API struct
Fuel gauge API struct type is currently named battery_driver_api, this is
inaccurate as the API struct represents functions for interacting with fuel
gauge drivers in particular.

Rename the API struct type to fuel_gauge_driver_api to clearly signal its
functionality.

Signed-off-by: Aaron Massey <aaronmassey@google.com>
2023-02-22 08:51:55 +01:00
Bartosz Bilas
2b4a6e52d5 drivers: i2c: eeprom_target: switch to dedicated driver compatible
Create and use a new `zephyr,i2c-target-eeprom` compatible
within I2C  eeprom target driver that allows to use
that driver along with real atmel at24 EEPROM simultaneously.

Signed-off-by: Bartosz Bilas <b.bilas@grinn-global.com>
2023-02-21 18:03:11 -05:00
Henrik Brix Andersen
486b96eea8 tests: drivers: can: api: move test data to common files
Move the test definitions, frames, and filters to common.h/common.c and
reuse them between the classic CAN and CAN-FD API tests.

Signed-off-by: Henrik Brix Andersen <hebad@vestas.com>
2023-02-21 18:02:37 -05:00
Henrik Brix Andersen
f312ab2d61 tests: drivers: can: fold the CAN-FD tests into the main API tests
Fold the CAN-FD specific tests into the main CAN API tests and stop
treating the CAN-FD API functionality as an add-on to CAN API.

Signed-off-by: Henrik Brix Andersen <hebad@vestas.com>
2023-02-21 18:02:37 -05:00
Andriy Gelman
eb5fd177d1 tests: drivers: uart_async_api_api: Add overlay for xmc45_relax_kit
Adds overlay and config for xmc45_relax_kit.
The Kconfig entry CONFIG_SPEED_OPTIMIZATIONS=y must be set
to pass the test at baudrate 921600 bps.

Signed-off-by: Andriy Gelman <andriy.gelman@gmail.com>
2023-02-21 21:15:53 +01:00
Guillaume Gautier
893f6f8b17 tests: drivers: pwm: pwm_loopback: boards: Add Nucleo F103RB overlay
Add Nucleo F103RB overlay to the PWM loopback test to check that the newly
introduced PWM inputs are functional.

Signed-off-by: Guillaume Gautier <guillaume.gautier-ext@st.com>
2023-02-19 20:47:01 -05:00
Michal morsisko
2e4d8761be drivers: sensor: Add support for BH1750 ambient light sensor
This commit adds support for BH1750 ambient light sensor.
The driver works using I2C peripheral in one-time mode.

Signed-off-by: Michal morsisko <morsisko@gmail.com>
2023-02-19 20:44:34 -05:00
Rajavardhan Gundi
c71ab5699a tests: drivers: sbs_gauge: Include additional properties
Include tests for Fuel Gauge mode, status, charge current,
charge voltage, design capacity and design voltage.

Signed-off-by: Rajavardhan Gundi <rajavardhan.gundi@intel.com>
2023-02-19 20:42:10 -05:00
Zhang Lixu
0a5e4e493b tests: build_all: add int-gpios in test_i2c_bmi160 to fix build issue
After adding the interrupt support for bmi160 i2c instance, it needs to add
the int-gpios in the twister test's dts because the bmi160's trigger mode
is enabled by default.

Signed-off-by: Zhang Lixu <lixu.zhang@intel.com>
2023-02-19 20:41:56 -05:00
Jay Vasanth
c504e1e5cd drivers: dma: Add Microchip XEC DMA driver
The Microchip XEC family of microcontrollers includes a
simple DMA block implementing multiple channels. DMA supports
memory to memory, memory to peripheral, and peripheral to
memory transfers. Peripheral support is limited by each
chip to I2C and SPI controllers. DMA hardware does not support
scatter-gather or linked transactions.

Signed-off-by: Jay Vasanth <jay.vasanth@microchip.com>
2023-02-19 20:38:21 -05:00
Andrzej Głąbek
8e8644ba6a tests: drivers: nrf_rtc_timer: Add a test case to check rescheduling
Add a test case that schedules an alarm and then, after a delay that
is changed in every iteration, tries to reschedule it to one cycle
later.
This reveals a problem in the current nrf_rtc_timer implementation
that in certain conditions a scheduled timeout may be missed and
its expiration is handled 512 seconds later (when the system timer
overflows).

Signed-off-by: Andrzej Głąbek <andrzej.glabek@nordicsemi.no>
2023-02-14 08:28:28 +01:00
Johann Fischer
18a03ced93 tests: drivers: udc: fix udc_ep_try_config() test
Behavior of udc_ep_try_config() is changed by the commit e60a4efbb0
("drivers: udc: do not update MPS for isochronous endpoints"),
update test case accordingly.

Signed-off-by: Johann Fischer <johann.fischer@nordicsemi.no>
2023-02-13 10:11:52 +01:00
Kumar Gala
b582e5df99 tests: drivers: can: shell: increase test stack size
The test fails with a stack overflow on qemu_x86 when we build with
llvm.  Bump the test stack a little addresses the issue.

Signed-off-by: Kumar Gala <kumar.gala@intel.com>
2023-02-11 08:14:39 +09:00
Keith Short
51bd9dad96 tests: gpio_hogs: Fix the output low test
The output low test was checking the wrong GPIO spec handle.

Signed-off-by: Keith Short <keithshort@google.com>
2023-02-08 11:08:00 +01:00
Declan Snyder
0744e42e22 drivers: disk: Decouple SDMMC and MMC Kconfigs
MMC was using SDMMC kconfigs to build disk driver.
This is incorrect, MMC and SDMMC should not be sharing
Kconfigs. Split the drivers/disk/Kconfig.sdmmc into
drivers/disk/Kconfig.mmc and drivers/disk/Kconfig.sdmmc.

Also update disk tests to account for new MMC Kconfigs.

Signed-off-by: Declan Snyder <declan.snyder@nxp.com>
2023-02-08 10:18:13 +01:00
Declan Snyder
bcd13af168 tests: drivers: disk: Update outdated prj.conf
The proj.conf for these two tests was unconditionally
selecting SDMMC disk drivers which is incorrect now that
there are DT macros that are used to select these Kconfigs.

This also allows the test to be used for other disk protocols
such as MMC, as before this change, SDMMC would still be selected
and cause errors at runtime.

Signed-off-by: Declan Snyder <declan.snyder@nxp.com>
2023-02-08 10:18:13 +01:00
Erwan Gouriou
36ffed2a89 tests: drivers: flash: _ns target test case should be build only
Flash test can't be tested automatically on (at least some) _ns targets
by CI.
Set a dedicated test scenario for _ns targets in build_only.

Signed-off-by: Erwan Gouriou <erwan.gouriou@linaro.org>
2023-02-08 01:14:38 +09:00
Andrzej Głąbek
29d7c90779 tests: Align zephyr,psa-crypto-rng node names with those used by SoCs
This is a follow-up to commit 9951971aee.

Align names of "zephyr,psa-crypto-rng" compatible nodes used in tests
(crypto/rand32 and drivers/entropy/api) with those introduced by the
above commit into SoC definitions (nRF5340/nRF9160). This way the test
overlays will overwrite the already existing nodes instead of adding
second instances of them, what leads to build failures at the linking
stage as the related driver supports only single instance (and creates
it for the first node found).

Signed-off-by: Andrzej Głąbek <andrzej.glabek@nordicsemi.no>
2023-02-07 14:26:18 +01:00