This commit enables soc-flash support in disco_l475_iot1
only for flash test. Using overlays, it adds soc-flash storage
partition and deletes qspi-flash storage parition for
flash test. Both flash test and spi_flash application
has been tested on disco_l475_iot1 platform.
Signed-off-by: Krishna Mohan Dani <krishnamohan.d@hcl.com>
This commit enables soc-flash support in stm32f746g_disco only for
flash test. Using overlays, it adds soc-flash storage partition and
deletes qspi-flash storage partition for flash test. Both flash test and
spi_flash application has been tested on stm32f746g_disco platform.
Signed-off-by: Krishna Mohan Dani <krishnamohan.d@hcl.com>
Function used for filtering "dt_compat_enabled_with_label" was not
working as expected as it was not taking into account that we're
looking for a children/parent combination:
Provided "compat" with enabled status should be the one of the parent
of the node matching given label.
Function is then reworked to take this into account.
And to make it's usage clear:
- function name is changed to be clearer on the intention
- args order is reversed to be more logical wrt the intention
Users of the function are also updated to take the change into
account.
Fixes#36093
Signed-off-by: Erwan Gouriou <erwan.gouriou@linaro.org>
Now that we only build on native_posix, we can build all the sensors
together in one pass. This makes it easier to manage the conf files
going forward.
Signed-off-by: Kumar Gala <kumar.gala@linaro.org>
The driver build_all tests only need to build a driver once and
so limit the sensor tests to only build on native_posix.
We tweak CONFIG_SYS_CLOCK_TICKS_PER_SEC as part of this change as
hp206c requires this setting to build.
Signed-off-by: Kumar Gala <kumar.gala@linaro.org>
Add the I2C version of the MS5607 (the SPI version was already enabled)
so that it gets compiled tested.
Signed-off-by: Aurelien Jarno <aurelien@aurel32.net>
Enable building the LMP90xxx driver (move devicetree nodes over from the
sensors/spi.dtsi). Limit to building on a single platform as this
is just making sure the drivers compile.
Signed-off-by: Kumar Gala <kumar.gala@linaro.org>
The testcase.yaml had multiple tests defined but they didn't do anything
different. Remove the duplication and rename to drivers.hwinfo.api.
Signed-off-by: Kumar Gala <kumar.gala@linaro.org>
This commit enables dac_loopback to build and run on stm32f3_disco
platform.
This has been tested with twister and also as a standalone
dac_loopback test and is working as expected.
Signed-off-by: Krishna Mohan Dani <krishnamohan.d@hcl.com>
This commit enables test_dac to build and run on stm32f3_disco
platform.
This has been tested with twister and also as a standalone test_dac
test and is working as expected.
Signed-off-by: Krishna Mohan Dani <krishnamohan.d@hcl.com>
Now that we've split out the build_all test there are a few left
over files that aren't needed any more.
Signed-off-by: Kumar Gala <kumar.gala@linaro.org>
The clock control & general driver build tests as they don't get
us any additional coverage then from what we get from the build all
test of tests/kernel/common/kernel.common on all platforms.
Additionally, remove drivers.conf as the file isn't used in any tests.
Signed-off-by: Kumar Gala <kumar.gala@linaro.org>
Add `hwinfo_get_reset_cause` and `hwinfo_clear_reset_cause` to retrieve
and to clear cause of system reset on supported platforms.
Different platforms can provide different causes of reset, however
there is a great deal of overlap. `enum reset_cause` can be expanded in
the future to support additional reasons, as additional platforms are
supported.
Signed-off-by: Arvin Farahmand <arvinf@ip-logix.com>
Introduce the npcx9m6f_evb board driver. NPCX9M6F_EVB board is a
development platform to evaluate the Nuvoton NPCX9 series
microcontrollers. This board needs to be mated with part number
NPCX996F.
It also includes:
1. Add CONFIG_BOARD_NPCX9M6F_EVB definition for adc test suite.
2. Add npcx7m6f_evb.overlay file for gpio test suite.
Signed-off-by: Jun Lin <CHLin56@nuvoton.com>
Signed-off-by: Mulin Chao <mlchao@nuvoton.com>
MCP4725 is an I2C dac that was added with PR #33481. This can now be
added to the bl5340_dvk device tree.
Signed-off-by: Kieran Mackey <kieran.mackey@lairdconnect.com>
This commit makes the flash test generic. The flast test will
look for storage partition in the soc-flash for testing.
Signed-off-by: Krishna Mohan Dani <krishnamohan.d@hcl.com>
The NXP I2S driver queues 2 receive buffers to avoid receive overflows.
Allocate an extra block so we do not see test failures due to allocate
failures
Signed-off-by: Mahesh Mahadevan <mahesh.mahadevan@nxp.com>
Use ZTEST_DMEM macro to place the buffers containing sample values
in the ztest memory partition that can be accessed from userspace.
Signed-off-by: Andrzej Głąbek <andrzej.glabek@nordicsemi.no>
Added test which validates that uart device correctly handles
going to and from low power state.
Signed-off-by: Krzysztof Chruscinski <krzysztof.chruscinski@nordicsemi.no>
This patch enables the DMA chan_blen_transfer and loop_transfer tests on
the nucleo_f070rb board.
Signed-off-by: Simon Guinot <simon.guinot@seagate.com>
Rename the NXP LPCXpresso55S16 board definition from
lpcxpresso55s16_ns (non-secure) to lpcxpresso55s16 and remove TF-M
configuration options.
While the LPC55S16 does have Arm TrustZone support, there is no TF-M
support available upstream yet.
Fixes#35100
Signed-off-by: Henrik Brix Andersen <henrik@brixandersen.dk>
This commit modifies st prescaler value from 0 to 10000 for
STM32 nucleo_f207zg. So pwm_api test results in successful
execution on nucleo_f207zg board.
Signed-off-by: Sidhdharth Yadav <sidhdharth.yadav@hcl.com>
Modify support for u-blox BMD-345-EVAL which uses the nRF52840
and a Skyworks RFX2411 FEM.
These edits follow the naming cnoventions that is used
with the other u-blox EVKs recently added, or in progress
This board is similar to the nRF52840dk_nrf52840 with the
addition of a FEM. Four Arduino GPIO pins have been
reassigned to the PA_LNA control pins.
u-blox would prefer to use this naming convention to match
other BMD-3xx-EVAL and EVK-NINA-Bx boards recently submitted.
Tested with blinky, button, and Bluetooth peripheral_hr
Checking dts files
Updated CODEOWNERS to rename bmd_345_eval to ubx_bmd345eval_nrf52840
Added CMakeLists.txt, updated board.c
Signed-off-by: Bob Recny <bob.recny@u-blox.com>
STM32 internal temperature sensor driver.
This sensor can be used to measure the temperature of the CPU
and its surroundings.
Signed-off-by: Eug Krashtan <eug.krashtan@gmail.com>
This commit enhances the CAN API test. In the send_receive tests,
we are using two filters and frames at the same time to check
if the frame gets dispatched to the correct filter.
Signed-off-by: Alexander Wachter <alexander@wachter.cloud>
ADC emulator is designed to be used in tests on native_posix board. It
supports 1-16 bit resolution range and all GAINs from enum adc_gain.
Reference voltages and number of emulated channels are set through dts.
Using special API from drivers/adc/adc_emul.h it is possible to set
constant voltage value returned by given ADC channel or set custom
function which allows to simulate complex output.
Also reference voltages can be changed in runtime using the API.
The CL also includes:
- Add adc definitions of ADC emulator in
tests/drivers/adc/adc_api/src/test_adc.c for supporting test suites.
- Add test for ADC emulator API in tests/drivers/adc/adc_emul/
Signed-off-by: Tomasz Michalec <tm@semihalf.com>
add adc_dma test application
enable periodic_trigger flag for adc edma
enable for frdm_k64f and frdm_k82f
Signed-off-by: Hake Huang <hake.huang@oss.nxp.com>
