Commit Graph

2823 Commits

Author SHA1 Message Date
Chekhov Ma
c78f583ed7 tests: drivers: gpio_basic_api add board mimx93_evk_a55
Add mimx93_evk_a55.overlay to tests: drivers: gpio_basic_api

Signed-off-by: Chekhov Ma <chekhov.ma@nxp.com>
2024-01-16 20:50:11 -05:00
Alberto Escolar Piedras
9af74504dd tests/drivers uart_mix_fifo_poll: Filter out repetitive tests
Do not run in CI all tests, as they have very similar configuration
and provide little extra coverage to justify the extra CI time.

Signed-off-by: Alberto Escolar Piedras <alberto.escolar.piedras@nordicsemi.no>
2024-01-16 14:55:07 -05:00
Alberto Escolar Piedras
e6140f5422 tests/drivers uart_mix_fifo_poll: Allow configuring test length
This test is quite heavy and long in simulation,
but its length is meant to find unlikely issues which
may be triggered only very rarely.
Let's provide a kconfig value to chose how long the
test is, and set it to a lower value when running in simulation
(in CI) to save time.

Signed-off-by: Alberto Escolar Piedras <alberto.escolar.piedras@nordicsemi.no>
2024-01-16 14:55:07 -05:00
Alberto Escolar Piedras
685c88308d tests/drivers uart_mix_fifo_poll: Speed up for nrf52_bsim
Increase the UART speed to 1Mbps for the simulated nrf52
to reduce the amount of time spent busy waiting, and
therefore the real time duration of the test.

Signed-off-by: Alberto Escolar Piedras <alberto.escolar.piedras@nordicsemi.no>
2024-01-16 14:55:07 -05:00
Anas Nashif
ead02284f0 tests: uart: filter by CONFIG_SERIAL_HAS_DRIVER
filtering by CONFIG_SERIAL always matches, we need a different filter
and be able to enable the driver if supported.

Signed-off-by: Anas Nashif <anas.nashif@intel.com>
2024-01-16 10:29:39 -05:00
Anas Nashif
54d177a3e7 tests: uart: do not filter if we know which platforms to use
No need for filtering in one of the tests, since we have platform_allow.

Signed-off-by: Anas Nashif <anas.nashif@intel.com>
2024-01-16 10:29:39 -05:00
Amrith Venkat Kesavamoorthi
879e3a42b0 drivers: gpio: PCF857x: Modify PCF8574 driver
Modify existing PCF8574 driver as PCF857x for:
PCF8574 - 8 channel I/O expander
PCF8575 - 16 channel I/O expander

Signed-off-by: Amrith Venkat Kesavamoorthi <amrith@mr-beam.org>
2024-01-16 15:19:14 +00:00
Yuval Peress
2d09f1f566 test: bmi160: rename test directory
Rename the test directory to more accuratly reflect what's being
tested.

Signed-off-by: Yuval Peress <peress@google.com>
2024-01-16 10:01:00 +01:00
Yuval Peress
b58b03196b bus: emul: Update i2c/spi emulators with mock transport
Adding a hook for tests to inject a mock transport and migrating the
accel test to test bmi160 specific things. The old version of the test
which checks for read values is now covered by the generic test in
the sensor build_all target.

Signed-off-by: Yuval Peress <peress@google.com>
2024-01-16 10:01:00 +01:00
Yuval Peress
9898b2fc3f bmi160: Make changes to align driver to datasheet
The logic in the driver was not aligned to the datasheet. Also,
temperature reading was not being done in fetch, but in channel_get.
There was also some extra conversions from SI->register->SI when
setting the range, this was causing the register value calculation to
produce an incorrect scale in some cases.

Tests were added to cover these cases.

Signed-off-by: Yuval Peress <peress@google.com>
2024-01-16 10:01:00 +01:00
Yuval Peress
be563239c8 sensor: testing: Update sensor emul backend
Update the backend for sensor emulators to include a function for
setting the offset as well as a function to query an attribute's
metadata such as bounds and increment size. Additionally, add
backend support for setting the _xyz channel values.

Make the appropriate test changes to accomodate.

Signed-off-by: Yuval Peress <peress@google.com>
2024-01-16 10:01:00 +01:00
Alberto Escolar Piedras
cee40d1d49 tests/drivers/uart/uart*: Allow on nrf52_bsim
Add the nrf52_bsim to the platform_allow list
for tests which had such a filter.

Note that for this test to pass, you need
to connect the uart in loopback, passing the command
line option `-uart0_loopback` to zephyr.exe

Note this tests do not run right now by default in CI
as the fixture is preventing it.
They can be run with:

twister -T tests/drivers/uart/ -v -p nrf52_bsim \
  --fixture gpio_loopback -- -uart0_loopback

Signed-off-by: Alberto Escolar Piedras <alberto.escolar.piedras@nordicsemi.no>
2024-01-12 11:27:23 -06:00
Alberto Escolar Piedras
f82f6cdeae tests uart/uart_async_api: Improve filter
These tests were filtering by CONFIG_UART_CONSOLE,
but that does not seem a strick requirement.
It seems the requirement would just be CONFIG_SERIAL,
but that is implicit if CONFIG_SERIAL_SUPPORT_ASYNC,
which is required for all these tests, so let's
just remove CONFIG_UART_CONSOLE.

(The simulated nrf5x boards do not set CONFIG_UART_CONSOLE
by default, as by default the console is routed to the
process stdout instead)

Signed-off-by: Alberto Escolar Piedras <alberto.escolar.piedras@nordicsemi.no>
2024-01-12 11:27:23 -06:00
Alberto Escolar Piedras
7ef23e1573 tests uart/uart_pm: Fix kconfig warning
The option CONFIG_NATIVE_UART_0_ON_STDINOUT
is only usable for the native_sim/posix(_64) targets,
but this test is only allowed for the nrf52840dk_nrf52840.
Building with this option set causes a kconfig warning.
Let's just remove it.

Signed-off-by: Alberto Escolar Piedras <alberto.escolar.piedras@nordicsemi.no>
2024-01-12 11:27:23 -06:00
Alberto Escolar Piedras
51f9af86e4 tests/drivers uart_pm: Fix for too fast targets
On the async configurations, the first part of the test
(test_uart_pm_in_idle) can interfere with the second part
of the test, if the device has a fast enough CPU.
This is due to the first part of the test ending
as soon as it queues the last byte for transmission.
If the device is fast enough (and the simulated
nrf52 is), the 2nd part of the test will start executing
enabling the UART Rx, which can result in either
the Rx being enabled mid frame, which can result in a frame
error or even before the Tx HW started pushing the byte
in the line (resulting in that byte being received).
Neither of these cases are handled by the 2nd test,
which sees a spurious error or received byte
and fails.

Let's just add a small delay at the end of the first test
to allow the Tx of the last byte to be done.

Signed-off-by: Alberto Escolar Piedras <alberto.escolar.piedras@nordicsemi.no>
2024-01-12 11:27:23 -06:00
Mahesh Mahadevan
37158ebf15 tests: counter: Add LPC RTC 1KHZ counter
Add counter test support for the RTC 1KHz counter

Signed-off-by: Mahesh Mahadevan <mahesh.mahadevan@nxp.com>
2024-01-12 13:34:19 +01:00
Yuval Peress
4efa11ebf7 bbram: Add tests
Add emulation testing for it8xxx2, npcx, and mcp7940n. The test is made
to be generic and uses the backend API in order to verify both read and
write functionality. Additional tests are made for the API's limits when
reading/writing out of bounds.

Fixes #65018

Signed-off-by: Yuval Peress <peress@google.com>
2024-01-12 09:59:31 +01:00
Anisetti Avinash Krishna
62c8b066c0 tests: drivers: uart: uart_async_api: Enable test for adl_crb
Enable uart_async_api test for ADL_CRB

Signed-off-by: Anisetti Avinash Krishna <anisetti.avinash.krishna@intel.com>
2024-01-11 15:41:42 -06:00
Henrik Brix Andersen
b7854c08be tests: drivers: build_all: adc: add build test for the mcp320x driver
Add build-only test of the mcp320x ADC driver.

Signed-off-by: Henrik Brix Andersen <hebad@vestas.com>
2024-01-11 17:32:28 +01:00
Tristan Honscheid
0f95b6fbb0 sensors: Add Bosch BMA4xx-series driver
This is a driver targetting the Bosch BMA 4-series accelerometers. It
has been specifically developed for the BMA422 but should be compatible
with others in that line, excepting the BMA400. Supports key attributes
and async RTIO one-shot operation. I2C operation is supported, with
stubs for a SPI implementation provided for future improvement.

Signed-off-by: Tristan Honscheid <honscheid@google.com>
2024-01-11 09:58:29 -06:00
Lucas Tamborrino
2ca4ed205f tests: pwm: esp32s3: add internal loopback
Add internal loopback for testing purposes

Signed-off-by: Lucas Tamborrino <lucas.tamborrino@espressif.com>
2024-01-11 10:04:34 +01:00
Lucas Tamborrino
76997374c3 tests: pwm: esp32: add internal loopback
Add internal loopback for testing purposes and
change wroom for wrover, which is default board
for testing.

Signed-off-by: Lucas Tamborrino <lucas.tamborrino@espressif.com>
2024-01-11 10:04:34 +01:00
Jun Lin
833495675a test: spi_loopback: add npcx evbs to the spi_loopback test suite
This commits adds the npcx4/npcx9/npcx7 evaluation boards to the
spi_loopback test suite.

Signed-off-by: Jun Lin <CHLin56@nuvoton.com>
2024-01-11 10:04:21 +01:00
Fabio Baltieri
e5974b2aac input: gpio_keys: implement polling mode support
Some MCU have limitations with GPIO interrupts. Add a polling mode to
the gpio-keys driver to support those cases.

This required a bit of a refactoring of the driver data structure to add
a instance wide data, and move the pin specific pointer in the config
structure.

For polling, reuse the button 0 delayed work so we minimize the resource
waste, the two work handler functions are only referenced when used so
at least those are discarded automatically if no instance needs them.

Fix a bug in the PM structure instantiation as well.

Signed-off-by: Fabio Baltieri <fabiobaltieri@google.com>
2024-01-10 18:21:49 +00:00
Jonathan Hamberg
9c1a45cc00 posix: Fix name collision with __bswap
__bswap_ in zephyr/sys/byteorder.h conflicts with __bswap_ in host's
byteswap.h. byteswap.h from host compiler used in posix_native_64 boards
causes a compilation issue.

This commit renames __bswap_ to BSWAP_ to prevent collision.

Before this commit a compilation error can be created by adding #include
<byteswap.h> to samples/net/sockets/echo/src/socket_echo.c

This does not change external API to byteorder.h, but does change
internal implementation which some other source files depend on.

Replaced manual byteswap operations in devmem_service.c with APIs from
byteorder.h which automatically converts to CPU endianess when necessary.

Fixes #44324

Signed-off-by: Jonathan Hamberg <jonathanhamberg@gmail.com>
2024-01-10 18:13:44 +00:00
Fabio Baltieri
bd8cee8683 drivers: input: add an analog-axis driver
Add an input driver to read data from an analog device, such as a
thumbstick, connected to an ADC channel, and report it as an input
device.

Signed-off-by: Fabio Baltieri <fabiobaltieri@google.com>
2024-01-10 15:05:35 +01:00
Alberto Escolar Piedras
892e8ef47a tests/drivers uart_async_*: Provide overlays for nrf52_bsim
For uart_async_api, uart_mix_fifo_poll & uart_pm:
These test can be run fine in the simulated nrf52_bsim board,
just connecting the UART Tx and Rx in loopback,
but we need an overlay just like for the real boards.
Let's provide it.

Signed-off-by: Alberto Escolar Piedras <alberto.escolar.piedras@nordicsemi.no>
2024-01-10 10:01:37 +01:00
Alberto Escolar Piedras
c7d179f895 tests/drivers uart_async_api: Fix build error with host gcc
For some reason the host gcc (11 & 12) does not believe
rx_buf_size is constant. Let's work around it by using the
sizeof() expression it is initialized to instead.

This fixes a build error when targetting native targets
which use the host gcc:

tests/drivers/uart/uart_async_api/src/test_uart_async.c:236:34:
error: expression in static assertion is not constant
  236 |         BUILD_ASSERT(rx_buf_size <=
  sizeof(tdata.rx_first_buffer), "Invalid buf size");

Signed-off-by: Alberto Escolar Piedras <alberto.escolar.piedras@nordicsemi.no>
2024-01-10 10:01:37 +01:00
Alberto Escolar Piedras
37f26174ea tests/drivers uart_async_rx: Fix for integration_platforms
The test was actually filtered out in the integration platforms
(native_sim) as SERIAL was not enabled in its prj.conf
and that is not enabled by default for this target.
Let's just enable it.

Signed-off-by: Alberto Escolar Piedras <alberto.escolar.piedras@nordicsemi.no>
2024-01-10 10:01:37 +01:00
Henrik Brix Andersen
1ebaa293a1 dts: bindings: adc: ti: lmp90xxx: use common io-channel-cells naming
Use the common io-channel-cells name "input" instead of "positive" and
"negative" to make this binding work with the various ADC DT macros.

Signed-off-by: Henrik Brix Andersen <hebad@vestas.com>
2024-01-09 10:04:18 +01:00
Anas Nashif
afc319e3fa ztest: shell: add shell support
- Support for listing both testcases and testsuites
- Support for running single suites or single test cases
- Support shuffling tests and repeating execution based on command line
  arguments.

For example, build with

west build -p  -b qemu_cortex_m3  tests/kernel/sleep   -t run -- \
-DCONFIG_ZTEST_SHUFFLE=y -DCONFIG_ZTEST_SHELL=y

Following commands are available:

uart:~$ ztest
ztest - Ztest commands
Subcommands:
  run-all          :Run all tests
  shuffle          :Shuffle tests
  list-testsuites  :List all test suites
  list-testcases   :List all test cases
  run-testsuite    :Run test suite
  run-testcase     :Run testcase

shuffle accepts two arguments --suite_iter and --case_iter which allows
repeated exercution of testcases or suites.

Signed-off-by: Anas Nashif <anas.nashif@intel.com>
2024-01-09 09:58:57 +01:00
Gerard Marull-Paretas
4a0d880350 soc: riscv: ite: reorganize SoC folder
Follow the vendor structure [1]:

- Family: ITE Embedded Controller SoCs
- Series: IT8XXX2
- SoCs: IT81202BX, IT81202CX, etc.

[1]: https://www.ite.com.tw/en/product/category?cid=1

Signed-off-by: Gerard Marull-Paretas <gerard@teslabs.com>
2024-01-09 09:40:07 +01:00
Yong Cong Sin
c7ce871a04 tests: exclude renode from tests requiring unsimulated peripherals
Physical boards work on these tests but some of the required
peripherals are not simulated by `renode`, executing the tests
with renode-simulated board in CI will fail.

Exclude `renode` simulation from these tests.

Signed-off-by: Yong Cong Sin <ycsin@meta.com>
2024-01-08 16:17:43 +00:00
Bryan Zhu
6f84f34647 tests: counter: counter_basic_api: Add support for ambiq_counter device
Update counter test to test ambiq_counter devices

Signed-off-by: Bryan Zhu <bzhu@ambiq.com>
2024-01-08 14:16:13 +01:00
Hudson C. Dalpra
410684c7b0 drivers: w1: add zephyr-gpio driver
The zephyr-gpio w1 driver introduced in this commit implements
all routines for the w1 api on top of the zephyr gpio driver.
W1 bit read, write, and reset operations are executed by
bit-banging the selected gpio.

Signed-off-by: Hudson C. Dalpra <hudson@bduncanltd.com>
2024-01-08 12:43:52 +01:00
Yong Cong Sin
8f6be9661e tests: build_all: plic: add test for PLIC_SHELL build
Add a build-only test for the `PLIC_SHELL` configuration.

Signed-off-by: Yong Cong Sin <ycsin@meta.com>
2024-01-08 12:35:52 +01:00
Manuel Argüelles
7e2600d309 tests: drivers: pwm: add overlays for ucans32k1sic
Enable pwm tests on ucans32k1sic board.

Signed-off-by: Manuel Argüelles <manuel.arguelles@nxp.com>
2024-01-05 09:03:00 +01:00
Fabio Baltieri
e517af4cff charger: add a driver for bq25180
Add a driver for the TI BQ25180. Implement enable/disable and current
set/get.

Signed-off-by: Fabio Baltieri <fabiobaltieri@google.com>
2024-01-05 09:00:21 +01:00
Jeremy Bettis
5a727a382a drivers: Add level intrs in gpio_ite_it8xxx2_v2
Implement level based gpio interrupts, by using a worker queue to
repeatedly call the gpio callbacks until the gpio is no longer active.

Update unit test for new interrupts.

Bug #66401

Signed-off-by: Jeremy Bettis <jbettis@google.com>
2024-01-02 10:10:39 +01:00
Jeremy Bettis
6c567d4899 tests: Add unittest for gpio_ite_it8xxx2_v2
Add a unittest for 100% of the lines in gpio_ite_it8xxx2_v2. The test
fakes the registers by overriding the ECREG macro to call a function
provided by the test.

Does not test the code guarded by
CONFIG_SOC_IT8XXX2_GPIO_GROUP_K_L_DEFAULT_PULL_DOWN

Bug #66401

Signed-off-by: Jeremy Bettis <jbettis@google.com>
2024-01-02 10:10:39 +01:00
cyliang tw
d00125875c tests: drivers: adc: adc_api: support numaker_pfm_m467
Add support for Nuvoton numaker board numaker_pfm_m467.

Signed-off-by: cyliang tw <cyliang@nuvoton.com>
2024-01-02 10:10:27 +01:00
Fabio Baltieri
4307882dd1 input: kbd_matrix: add actual key mask runtime control
Add an option to enable a input_kbd_matrix_actual_key_mask_set API to
enable or disable keys dynamically in the mask. This can be useful if
the exact key mask is determined in runtime and the device is using a
single firmware for multiple matrix configurations.

Signed-off-by: Fabio Baltieri <fabiobaltieri@google.com>
2023-12-27 16:50:21 +00:00
Andrei Emeltchenko
5d0ba230b8 tests: samples: watchdog: Add intel_rpl_p_crb overlay
Add overlay to enable watchdog for build test and sample.

Signed-off-by: Andrei Emeltchenko <andrei.emeltchenko@intel.com>
2023-12-27 16:06:19 +00:00
Bindu S
3974882b42 tests: drivers: spi: spi_loopback: Enabled SPI in RPL-P
Added overlay and conf to enable SPI tests on RPL-P board.

Signed-off-by: Bindu S <bindu.s@intel.com>
2023-12-27 16:06:19 +00:00
Anisetti Avinash Krishna
b14feec6c4 boards: x86: rpl_crb: rpl_p_crb: Enabled GPIO in RPL-p
Enabled GPIO basic api test for RPL-P platform

Signed-off-by: Anisetti Avinash Krishna <anisetti.avinash.krishna@intel.com>
2023-12-27 16:06:19 +00:00
Ian Wakely
2a647c81cf board: Fixing ADC API tests for W5500_EVB_PICO.
When duplicating the rpi_pico board, I had missed this test file.

Signed-off-by: Ian Wakely <raveious.irw@gmail.com>
2023-12-27 16:04:26 +00:00
Anas Nashif
e86b44751c tests: usb: move bc12 tests under tests/drivers/usb
Move bc12 under usb, this is not a standalone driver subsystem.

Signed-off-by: Anas Nashif <anas.nashif@intel.com>
2023-12-22 09:54:12 +01:00
Anas Nashif
f296ea58a3 tests: ieee802154: fix test identifier
Fix test identifier and use correct component.

Signed-off-by: Anas Nashif <anas.nashif@intel.com>
2023-12-22 09:54:12 +01:00
Francois Ramu
82bace6e0d tests: drivers: dma test on stm32f7 requires nocache memory
Config the sram0 to be non-cachable to PASS the DMA testcases
chan_blen_transfer and loop_transfer
on the stm32f746zg and stm32f767zi nucleo boards.

The CONFIG_NOCACHE_MEMORY is useless as the memory region
gets the NOCACHE ATTRibutes for stm32H7 or stm32F7 as well.

Signed-off-by: Francois Ramu <francois.ramu@st.com>
2023-12-22 09:53:39 +01:00
Ian Wakely
9835957df0 board: adafruit_qt_py_rp2040: Adding test overlay.
Adding a board overlay for the ADC API driver test.

Signed-off-by: Ian Wakely <raveious.irw@gmail.com>
2023-12-22 09:53:21 +01:00