Change the pinout for ADC/DAC loopback testing on the stm32 boards
nucleo_l073rz: adc_in0_pa0/dac_out1_pa4 --> A0 to A2 on arduino CN8
nucleo_g071rb: adc1_in0_pa0/dac1_out1_pa4 --> A0 to A2 on arduino CN8
stm32l562e_dk: adc1_in13_pc4/dac1_out1_pa4 --> A2 to A4 on arduino CN19
Adjust the ACQuisition time to the MAX value because the default (=0)
is too low for several boards.
Signed-off-by: Francois Ramu <francois.ramu@st.com>
Add the '.buffered' field to the dac_channel_cfg structure
when testing the DAC.
This boolean parameter is initialised to 'true' to PASS the test.
It follows the https://github.com/zephyrproject-rtos/zephyr/pull/57730
Also changed for the samples/drivers/dac
Signed-off-by: Francois Ramu <francois.ramu@st.com>
As of today <zephyr/zephyr.h> is 100% equivalent to <zephyr/kernel.h>.
This patch proposes to then include <zephyr/kernel.h> instead of
<zephyr/zephyr.h> since it is more clear that you are including the
Kernel APIs and (probably) nothing else. <zephyr/zephyr.h> sounds like a
catch-all header that may be confusing. Most applications need to
include a bunch of other things to compile, e.g. driver headers or
subsystem headers like BT, logging, etc.
The idea of a catch-all header in Zephyr is probably not feasible
anyway. Reason is that Zephyr is not a library, like it could be for
example `libpython`. Zephyr provides many utilities nowadays: a kernel,
drivers, subsystems, etc and things will likely grow. A catch-all header
would be massive, difficult to keep up-to-date. It is also likely that
an application will only build a small subset. Note that subsystem-level
headers may use a catch-all approach to make things easier, though.
NOTE: This patch is **NOT** removing the header, just removing its usage
in-tree. I'd advocate for its deprecation (add a #warning on it), but I
understand many people will have concerns.
Signed-off-by: Gerard Marull-Paretas <gerard.marull@nordicsemi.no>
Many device pointers are initialized at compile and never changed. This
means that the device pointer can be constified (immutable).
Automated using:
```
perl -i -pe 's/const struct device \*(?!const)(.*)= DEVICE/const struct
device *const $1= DEVICE/g' **/*.c
```
Signed-off-by: Gerard Marull-Paretas <gerard.marull@nordicsemi.no>
Add a bunch of missing "zephyr/" prefixes to #include statements in
various test and test framework files.
Signed-off-by: Fabio Baltieri <fabiobaltieri@google.com>
Move to use DEVICE_DT_GET instead of device_get_binding as
we work on phasing out use of DTS 'label' property.
Signed-off-by: Kumar Gala <galak@kernel.org>
Running the testcase dac loopback on the nucleo_g071rb
target board.
The ADC1 in0 on PA0 (pin A0), the DAC1 out1 on PA4 (pin A2)
must be connected on the HW.
Signed-off-by: Francois Ramu <francois.ramu@st.com>
In order to bring consistency in-tree, migrate all tests to the new
prefix <zephyr/...>. Note that the conversion has been scripted, refer
to #45388 for more details.
Signed-off-by: Gerard Marull-Paretas <gerard.marull@nordicsemi.no>
This adds the config to PASS the tests/drivers/dac/dac_loopback
on the nucleo_f746zg board, when PA0 and PA4 are connected.
The DTS of the nucleo_f746zg defines the ADC1 ch0 and DAC1 ch1.
Signed-off-by: Francois Ramu <francois.ramu@st.com>
This adds the dts to PASS the tests/drivers/dac/dac_loopback
on the nucleo_f429zi board, when PA0 and PA4 are connected.
Signed-off-by: Francois Ramu <francois.ramu@st.com>
This commit enables dac_loopback to build and run on stm32f3_disco
platform.
This has been tested with twister and also as a standalone
dac_loopback test and is working as expected.
Signed-off-by: Krishna Mohan Dani <krishnamohan.d@hcl.com>
MCP4725 is an I2C dac that was added with PR #33481. This can now be
added to the bl5340_dvk device tree.
Signed-off-by: Kieran Mackey <kieran.mackey@lairdconnect.com>
Now that device_api attribute is unmodified at runtime, as well as all
the other attributes, it is possible to switch all device driver
instance to be constant.
A coccinelle rule is used for this:
@r_const_dev_1
disable optional_qualifier
@
@@
-struct device *
+const struct device *
@r_const_dev_2
disable optional_qualifier
@
@@
-struct device * const
+const struct device *
Fixes#27399
Signed-off-by: Tomasz Bursztyka <tomasz.bursztyka@linux.intel.com>
Enable internal DAC to ADC loopback on the NXP TWR-KE18F
board.
Increase the ADC sample time to 5 microseconds since there is no
buffer between the DAC and ADC.
Signed-off-by: Henrik Brix Andersen <henrik@brixandersen.dk>
Add support for running the DAC loopback test case on the NXP
FRDM-K64F development board.
Signed-off-by: Henrik Brix Andersen <henrik@brixandersen.dk>
Add support for running the DAC loopback test case on the NXP
TWR-KE18F development board.
Signed-off-by: Henrik Brix Andersen <henrik@brixandersen.dk>
