The commit disables QSPI in SoC configurations, as QSPI got enabled
by default and test never really run on SoC.
In QSPI configuration erase page size is set to 4096
There is not TC_PRINT showing name of device that the test will
run on, in test setup.
The nrf52840dk configuration files have been renamed to reflect
dk name and SoC.
Signed-off-by: Dominik Ermel <dominik.ermel@nordicsemi.no>
Test assumed non-writen flash to contain 0xff while it is
supposed to check for erase_value.
The "random" buffer has also been updated to skip values that
are equal to erase value.
Signed-off-by: Dominik Ermel <dominik.ermel@nordicsemi.no>
With TF-M enabled the storage_partition can be used as memory that is
known to be configured as non-secure flash region.
The slot1_ns_partition partition is only correct when TF-M is built
with BL2 enabled.
Signed-off-by: Joakim Andersson <joakim.andersson@nordicsemi.no>
The condition just needs to be <=, as it is ok
to write say 128KB in a 128KB storage partition.
Signed-off-by: Alberto Escolar Piedras <alberto.escolar.piedras@nordicsemi.no>
After 'flash_ex_op' syscall was added we are able to expose vendor
specific features to the user.
This patch moves existing tests to 'tests/drivers/common'. New tests for
vendor specific operations should go to vendor directory under
'tests/drivers/flash'.
Signed-off-by: Patryk Duda <pdk@semihalf.com>
