From 2f8167fc081daceee3fc2e5ea5eea4fdf5170d39 Mon Sep 17 00:00:00 2001 From: Alexandre Bourdiol Date: Fri, 15 May 2020 15:30:00 +0200 Subject: [PATCH] test: drivers: gpio: gpio_basic_api: disable interrupt at end of test When switching from rising edge to falling edge of test: test_gpio_deprecated(), because exti callback is already configured (from rising edge test), the pin configuration abort for EBUSY reason. It is necessary to disable interrupt, so that next test will start with clean configuration. Signed-off-by: Alexandre Bourdiol --- tests/drivers/gpio/gpio_basic_api/src/test_deprecated.c | 2 ++ 1 file changed, 2 insertions(+) diff --git a/tests/drivers/gpio/gpio_basic_api/src/test_deprecated.c b/tests/drivers/gpio/gpio_basic_api/src/test_deprecated.c index e4a28677c8a..766edd54148 100644 --- a/tests/drivers/gpio/gpio_basic_api/src/test_deprecated.c +++ b/tests/drivers/gpio/gpio_basic_api/src/test_deprecated.c @@ -137,10 +137,12 @@ static int test_callback(gpio_flags_t int_flags) pass_exit: gpio_remove_callback(dev, &drv_data->gpio_cb); + gpio_pin_configure(dev, PIN_IN, GPIO_INT_DISABLE); return TC_PASS; err_exit: gpio_remove_callback(dev, &drv_data->gpio_cb); + gpio_pin_configure(dev, PIN_IN, GPIO_INT_DISABLE); return TC_FAIL; }