Commit Graph

7 Commits

Author SHA1 Message Date
Gerard Marull-Paretas
93b63df762 samples, tests: convert string-based twister lists to YAML lists
Twister now supports using YAML lists for all fields that were written
as space-separated lists. Used twister_to_list.py script. Some artifacts
on string length are due to how ruamel dumps content.

Signed-off-by: Gerard Marull-Paretas <gerard.marull@nordicsemi.no>
2023-05-10 09:52:37 +02:00
Katarzyna Giądła
58c924ec56 tests: drivers: uart: Add GPIO dependency to tests
Add gpio dependency to the tests, which require fixture
`gpio_loopback`.

Signed-off-by: Katarzyna Giądła <katarzyna.giadla@nordicsemi.no>
2023-01-03 19:20:36 -05:00
Anas Nashif
ba7d730e9b tests/samples: use integration_plaforms in more tests/samples
integration_platforms help us control what get built/executed in CI and
for each PR submitted. They do not filter out platforms, instead they
just minimize the amount of builds/testing for a particular
tests/sample.
Tests still run on all supported platforms when not in integration mode.

Signed-off-by: Anas Nashif <anas.nashif@intel.com>
2022-11-29 16:03:23 +01:00
Anas Nashif
67e8d03280 tests/samples: fix some missing tags
Many driver samples or tests only had 'drivers' as the tag, without a
tag indicating what driver that is exactly, so add some missing tags.

Signed-off-by: Anas Nashif <anas.nashif@intel.com>
2022-11-14 07:08:04 -05:00
Katarzyna Giadla
681e3a16c7 tests: Change duplicated names of the test cases
Some names of the test cases are duplicated within the project.
This commit contains the proposed names of the test scenarios.

Signed-off-by: Katarzyna Giadla <katarzyna.giadla@nordicsemi.no>
2022-03-30 17:42:01 -04:00
Gerard Marull-Paretas
31f0610edc tests: drivers: uart: use pinctrl for nrf board overlay
nRF boards now require usage of pinctrl, migrate them.

Signed-off-by: Gerard Marull-Paretas <gerard.marull@nordicsemi.no>
2022-03-21 15:09:28 +01:00
Krzysztof Chruscinski
eb949d01d3 tests: drivers: uart: Add test for uart power management
Added test which validates that uart device correctly handles
going to and from low power state.

Signed-off-by: Krzysztof Chruscinski <krzysztof.chruscinski@nordicsemi.no>
2021-05-21 04:53:19 -05:00