Commit Graph

8 Commits

Author SHA1 Message Date
Gerard Marull-Paretas
1c689fce18 dts: bindings: nordic,nrf-pinctrl: remove pinctrl nordic,clock-enable
Property is no longer used.

Signed-off-by: Gerard Marull-Paretas <gerard@teslabs.com>
2024-08-12 12:58:58 +02:00
Gerard Marull-Paretas
b57481ab18 boards, tests: nrf54h20: add nordic,clock-enable property
Applies to:

- UART/E (TXD)
- SPIM (SCK, MOSI)
- SPIS (SCK, MISO)
- TWIM (SDA, SCL)

Except fast-instances.

Signed-off-by: Gerard Marull-Paretas <gerard@teslabs.com>
2024-08-06 14:32:40 +02:00
Piotr Kosycarz
0225e0e488 tests: boards: nrf: qdec: add tests for qdec for nrf
Expand testing for QDEC at nrf platforms.
It uses general sensor API,
however there are also nrf driver specific assumptions.

Signed-off-by: Piotr Kosycarz <piotr.kosycarz@nordicsemi.no>
2024-07-28 07:31:15 +03:00
Nikodem Kastelik
c0d508a142 soc: nordic: common: dmm: fix region alignment getter
Getting the required alignment size for memory region node
and device node needs to be handled by a separate macro.
Otherwise alignment of single byte is reported for any region.
Add a test that checks for this particular issue.

Signed-off-by: Nikodem Kastelik <nikodem.kastelik@nordicsemi.no>
2024-07-10 08:42:40 -04:00
Krzysztof Chruściński
7a6b355535 tests: boards: nrf: dmm: Adjust test to dmm changes
After changing dmm to not apply data cache line alignment for all
regions test needs to be aligned.

Signed-off-by: Krzysztof Chruściński <krzysztof.chruscinski@nordicsemi.no>
2024-07-01 16:08:39 -04:00
Nikodem Kastelik
d67abdd02a tests: boards: nrf: add tests for dmm component
Added tests verify output and input buffers allocation
using dmm component.

Signed-off-by: Nikodem Kastelik <nikodem.kastelik@nordicsemi.no>
2024-06-13 12:02:33 -04:00
Karol Lasończyk
955dbf47f8 tests: nordic: Enable I2C tests
Add i2c to supported peripheral to enable i2c testing.

Signed-off-by: Karol Lasończyk <karol.lasonczyk@nordicsemi.no>
2024-06-05 01:38:09 -07:00
Nikodem Kastelik
01ea0f2d7e tests: boards: nrf: add i2c driver test with TWIS slave
Test defines a lopback between i2c driver master and nrfx TWIS slave
to verify their functional correctness.

Signed-off-by: Nikodem Kastelik <nikodem.kastelik@nordicsemi.no>
2024-04-19 02:23:16 +01:00