Add DT and kconfig overlays for the nrf52_bsim so this test can be run
in this board too.
This simulated board supports short-circuiting pins
either programmatically or thru configuration files,
but it does not support a pull in an input being able to drag
a non driven output, so we need to skip the pull test.
Signed-off-by: Alberto Escolar Piedras <alberto.escolar.piedras@nordicsemi.no>
Twister now supports using YAML lists for all fields that were written
as space-separated lists. Used twister_to_list.py script. Some artifacts
on string length are due to how ruamel dumps content.
Signed-off-by: Gerard Marull-Paretas <gerard.marull@nordicsemi.no>
Extend test configuration for nrf52840dk to validate use of
GPIO SENSE and GPIOTE IN event for edge interrupts.
Signed-off-by: Krzysztof Chruscinski <krzysztof.chruscinski@nordicsemi.no>
This is now failing an edtlib check for unknown vendor prefixes.
I can't find a reason to use a vendor prefix in application-local
bindings like this, so just remove it wherever it appears by
normalizing to test-foo-compat instead of test,foo_compat or
test,foo-compat.
Signed-off-by: Martí Bolívar <marti.bolivar@nordicsemi.no>
harness being set without actual use of harness (via harness_config)
makes the test behave differently.
Fixes#24661
Signed-off-by: Anas Nashif <anas.nashif@intel.com>
The test case no longer permits inferring input and output pins based
only on the presence of GPIO aliases. Stop allowing presence of GPIO
aliases to enable the test.
Signed-off-by: Peter Bigot <peter.bigot@nordicsemi.no>
Test that the new port API functions all behave as expected, including
physical vs logical level for input and output as well as masked and
set-based output operations. Also tests the new pin API functions.
For running on real hardware this test now uses a local test-specific
devicetree binding. For build-only tests any platform with a GPIO
alias should be tested.
The new code increases flash requirements so add a filter to exclude
platforms that won't link.
Signed-off-by: Peter Bigot <peter.bigot@nordicsemi.no>
The seasonal overhaul of test identifiers aligning the terms being used
and creating a structure. This is hopefully the last time we do this,
plan is to document the identifiers and enforce syntax.
The end-goal is to be able to generate a testsuite description from the
existing tests and sync it frequently with the testsuite in Testrail.
Signed-off-by: Anas Nashif <anas.nashif@intel.com>
convert sample and test yaml filters that utilize a DT_ define to
instead use a dt_ function. The intent is to remove the Kconfig
generated DT defines and just make directy queries into the device tree.
Signed-off-by: Kumar Gala <kumar.gala@linaro.org>
We have many testcases doing filtering both on the architecture level
and the platform level, which is redundant. Also many testcases are
running the same test twice on the same SoC for no good reason, cleanup
the tests and cleanup the filtering.
Signed-off-by: Anas Nashif <anas.nashif@intel.com>
This will prepare test cases and samples with metadata and information
that will be consumed by the sanitycheck script which will be changed to
parse YAML files instead of ini.
Signed-off-by: Anas Nashif <anas.nashif@intel.com>
