Commit Graph

1959 Commits

Author SHA1 Message Date
Keith Short
51bd9dad96 tests: gpio_hogs: Fix the output low test
The output low test was checking the wrong GPIO spec handle.

Signed-off-by: Keith Short <keithshort@google.com>
2023-02-08 11:08:00 +01:00
Declan Snyder
0744e42e22 drivers: disk: Decouple SDMMC and MMC Kconfigs
MMC was using SDMMC kconfigs to build disk driver.
This is incorrect, MMC and SDMMC should not be sharing
Kconfigs. Split the drivers/disk/Kconfig.sdmmc into
drivers/disk/Kconfig.mmc and drivers/disk/Kconfig.sdmmc.

Also update disk tests to account for new MMC Kconfigs.

Signed-off-by: Declan Snyder <declan.snyder@nxp.com>
2023-02-08 10:18:13 +01:00
Declan Snyder
bcd13af168 tests: drivers: disk: Update outdated prj.conf
The proj.conf for these two tests was unconditionally
selecting SDMMC disk drivers which is incorrect now that
there are DT macros that are used to select these Kconfigs.

This also allows the test to be used for other disk protocols
such as MMC, as before this change, SDMMC would still be selected
and cause errors at runtime.

Signed-off-by: Declan Snyder <declan.snyder@nxp.com>
2023-02-08 10:18:13 +01:00
Erwan Gouriou
36ffed2a89 tests: drivers: flash: _ns target test case should be build only
Flash test can't be tested automatically on (at least some) _ns targets
by CI.
Set a dedicated test scenario for _ns targets in build_only.

Signed-off-by: Erwan Gouriou <erwan.gouriou@linaro.org>
2023-02-08 01:14:38 +09:00
Andrzej Głąbek
29d7c90779 tests: Align zephyr,psa-crypto-rng node names with those used by SoCs
This is a follow-up to commit 9951971aee.

Align names of "zephyr,psa-crypto-rng" compatible nodes used in tests
(crypto/rand32 and drivers/entropy/api) with those introduced by the
above commit into SoC definitions (nRF5340/nRF9160). This way the test
overlays will overwrite the already existing nodes instead of adding
second instances of them, what leads to build failures at the linking
stage as the related driver supports only single instance (and creates
it for the first node found).

Signed-off-by: Andrzej Głąbek <andrzej.glabek@nordicsemi.no>
2023-02-07 14:26:18 +01:00
Anas Nashif
0bc4fd4cb9 tests: fix various test identifiers
lib -> libraries to be consistent with everything else.
And fix identifier for a few stray tests that were wrongly
labeled/tagged.

Signed-off-by: Anas Nashif <anas.nashif@intel.com>
2023-02-06 10:06:10 +01:00
Erwan Gouriou
391aef215b tests: drivers: flash: Update b_u585i_iot02a_ns overlay
Update overlay after b_u585i_iot02a_ns flash partition was revisited

Signed-off-by: Erwan Gouriou <erwan.gouriou@linaro.org>
2023-02-01 17:16:13 +09:00
Peter Fecher
69904bae49 tests: sensor: fix reg address sequential
Change last added sensor address to fit into
the sequential reg addresses scheme.

Signed-off-by: Peter Fecher <p.fecher@phytec.de>
2023-02-01 03:51:03 +09:00
Henrik Brix Andersen
8d4c6b96c4 tests: drivers: gpio: add GPIO hogs test
Add test of the GPIO hog functionality using the optional GPIO APIs for
getting pin direction and configuration.

Signed-off-by: Henrik Brix Andersen <hebad@vestas.com>
2023-01-27 14:38:52 -08:00
Andrzej Głąbek
6708b139ab tests: drivers: i2s: Mark gpio_loopback cases as dependent on gpio
Add dependency on gpio in test cases that require the gpio_looback
fixture.

Signed-off-by: Andrzej Głąbek <andrzej.glabek@nordicsemi.no>
2023-01-27 19:21:19 +09:00
Andrzej Głąbek
54648142f7 tests: drivers: i2s: Align nRF pinctrl with other gpio_loopback users
For nRF boards and lines that need to be connected with an external
loopback (SDOUT and SDIN), use the same pins as in other tests that
use the gpio_loopback fixture (like uart_async_api or regulator/fixed)
so that a common wiring can be used for all those cases.

Signed-off-by: Andrzej Głąbek <andrzej.glabek@nordicsemi.no>
2023-01-27 19:21:19 +09:00
Marin Jurjević
12ce5beacd tests: drivers: adc: add support for nucleo_g070rb
Add support for nucleo_g070rb board to adc_api test.

Signed-off-by: Marin Jurjević <marin.jurjevic@hotmail.com>
2023-01-26 10:08:33 +00:00
Henrik Brix Andersen
55d0ffa874 drivers: can: remove CAN_HAS_CANFD Kconfig helper
Remove the CAN_HAS_CANFD Kconfig helper symbol in order to allow enabling
CAN-FD support in the API regardless of driver support.

Change default to CAN-FD support being disabled and have samples and tests
that require CAN-FD support turn it on. This aligns the default
configuration across CAN controller drivers regardless of their
capabilities.

The rationale behind this is that we are starting to see MCUs with multiple
CAN controllers, some CAN-FD compatible, some not (e.g. NXP i.MX RT1060 and
FPGAs). Automatically enabling CAN-FD support based on the presence of a
CAN-FD capable CAN controller leads to different application default
settings based on the CAN controller(s) in use.

Signed-off-by: Henrik Brix Andersen <hebad@vestas.com>
2023-01-25 15:00:39 +00:00
Henrik Brix Andersen
c6db73e93d tests: drivers: can: timing: use capabilities to skip tests
Use the CAN controller driver capabilities to determine if the CAN-FD
timing tests should be skipped or not. There is no need for special
handling of CONFIG_CAN_FD_MODE.

Signed-off-by: Henrik Brix Andersen <hebad@vestas.com>
2023-01-25 15:00:39 +00:00
Andrzej Głąbek
ea859cce1e tests: drivers: nrf_rtc_timer: Add a next cycle timeouts test case
Add a test case that schedules a set of consecutive timeouts,
each one on the next cycle of the system timer but each time
after a slightly larger delay.
This test case reveals a problem in the current nrf_rtc_timer
implementation that sometimes a compare value can be missed
what leads to timeouts delayed by 512 seconds.

Signed-off-by: Andrzej Głąbek <andrzej.glabek@nordicsemi.no>
2023-01-25 11:25:01 +00:00
Tom Burdick
b1e1b5e7b4 dma: Test repeatedly calling start/stop
Ensures that the documented behavior of the API is met by implementations
through testing. By calling stop on a stopped channel the expectation is no
error occurs and is checked.

Calling start after a channel has been started is difficult to test for
as there is transfer timing involved. A once shot transfer may have
completed and the channel transition to an inactive state by itself by
the time the second start call is performed. This isn't supported by at
least gpdma today and isn't documented behaviorally so should not be
tested.

Signed-off-by: Tom Burdick <thomas.burdick@intel.com>
2023-01-23 11:51:21 -08:00
Quang Bui Trong
ad19019b29 samples: watchdog: board s32z270dc2_r52 only build and not running
Currently, the s32z270dc2_r52 board only supports running on RAM,
 so samples or tests watchdogs that perform SoC reset will not produce
 results. Set the build only for these samples and tests until the
 reset SoC function is supported.

Signed-off-by: Quang Bui Trong <quang.buitrong@nxp.com>
2023-01-23 11:46:43 -08:00
Francois Ramu
6ff19d77ce tests: drivers: use stm32 dma driver binding macro to configure channel
Use the macro as defined by the
include/zephyr/dt-bindings/dma/stm32_dma.h to configure the
dma channel.
Use the STM32_DMA_PERIPH_TX or STM32_DMA_PERIPH_RX value.

Signed-off-by: Francois Ramu <francois.ramu@st.com>
2023-01-23 09:15:21 -06:00
Dominik Ermel
f05e8e8f27 tests: drivers: flash: Fix filter using non-existent partition
Filtering used image_1_nonsecure as DTS node label, while correct
one is slot1_ns_partition.

Signed-off-by: Dominik Ermel <dominik.ermel@nordicsemi.no>
2023-01-23 10:06:50 +00:00
Hein Wessels
0b3338472a tests: drivers: adc: adc_api: add second channel to nucleo_h743zi
Adds a second channel to the nucleo_h743zi test
because it's now supported by the driver

Signed-off-by: Hein Wessels <heinwessels93@gmail.com>
2023-01-23 09:59:46 +00:00
Felipe Neves
cd04926d6b sensors: as5600: added as5600
magnetic angle sensor driver.

Signed-off-by: Felipe Neves <felipe.neves@linaro.org>
2023-01-19 15:18:24 -06:00
Daniel DeGrasse
0c2808e62d tests: drivers: i2c_target_api: enable i2c_target_api test for RT1060
Enable RT1060 target API test for RT1060. The LPI2C does not support
dual controller/target operation, so LPI2C3 is used as the controller
while LPI2C1 implements the target device.

Signed-off-by: Daniel DeGrasse <daniel.degrasse@nxp.com>
2023-01-19 10:16:13 +01:00
TOKITA Hiroshi
a04f1aafaf tests: drivers: i2c: i2c_target_api: Fix i2c1 configuration for rpi_pico
Add `i2c1` configuration that removed from common settings to overlay file.

Signed-off-by: TOKITA Hiroshi <tokita.hiroshi@fujitsu.com>
2023-01-17 11:30:52 +01:00
Gerard Marull-Paretas
77526a17c5 tests: drivers: regulator: voltage: use specific fixture/overlays
The same board can be used to test multiple regulators, so let's
explicitely set overlays and fixture name.

Signed-off-by: Gerard Marull-Paretas <gerard.marull@nordicsemi.no>
2023-01-16 16:52:35 +01:00
Andrzej Głąbek
b4fb5300da boards: nrf52840dk_nrf52840: Do not enable arduino_serial by default
This is a follow-up to commit 25d7a09aa5.

The arduino_serial/uart1 node should not be enabled by default because
even if an application does not use it, the default CONFIG_SERIAL=y
setting causes that it is anyway initialized, so the UARTE peripheral
acquires its assigned pins (and they cannot be used in other way) and
its enabled receiver causes increased current consumption (by ~500 uA)
when the CPU is sleeping. This affects e.g. the boards/nrf/system_off
sample.
Applications that actually need to use this UART or shields that use
the arduino_serial node should enable the node explicitly.

Keep this node disabled by default for the nrf52840dk_nrf52840 board
and also for boards whose definitions are mostly copies of the above:
nrf52833dk_nrf52833 and nrf21540dk_nrf52840.

Update also accordingly a few overlay files in tests/ that were
disabling this node because of the pins it undesirably acquired.

Signed-off-by: Andrzej Głąbek <andrzej.glabek@nordicsemi.no>
2023-01-16 09:26:10 +01:00
Andrzej Głąbek
96d0773fcf tests: drivers: w1: Enable arduino_i2c and arduino_serial explicitly
This test uses the arduino_i2c and arduino_serial DT nodes, so it
should enable them explicitly, not assume they will be enabled by
default for a given board.

Signed-off-by: Andrzej Głąbek <andrzej.glabek@nordicsemi.no>
2023-01-16 09:26:10 +01:00
Declan Snyder
931e97a57d tests: disk: Increase stack size for USDHC
Increase the main stack size on the disk driver tests
for devices using the MMC STACK with a IMX USDHC part.

Signed-off-by: Declan Snyder <declan.snyder@nxp.com>
2023-01-14 09:22:22 +01:00
Declan Snyder
8e4f08f235 tests: RT595 integration platform for MMC tests
Specifies RT595 as integration platform for MMC related tests

Signed-off-by: Declan Snyder <declan.snyder@nxp.com>
2023-01-14 09:22:22 +01:00
YuLong Yao
2017ed50bf test: adc: add unit test for gd32a503v_eval
add unit test for gd32a503v_eval

Signed-off-by: YuLong Yao <feilongphone@gmail.com>
2023-01-12 21:45:38 +01:00
Lucas Tamborrino
a64d3d388f tests: drivers: uart: uart async: Add ESP32C3 support
Add ESP32C3 support for uart async api test

Signed-off-by: Lucas Tamborrino <lucas.tamborrino@espressif.com>
2023-01-12 19:09:01 +01:00
Lucas Tamborrino
41b431a01a drivers: uart: esp32c3: Add async support
Add UART async support for ESP32C3

Signed-off-by: Lucas Tamborrino <lucas.tamborrino@espressif.com>
2023-01-12 19:09:01 +01:00
Lucas Tamborrino
e919123fd6 tests: dma: add esp32c3
Add esp32c3 support to DMA tests

Signed-off-by: Lucas Tamborrino <lucas.tamborrino@espressif.com>
2023-01-12 19:09:01 +01:00
TOKITA Hiroshi
2af7d728e2 tests: spi: spi_loopback: add interrupt and DMA tests for GD32 boards
Add interrupt and DMA tests for GD32 boards.
Use overlay-gd32-spi-interrupt.conf when testing interrupt based transfer,
use overlay-gd32-spi-dma.conf when testing DMA transfer,

Add overlay file for GD32 boards for these tests.

Signed-off-by: TOKITA Hiroshi <tokita.hiroshi@gmail.com>
2023-01-11 08:50:56 -08:00
Nick Ward
e6f6917399 tests: drivers: build_all: pwm: add PCA9685
Add build test for PCA9685 PWM driver.

Signed-off-by: Nick Ward <nix.ward@gmail.com>
2023-01-11 09:38:18 +01:00
Tom Burdick
c652996c31 tests: Tag console tests with additional tags
semihost test is now tagged semihost, uart console with uart

Signed-off-by: Tom Burdick <thomas.burdick@intel.com>
2023-01-10 18:29:35 -05:00
Tom Burdick
0a07d80300 tests: Tag uart tests as uart
UARTs are mostly assumed to exist in Zephyr but some hardware wishes
to exclude the tests. Adds a uart tag to the test case to ensure
ignoring is possible.

Signed-off-by: Tom Burdick <thomas.burdick@intel.com>
2023-01-10 18:29:35 -05:00
Yuval Peress
aea177079d test: add icm42688 to build_all/sensor test
Add a node for the icm42688 so that it builds as a part of the CI.

Signed-off-by: Yuval Peress <peress@google.com>
2023-01-10 14:45:36 -06:00
Yuval Peress
fe390776dc tests: clean up build_all/sensor
The test at tests/drivers/build_all/sensor wasn't passing since a lot
of nodes in both the i2c and spi had conflicting addresses. Fix that by
making the addresses sequential.

Signed-off-by: Yuval Peress <peress@google.com>
2023-01-10 14:45:36 -06:00
Krzysztof Chruscinski
2164511bb6 tests: drivers: uart: uart_mix_fifo_poll: Add dependency
Add gpio dependency to the test.

Signed-off-by: Krzysztof Chruscinski <krzysztof.chruscinski@nordicsemi.no>
2023-01-09 19:21:48 +01:00
Krzysztof Chruscinski
8931cc22df tests: drivers: uart: uart_mix_fifo_poll: Add nrf5340_cpuapp
Add configuration for nrf5340_cpuapp.

Signed-off-by: Krzysztof Chruscinski <krzysztof.chruscinski@nordicsemi.no>
2023-01-09 19:21:48 +01:00
Krzysztof Chruscinski
6a7db6def9 tests: drivers: uart: Align nrf52840dk configuration
Align configuration for nrf52840dk to use the same loopback pins
for uart_async_api and uart_mix_fifo_poll tests.

Signed-off-by: Krzysztof Chruscinski <krzysztof.chruscinski@nordicsemi.no>
2023-01-09 19:21:48 +01:00
Krzysztof Chruscinski
f33765dec5 tests: drivers: uart: uart_async_api: Add nrf5340_cpuapp
Add configuration for nrf5340_cpuapp.

Signed-off-by: Krzysztof Chruscinski <krzysztof.chruscinski@nordicsemi.no>
2023-01-09 19:21:48 +01:00
Guillaume Gautier
45b0804550 tests: drivers: counter: counter_basic_api: src: Fix STM32 RTC device
Commit fd65800 introduced a regression for the counter_basic_api test for
STM32 by using a Silabs Gecko Kconfig to enable the STM32 RTC.
This commit uses the proper STM32 Kconfig for the RTC instead.

Signed-off-by: Guillaume Gautier <guillaume.gautier-ext@st.com>
2023-01-09 10:14:06 +01:00
Daniel DeGrasse
a3f2d2bbde tests: drivers: adc: add support for RT595 to ADC API test
Enable support for RT595 in ADC API testcase

Signed-off-by: Daniel DeGrasse <daniel.degrasse@nxp.com>
2023-01-08 19:48:54 +01:00
Aaron Massey
c4be38dec1 fuel_gauge: sbs_gauge: Enable MFR ACC write
Update the SBS Gauge driver that implements the fuel_gauge API to implement
a set_property function allowing the writing of an SBS word to the
manufacturer access register per the SBS spec.

Includes an update to the SBS Gauge emulator and SBS fuel gauge tests to
weakly verify the code runs.

Signed-off-by: Aaron Massey <aaronmassey@google.com>
2023-01-08 19:48:12 +01:00
Aaron Massey
c0762d003a fuel_gauge: Implement sbs gauge read for mfr acc
Implement and weakly test fetching the manufacturer access word from an SBS
compatible fuel gauge.

Signed-off-by: Aaron Massey <aaronmassey@google.com>
2023-01-08 19:48:12 +01:00
Peter Johanson
8a29ed9092 drivers: adc: Fix ADC tests for new RP2040 board.
Fix ADC tests with new SparkFun Pro Micro RP2040 board.

Signed-off-by: Peter Johanson <peter@peterjohanson.com>
2023-01-08 19:32:59 +01:00
Emilio Benavente
9b1b68657c tests: drivers: i2s: Combined merged the test files into main
Since main was only registering the Test Suite, it made since
to combine the actual tests into one file instead of having
an empty file to initialize the test.

Signed-off-by: Emilio Benavente <emilio.benavente@nxp.com>
2023-01-06 10:34:45 +00:00
Emilio Benavente
3ffc64a92d tests: drivers: i2s: ZTest ordering issue fix
The test was executing the expected functions
out of order. I have created a config functions
and explicitly declared them to be setup functions
for this ZTest framework.

Signed-off-by: Emilio Benavente <emilio.benavente@nxp.com>
2023-01-06 10:34:45 +00:00
Emilio Benavente
d4cfc35b8d tests: drivers: i2s: Fix Label Property issue
The I2S Speed test attempted to find a device
via the Label Property of the node. I have updated
the code to search for the nodelabel instead.

Signed-off-by: Emilio Benavente <emilio.benavente@nxp.com>
2023-01-06 10:34:45 +00:00