On arrays DT_ENUM_HAS_VALUE() and DT_INST_ENUM_HAS_VALUE()
were only checking the first index, this changes it to check all indexes.
Signed-off-by: Fin Maaß <f.maass@vogl-electronic.com>
Instead of passing a single init function, create
struct device_ops with the init function inside. This allows to easily
extend device's capabilities in the future without too much breakage,
e.g. to add a de-init call.
Signed-off-by: Gerard Marull-Paretas <gerard.marull@nordicsemi.no>
Such union is rather redundant, considering a simple const cast can be
done when initializing the init entry. Note that the init_entry does not
need to be touched now that struct device stores the init call. It is
merely an init entry sorted by linker scripts, so we can intertwine
devices and SYS_INIT.
Signed-off-by: Gerard Marull-Paretas <gerard.marull@nordicsemi.no>
It just complicates things. It is not C99 strandard, and since C11 is
not mandatory, it is better to play safe here.
Signed-off-by: Gerard Marull-Paretas <gerard.marull@nordicsemi.no>
DT_SPEC related macro tests (ADC_DT_SPEC_GET_BY_NAME, MBOX_DT_SPEC_GET)
should not appear in this test because the configuration does not turn
on any devices
Move DP_SPEC-related tests to api_ext and enable the related device in the
configuration
fix#77205
Signed-off-by: Wenbin Zhang <freey7955@gmail.com>
Add a new "hash" attribute to all Devicetree EDT nodes. The hash is
calculated on the full path of the node; this means that its value
remains stable across rebuilds.
The hash is checked for uniqueness among nodes in the same EDT.
This computed token is then added to `devicetree_generated.h` and made
accessible to Zephyr code via a new DT_NODE_HASH(node_id) macro.
Signed-off-by: Luca Burelli <l.burelli@arduino.cc>
Add tests for the new port / endpoint DT macros
Signed-off-by: Josuah Demangeon <me@josuah.net>
Signed-off-by: Phi Bang Nguyen <phibang.nguyen@nxp.com>
Add a test for zephyr,memory-region-flags.
This test tests the attributes of memory regions defined in the linker
script, but this information cannot be obtained at runtime.
It verifies that the expected memory region attributes are defined in
the linker.cmd.
Since no syntax analysis is performed, this is not an entirely rigorous
test but sufficient for practical purposes.
Signed-off-by: TOKITA Hiroshi <tokita.hiroshi@gmail.com>
Test the new c-macros for dt enums. The new macros are already used in
the existing macros. As an example, DT_ENUM_IDX(node_id, prop) uses
DT_ENUM_IDX_BY_IDX(node_id, prop, 0) to get its result. However, this is
insufficient for testing the complete functionality of these macros.
Therefore, additional tests are added to make sure they work
appropriately for other indices besides 0.
Signed-off-by: Joel Hirsbrunner <jhirsbrunner@baumer.com>
We already have `DT_HAS_COMPAT_STATUS_OKAY` and
`DT_NUM_INST_STATUS_OKAY`, it seems intuitive to assume that
`DT_NODE_HAS_STATUS_OKAY` exists, so much so that it was used
before it's implemented.
This patch implements `DT_NODE_HAS_STATUS_OKAY`, which is
equivalent to: `DT_NODE_HAS_STATUS(<node_id>, okay)`
Added test for it in `tests/lib/devicetree/api`
Signed-off-by: Yong Cong Sin <ycsin@meta.com>
Signed-off-by: Yong Cong Sin <yongcong.sin@gmail.com>
`DT_..._REG_ADDR` macros do not always return an unsigned value. This
commit adds and unsigned 32bit prefix to ensure the value is always
unsigned.
Signed-off-by: Jeppe Odgaard <jeppe.odgaard@prevas.dk>
Signed-off-by: Fabio Baltieri <fabiobaltieri@google.com>
native_posix is now deprecated.
Building these tests in both native_sim and native_posix does not
improve coverage for the tests or subsystem but doubles CI time.
As anyhow native_posix will be removed all together in
2 releases, let's remove it already for these.
Signed-off-by: Alberto Escolar Piedras <alberto.escolar.piedras@nordicsemi.no>
Add `DT_INST_NUM_IRQS()` to get the number of interrupt lines
of the current `DT_DRV_COMPAT`
Signed-off-by: Yong Cong Sin <ycsin@meta.com>
Signed-off-by: Yong Cong Sin <yongcong.sin@gmail.com>
Add a new macro, DT_ANY_COMPAT_HAS_PROP_STATUS_OKAY
name, evaluates to 1 if any enabled instance of `compat` has the
property or to zero if it hasn't.
This macro can be useful in drivers for a family of devices.
Signed-off-by: Efrain Calderon <efrain.calderon.estrada@gmail.com>
`checkpatch.pl` requires that dts sources are indented with tabs,
fix all the spaces that slipped in while checkpatch wasn't watching.
Signed-off-by: Jordan Yates <jordan@embeint.com>
Add tests for
DT_REG_HAS_NAME,
DT_REG_ADDR_BY_NAME_OR,
DT_REG_SIZE_BY_NAME_OR,
DT_INST_REG_HAS_NAME,
DT_INST_REG_SIZE_BY_NAME_OR and
DT_INST_REG_ADDR_BY_NAME_OR.
Signed-off-by: Fin Maaß <f.maass@vogl-electronic.com>
Add the following new macros:
- DT_FOREACH_NODELABEL
- DT_FOREACH_NODELABEL_VARGS
- DT_INST_FOREACH_NODELABEL
- DT_INST_FOREACH_NODELABEL_VARGS
These are for-each helpers for iterating over the node labels of a
devicetree node. Since node labels are unique in the entire
devicetree, their token representations can be useful as unique IDs in
code as well.
As a first user of these, add:
- DT_NODELABEL_STRING_ARRAY
- DT_INST_NODELABEL_STRING_ARRAY
The motivating use case for these macros is to allow looking up a
struct device by devicetree node label in Zephyr shell utilities.
The work on the shells themselves is deferred to other patches.
To make working with the string array helpers easier, add:
- DT_NUM_NODELABELS
- DT_INST_NUM_NODELABELS
Signed-off-by: Martí Bolívar <mbolivar@amperecomputing.com>
Remove all CAN controller "bus-speed" and "bus-speed-data"
properties. These all use the default bitrates set via Kconfig.
Signed-off-by: Henrik Brix Andersen <hebad@vestas.com>
The test uses DT_CHILD_NUM and DT_INST_CHILD_NUM to get the number of
child nodes of a given node from generated macro.
The test uses DT_CHILD_NUM_STATUS_OKAY and DT_INST_CHILD_NUM_STATUS_OKAY
to get the number of child nodes of a given node which children's status
are "okay" from generated macro.
Signed-off-by: Swift Tian <swift.tian@ambiq.com>
Implement `DT_INST_NODE_HAS_COMPAT` to check if a node has a
compatible. This is helpful when a node has more than one
compatible, which can be used to enable additional features
in the driver.
Updated the devicetree test to play with the new API.
Signed-off-by: Yong Cong Sin <ycsin@meta.com>
The macro is searching for all instances of specific device
that contain specific property and evaluates to true (1) if
any device does.
The macro used to do that by generating, using
DT_ANY_INST_HAS_PROP_STATUS_OKAY, a logical expression
like (0 || 1 || 0), where each digit represented existence of
property (1) or lack of it (0).
Unfortunately other util macros, like IS_ENABLED, were
not able to evaluate such expression, as they often simply
expect something they can evaluate to 0 or 1.
The commit here changes DT_ANY_INST_HAS_PROP_STATUS_OKAY
to generate a list of tokens (1) where token is added to list
only for instance of a device that has the property;
then such list is processed using IS_EMPTY() macro and
in the end 0 or 1 is generated, depending on whether
any enabled instance of a device has the property or not.
This change allows result of DT_ANY_INST_HAS_PROP_STATUS_OKAY
to be used with macros like IS_ENABLED, IF_ENABLED or
COND_CODE_x.
Signed-off-by: Dominik Ermel <dominik.ermel@nordicsemi.no>
Remove all optional, initial CAN sample point properties and rely on the
CAN timing calculations to automatically pick the preferred sample point
location based on the initial bitrate.
Signed-off-by: Henrik Brix Andersen <hebad@vestas.com>
Update all usages of the MBOX API to the latest API changes (to be
squashed for bisectability).
Signed-off-by: Gerard Marull-Paretas <gerard@teslabs.com>
Add some assert statements meant to check if L2 interrupts
are encoded right when dealing with nodes that consume interrupts
from multiple aggregators. For this to work, also add another
interrupt controller node which extends a different L1 interrupt
from `test_intc`.
Signed-off-by: Laurentiu Mihalcea <laurentiu.mihalcea@nxp.com>
The test instantiate few vnd,i2c devices so it fails with boards with
devices that select I2C, as that causes i2c_test.c to be included with
the build that tries to redefine the same devices as well.
This is a library test anyway, so restricting to native_sim should be
good enough for it anyway.
Signed-off-by: Fabio Baltieri <fabiobaltieri@google.com>
Added new test for `DT_IRQ_LEVEL` and `DT_INST_IRQ_LEVEL`.
Introduced a new `vnd.cpu-intc` compatible so that we have a
root level interrupt controller that acts as level 1
aggregator, and modified `test_intc` to be level 2 aggregator,
updated test of `DT_IRQN(TEST_I2C_BUS)` accordingly.
Signed-off-by: Yong Cong Sin <ycsin@meta.com>
Extend api test suite to cover the new devicetree macros. This
includes extending the devicetree overlay with two new bindings:
- GPIO device which is also an interrupt controller
- interrupt holder using interrupts-extended to point to both
existing interrupt controller test_intc, and the newly added
GPIO device
Signed-off-by: Bjarki Arge Andreasen <bjarki@arge-andreasen.me>
These were first deprecated in v3.2. We have kept support for them
for as long as we can, but now their presence is causing CI failures
in some configurations. Specifically, using the deprecated 'label'
property is causing a warning which is promoted to an error in some
twister runs. This is blocking other forward progress in the
devicetree API.
I tried to rework the tests to avoid this, but it was too much effort
for the time I had to work on the task. Removing the APIs is therefore
unfortunately the best way forward to unblocking other work.
Re-work the test suite a bit to maintain coverage where we are using
the label property to test other macros.
Add a migration guide section to help with the transition.
Signed-off-by: Martí Bolívar <mbolivar@amperecomputing.com>
Enable these tests which run in native_posix in native_sim,
Switch from native_posix to native_sim as default test platform
Signed-off-by: Alberto Escolar Piedras <alberto.escolar.piedras@nordicsemi.no>
